JPH02192457A - Semiconductor ceramic - Google Patents
Semiconductor ceramicInfo
- Publication number
- JPH02192457A JPH02192457A JP1010994A JP1099489A JPH02192457A JP H02192457 A JPH02192457 A JP H02192457A JP 1010994 A JP1010994 A JP 1010994A JP 1099489 A JP1099489 A JP 1099489A JP H02192457 A JPH02192457 A JP H02192457A
- Authority
- JP
- Japan
- Prior art keywords
- barium
- barium titanate
- mol
- semiconductor ceramic
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 25
- 239000000919 ceramic Substances 0.000 title claims abstract description 9
- 229910002113 barium titanate Inorganic materials 0.000 claims abstract description 16
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 claims abstract description 16
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical group [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 claims abstract description 11
- 229910052788 barium Inorganic materials 0.000 claims abstract description 11
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 claims abstract description 11
- 239000011575 calcium Substances 0.000 claims abstract description 9
- 229910052791 calcium Inorganic materials 0.000 claims abstract description 8
- 229910052712 strontium Inorganic materials 0.000 claims abstract description 4
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical group [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 claims abstract description 4
- 229910052761 rare earth metal Inorganic materials 0.000 claims abstract description 3
- 229910052573 porcelain Inorganic materials 0.000 claims description 8
- NUJOXMJBOLGQSY-UHFFFAOYSA-N manganese dioxide Chemical compound O=[Mn]=O NUJOXMJBOLGQSY-UHFFFAOYSA-N 0.000 abstract description 10
- 239000000463 material Substances 0.000 abstract description 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 6
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 abstract description 6
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 abstract description 3
- 229910052681 coesite Inorganic materials 0.000 abstract description 3
- 229910052593 corundum Inorganic materials 0.000 abstract description 3
- 229910052906 cristobalite Inorganic materials 0.000 abstract description 3
- 239000000377 silicon dioxide Substances 0.000 abstract description 3
- 235000012239 silicon dioxide Nutrition 0.000 abstract description 3
- 229910052682 stishovite Inorganic materials 0.000 abstract description 3
- 229910052905 tridymite Inorganic materials 0.000 abstract description 3
- 229910001845 yogo sapphire Inorganic materials 0.000 abstract description 3
- 229910052727 yttrium Inorganic materials 0.000 abstract description 3
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 abstract description 2
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 abstract 1
- 229910010293 ceramic material Inorganic materials 0.000 description 6
- -1 05.5iOz Inorganic materials 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000013021 overheating Methods 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 229910000807 Ga alloy Inorganic materials 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 239000004372 Polyvinyl alcohol Substances 0.000 description 1
- 229910052454 barium strontium titanate Inorganic materials 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920002451 polyvinyl alcohol Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- VEALVRVVWBQVSL-UHFFFAOYSA-N strontium titanate Chemical compound [Sr+2].[O-][Ti]([O-])=O VEALVRVVWBQVSL-UHFFFAOYSA-N 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- LLZRNZOLAXHGLL-UHFFFAOYSA-J titanic acid Chemical compound O[Ti](O)(O)O LLZRNZOLAXHGLL-UHFFFAOYSA-J 0.000 description 1
Landscapes
- Compositions Of Oxide Ceramics (AREA)
- Thermistors And Varistors (AREA)
Abstract
Description
本発明は、正温度係数の半導体磁器に関するものである
。The present invention relates to semiconductor porcelain with a positive temperature coefficient.
