JPH02150056A - Semiconductor integrated circuit - Google Patents

Abstract

PURPOSE:To inexpensively and efficiently execute a burn-in test by forming incorporated transistors into the pull-up resistors of an input/output circuit and into switch circuit of the input/output circuit between the resistors and a power source, and providing an external control terminal for controlling the opening/closing of the switch circuit. CONSTITUTION:The pull-up resistor 4 of an input/output circuit 3 composed of the transistor element of an internal function black region 2, a switch circuit 5 inserted between the resistor 4 and a power source VDD, and one external control terminal 6 applied by a signal for controlling the opening/closing of the circuit 5 are provided. When a control voltage of L level is applied to the terminal 6 to turn ON the circuit 5, the resistor 4 is inserted to all the circuits 3 through the circuit 5 at this time. Accordingly, a voltage of a predetermined level is applied to a ground terminal of the power source VDD terminal and the control voltage of the L level is applied to the terminal 6 thereby to perform a burn-in test. On the contrary, when a control voltage of H level is applied to the terminal 6, the circuit 5 is turned OFF. Thus, the circuit 3 becomes a normal circuit in which the resistor 4 is not inserted.

Description

DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to burn-in of semiconductor integrated circuits.
n) T A B (Tape Auto
atedBonding) type semiconductor integrated circuit (hereinafter referred to as TAB product). In the present invention, the input/output circuit refers to an input circuit, an output circuit, or a combination of both.

〔overview〕

The present invention requires a pull-up resistor during a burn-in test in a semiconductor integrated circuit that includes an internal functional block area including transistor elements and a plurality of input/output circuits arranged around this internal functional block area. burn-in control means capable of connecting the pull-up resistor to the input/output circuit via a switch circuit that is turned on by a control signal applied to at least one external control terminal;
By using the transistor element in the internal functional block area, the number of pads required in a large area can be reduced to two electrical terminals and the external control terminal. This allows burn-in testing to be carried out even when pinned and miniaturized.

[Conventional technology]

Conventionally, burn-in tests for TAB products have been conducted on gold terminals after the ILB (inner lead bonding) process, only on input terminals, or only on some input terminals.

These are used when the number of bins of TAB products is small, and when IL
When the pad size on the TAB tape after step B was large, these could be used.

[Problem that the invention seeks to solve]

In the conventional burn-in test for TAB products mentioned above, although it can be used when the number of pins is small, TAB products are originally aimed at ultra-high-bin packages, so when TAB products with more than 100 bins are developed, The conventional format would be extremely costly and impractical.

In other words, on the pad on the TAB tape after the ILB process,
The conventional system, which uses special and sophisticated needles called pogo pins, is no longer compatible with a large number of pins (and has the drawback that it is not cost-effective as one pogo pin costs tens of thousands of yen).

The aim of the invention is to eliminate the above-mentioned drawbacks by
It is an object of the present invention to provide a TAB type semiconductor integrated circuit having a configuration that allows burn-in tests to be performed efficiently and at low cost even when AB products have a larger number of pins.

[Means for solving problems]

The present invention provides a semiconductor integrated circuit having an internal functional block area including a transistor element and a plurality of input/output circuits arranged around the internal functional block area. A switch circuit inserted between the up resistor and the power supply is configured using the transistor element in the internal functional block area, and is provided with at least one external terminal to which a signal for controlling opening/closing of the switch circuit is applied. It is characterized by

[Effect]

During a burn-in test, a switch circuit is turned on by a control signal of, for example, 1"[, J level, applied to an external control terminal, and the pull-up resistor is inserted into an input/output circuit that requires a pull-up resistor during a burn-in test. All terminals can be tested.

Under normal conditions, by applying a control signal of, for example, rHJ level to the external control terminal, the switch circuit is turned off, and the pull-up resistor is disconnected from the input/output circuit to perform normal operation.

Therefore, in the case of a TAB product, the only pads that require a large area are the power supply VDD terminal, ground terminal, and, for example, one external control terminal. No matter how advanced the process is, it will be possible to perform a burn-in test.

〔Example〕

Embodiments of the present invention will be described below with reference to the drawings.

FIG. 1 is a schematic layout diagram showing a first embodiment of the present invention, and FIG. 2 is a circuit diagram showing its input circuit, pull-up resistor, and switch circuit.

The embodiment of the present invention is a semiconductor integrated circuit formed on a semiconductor chip 1 and comprising an internal functional block area 2 including transistor elements, and a plurality of input/output circuits 3 arranged around this internal functional block area 2. , a pull-up resistor 4 of an input/output circuit 3 configured using the transistor element of the internal functional block area 2, a switch circuit 5 inserted between this pull-up resistor 4 and a power supply VDD, and a switch circuit 5 of this switch circuit. It includes one external control terminal 6 to which a signal for controlling opening and closing is applied.

Note that the external control terminal 6 is provided within a certain specific input/output circuit 3.

According to FIG. 2, the input circuit 3a has a gate connected to the input terminal 7 via the human power protection circuit 8, and a P-channel MO3
) transistor (hereinafter referred to as PMO3T) 9 and an N-channel MOS transistor (hereinafter referred to as NMO3T).

) 10, the inverter circuit has a CMO8 structure. Further, the pull-up resistor 4 is composed of a PMO3TII whose gate is grounded and whose drain is connected to the input terminal 7, and the switch circuit 5 is composed of a PMO3T12 and an NMO3T13 whose sources and drains are connected to each other. It is composed of a transmission circuit configured such that an inverted control voltage C0NT of the control voltage C0NT from the external control terminal 6 is applied, and the control voltage C0NT is applied to the gate of NMO3T13. Note that the same applies to output circuits and input/output circuits.

A feature of the present invention is that in FIG. 1, a pull-up resistor 4 and a switch circuit 5 as shown in FIG. 2 and an external control terminal 6 are provided.

No matter how many pins and miniaturization the TAB product with the structure of the second embodiment progresses, only three terminals, the power supply VDD terminal, the ground terminal, and the external control terminal 6, are placed on the TAB tape with special pad dimensions. By simply setting it as , burn-in tests can be performed reliably and efficiently and inexpensively on all terminals.

That is, when the switch circuit 5 is turned on by applying an "L" level control voltage to the external control terminal 6, the pull-up resistor 4 is inserted into all input/output circuits 3 through the switch circuit 5. . Therefore, the power supply VDD
A burn-in test can be performed by applying a voltage at a predetermined level to the terminal and the ground terminal, and applying a control voltage at the "L" level to the external control terminal 6.

On the other hand, when a control voltage of r) (J level is applied to the external control terminal 6, the switch circuit 5 is turned off, so the input/output circuit 3 becomes a normal circuit without the pull-up resistor 4 inserted.

FIG. 3 is a schematic layout diagram showing a second embodiment of the present invention.

This second embodiment is the same as the first embodiment shown in FIG.
The pull-up resistor 4 and the switch circuit 5 are connected as a single block, and the number of input/output circuits that require pull-up resistors is combined as a burn-in control circuit 14, as shown in FIG. It is compiled into one block. The circuit operation is similar to the first embodiment.

A feature of the present invention is that in FIG. 3, a burn-in control circuit 14 shown in FIG. 4 and an external control terminal 6 are provided.

According to the second embodiment, since the number of wiring lines is reduced and only one switch circuit is required, there