チタン酸バリウム系半導体磁器材料は、その正の温度係
数を利用し、過電流保護用、温度制御用、ヒータ用とい
った各種の用途に応用されている。
中でも、最近にあっては、低抵抗のサーミスタ素子が自
動車のモータ過電流防止用や電子部品の過熱防止用とし
て期待されている。
ところで、サーミスタ素子の応答を良くする為には、サ
ーミスタ素子を小型化し、かつ温度あるいは電流の変化
により急激に抵抗が変化することが大事である。この為
、室温での比抵抗が小さく、かつ、温度係数が大きい材
料が必要である。
これまで、室温での比抵抗を小さくする為、チタン酸バ
リウム系半導体磁器材料のバリウムをカルシウムで置換
することが試みられ、特公昭54−10110号公報に
おいて室温での比抵抗が10Ω・am以下と謳われるに
至っている。
又、正の温度係数を大きくする為に特公昭49−218
77号公報ではナトリウムを添加して16%/℃以上の
ものが得られたと謳われている。
しかしながら、これまでのチタン酸バリウム系半導体磁
器材料では、比抵抗が小さくなると、温度係数も小さく
なってしまい、室温比抵抗を10Ω・em以下で、かつ
、温度係数が10%/℃以上にすることが出来ていない
。
例えば、特公昭54−10110号公報では室温比抵抗
が小さいものの、温度係数に問題があり、特公昭49−
21877号公報では温度係数は大きいものの、室温比
抵抗が問題である。Barium titanate-based semiconductor ceramic materials utilize their positive temperature coefficients and are used in various applications such as overcurrent protection, temperature control, and heaters. Among these, recently, low-resistance thermistor elements are expected to be used for preventing overcurrent in automobile motors and for preventing overheating of electronic components. By the way, in order to improve the response of the thermistor element, it is important to make the thermistor element small and to have its resistance change rapidly due to changes in temperature or current. For this reason, a material with a low specific resistance at room temperature and a large temperature coefficient is required. Until now, attempts have been made to replace barium in barium titanate-based semiconductor ceramic materials with calcium in order to reduce the specific resistance at room temperature. It has come to be praised as. In addition, in order to increase the positive temperature coefficient,
Publication No. 77 claims that a temperature of 16%/°C or higher was obtained by adding sodium. However, with conventional barium titanate-based semiconductor ceramic materials, as the resistivity decreases, the temperature coefficient also decreases, and the room temperature resistivity must be 10 Ω・em or less and the temperature coefficient must be 10%/℃ or higher. I haven't been able to do that. For example, although the specific resistance at room temperature is small in Japanese Patent Publication No. 54-10110, there is a problem with the temperature coefficient.
Although the temperature coefficient of JP 21877 is large, the specific resistance at room temperature is a problem.
本発明の目的は、室温比抵抗が小さく、かつ、高い温度
係数の半導体磁器材料を提供することである。
上記本発明の目的は、半導体化元素を含有してなるチタ
ン酸バリウム系半導体磁器であって、このチタン酸バリ
ウムのバリウムがカルシウムで置換されてなり、しかも
このカルシウム原子の量は13〜17原子%であり、さ
らに0.5〜1.5モル%のTidy、0.4〜0.5
モル%のSiO□、0.01〜0.03モル%のMnO
2、及び0.2〜0.3モル%の^!20.が含有され
てなることを特徴とする半導体磁器によって達成される
。
尚、上記の半導体磁器において、半導体化元素としては
Sb、 Bi、 Nb、 Taあるいは稀土類元素の群
の中から選ばれる一種以上のものを適宜選択でき、これ
ら半導体化元素の含有量はこれらの元素の種類によって
もかわるので一義的に決定することはできないが、例え
ばイツトリウムを用いた場合にあっては約0.1〜0.
5原子%程度であり、又、半導体磁器のキュリー温度を
変える為チタン酸バリウムのバリウムの一部をストロン
チウムで置換しても良い。An object of the present invention is to provide a semiconductor ceramic material that has a low room temperature resistivity and a high temperature coefficient. The object of the present invention is to provide barium titanate-based semiconductor porcelain containing a semiconducting element, in which barium in the barium titanate is replaced with calcium, and the amount of calcium atoms is 13 to 17 atoms. %, and further 0.5 to 1.5 mol% Tidy, 0.4 to 0.5
mol% SiO□, 0.01-0.03 mol% MnO
2, and 0.2-0.3 mol%^! 20. This is achieved by a semiconductor porcelain characterized by containing. In addition, in the above-mentioned semiconductor porcelain, as the semiconductor element, one or more selected from the group of Sb, Bi, Nb, Ta or rare earth elements can be selected as appropriate, and the content of these semiconductor elements is determined according to these elements. It cannot be determined unambiguously because it depends on the type of element, but for example, in the case of using yttrium, it is about 0.1 to 0.
The amount is about 5 atomic %, and a part of barium in barium titanate may be replaced with strontium in order to change the Curie temperature of semiconductor ceramics.
出発原料としてBaCO5,5rCOs、CaCL、T
i(h、Y、05.5iOz、MnO2、^I20.を
表1の組成となるように所定量秤量し、これをポリエチ
レン製のボットミルと樹脂コートしたボールとを用いて
20〜40時間湿式混合させ、その後乾燥したものを1
100℃で4時間仮焼する。
次に、この仮焼物を粉砕し、そしてポリビニルアルコー
ルをバインダとして加え、150μmのメ・ンシュのフ
ィルタを通過した粉末を成形圧1トン/e1m”で例え
ば直径12.5mm、厚み1.)Iのディスク状に成形
し、1300〜1380℃の温度で0.2〜3時間焼成
した。
このようにして得られたチタン酸バリウム−チタン酸ス
トロンチウム系の半導体磁器材料の両面にIn−Ga合
金を付け、室温比抵抗、温度係数を求めたので、これら
を表1に示す、尚、温度係数αは
a = (lnR2−InR+>/ (T 2 T
+)X 100(%/”C)但し、T1は抵抗が室温抵
抗の2倍になる温度、T 2 = T + + 5
R1は室温抵抗値の2倍の値
R7はT、での抵抗値。
この表1から窺えるように、本発明になる半導体磁器材
料は比抵抗が小さく、かつ、温度係数が大きい。
これに対して、カルシウム置換量が10原子%以下ある
いは20原子%以上のチタン酸バリウム−チタン酸スト
ロンチウム系の材料では比抵抗が大きく、又、13〜1
7原子%がカルシウムで置換されたチタン酸バリウム−
チタン酸ストロンチウム系の材料であっても、TiO2
,5iOz、MnL、^1□0.の含有量が多すぎたり
あるいは少なすぎると温度係数が小さくなることから、
バリウム及びストロンチウムの総量の13〜17原子%
がカルシウムで置換されたチタン酸バリウム−チタン酸
ストロンチウム系の材料に含まれる過剰のTiO2は0
.5〜1.5モル%、過剰のSiO2は0.4〜0.5
モル%、過剰のMnO2は0.01〜0.03モル%、
過剰の^!20.は0,2〜0.3モル%であることが
大事である。BaCO5,5rCOs, CaCL, T as starting materials
A predetermined amount of i(h, Y, 05.5iOz, MnO2, ^I20.) was weighed to have the composition shown in Table 1, and this was wet mixed for 20 to 40 hours using a polyethylene bot mill and a resin-coated ball. and then dry it for 1
Calculate at 100°C for 4 hours. Next, this calcined material is pulverized, polyvinyl alcohol is added as a binder, and the powder that has passed through a 150 μm mesh filter is formed into a powder having a diameter of 12.5 mm and a thickness of 1. It was formed into a disk shape and fired for 0.2 to 3 hours at a temperature of 1300 to 1380°C. In-Ga alloy was attached to both sides of the barium titanate-strontium titanate semiconductor ceramic material thus obtained. , room temperature resistivity, and temperature coefficient were determined, and these are shown in Table 1. Furthermore, the temperature coefficient α is a = (lnR2-InR+>/(T 2 T
+) As can be seen from Table 1, the semiconductor ceramic material of the present invention has a small resistivity and a large temperature coefficient.On the other hand, titanic acid with a calcium substitution amount of 10 atomic % or less or 20 atomic % or more Barium-strontium titanate-based materials have a large specific resistance;
Barium titanate with 7 atom% substituted with calcium
Even with strontium titanate-based materials, TiO2
, 5iOz, MnL, ^1□0. If the content is too high or too low, the temperature coefficient becomes small.
13 to 17 at% of the total amount of barium and strontium
The excess TiO2 contained in the barium titanate-strontium titanate material in which is replaced with calcium is 0.
.. 5-1.5 mol%, excess SiO2 is 0.4-0.5
mol%, excess MnO2 is 0.01-0.03 mol%,
Excessive ^! 20. It is important that the amount is 0.2 to 0.3 mol%.
本発明に係る半導体磁器は、半導体化元素を含有してな
るチタン酸バリウム系半導体磁器であって、このチタン
酸バリウムのバリウムがカルシウムで置換されてなり、
しかもこのカルシウム原子の量は13〜17原子%であ
り、さらに0.5〜1.5モル%のTies、0.4〜
0.5モル%の5ift、0.01〜0.03モル%の
MnO2、及び0.2〜0.3モル%のAl2O3が含
有されてなるので、このものは室温比抵抗が小さく、か
つ、大きな正の温度係数を有する半導体材料であるから
例えば自動車のモータ過電流防止あるいは電子部品の過
熱防止用のサーミスタ素子に好適である等の特長を有す
る。
特許出願人 秩父セメント株式会社The semiconductor porcelain according to the present invention is a barium titanate-based semiconductor porcelain containing a semiconducting element, in which barium in the barium titanate is replaced with calcium,
Moreover, the amount of calcium atoms is 13 to 17 atomic %, and 0.5 to 1.5 mol % of Ties, 0.4 to 17 atomic %.
Since it contains 0.5 mol% of 5ift, 0.01 to 0.03 mol% of MnO2, and 0.2 to 0.3 mol% of Al2O3, this material has a low room temperature specific resistance, and Since it is a semiconductor material with a large positive temperature coefficient, it has the advantage of being suitable for use as a thermistor element for preventing overcurrent in automobile motors or overheating of electronic components, for example. Patent applicant Chichibu Cement Co., Ltd.
Claims (3)
半導体磁器であって、このチタン酸バリウムのバリウム
がカルシウムで置換されてなり、しかもこのカルシウム
原子の量は13〜17原子%であり、さらに0.5〜1
.5モル%のTiO_2、0.4〜0.5モル%のSi
O_2、0.01〜0.03モル%のMnO_2、及び
0.2〜0.3モル%のAl_2O_3が含有されてな
ることを特徴とする半導体磁器。(1) A barium titanate-based semiconductor porcelain containing a semiconducting element, in which barium in the barium titanate is replaced with calcium, and the amount of calcium atoms is 13 to 17 at%, Further 0.5-1
.. 5 mol% TiO_2, 0.4-0.5 mol% Si
A semiconductor ceramic characterized by containing O_2, 0.01 to 0.03 mol% MnO_2, and 0.2 to 0.3 mol% Al_2O_3.
、半導体化元素はSb、Bi、Nb、Taあるいは稀土
類元素の群の中から選ばれる一種以上のもの。(2) In the semiconductor ceramic according to claim 1, the semiconductor element is one or more selected from the group of Sb, Bi, Nb, Ta, or rare earth elements.
、チタン酸バリウムのバリウムがストロンチウムで置換
されてなるもの。(3) The semiconductor porcelain according to claim 1, in which barium in barium titanate is replaced with strontium.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1010994A JPH02192457A (en) | 1989-01-21 | 1989-01-21 | Semiconductor ceramic |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1010994A JPH02192457A (en) | 1989-01-21 | 1989-01-21 | Semiconductor ceramic |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02192457A true JPH02192457A (en) | 1990-07-30 |
Family
ID=11765695
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1010994A Pending JPH02192457A (en) | 1989-01-21 | 1989-01-21 | Semiconductor ceramic |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02192457A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0538801U (en) * | 1991-10-30 | 1993-05-25 | 株式会社村田製作所 | Positive characteristic thermistor element |
WO2013065441A1 (en) * | 2011-11-01 | 2013-05-10 | 株式会社村田製作所 | Ptc thermistor and method for manufacturing ptc thermistor |
-
1989
- 1989-01-21 JP JP1010994A patent/JPH02192457A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0538801U (en) * | 1991-10-30 | 1993-05-25 | 株式会社村田製作所 | Positive characteristic thermistor element |
WO2013065441A1 (en) * | 2011-11-01 | 2013-05-10 | 株式会社村田製作所 | Ptc thermistor and method for manufacturing ptc thermistor |
JPWO2013065441A1 (en) * | 2011-11-01 | 2015-04-02 | 株式会社村田製作所 | PTC thermistor and method for manufacturing PTC thermistor |
EP2774904A4 (en) * | 2011-11-01 | 2016-01-27 | Murata Manufacturing Co | Ptc thermistor and method for manufacturing ptc thermistor |
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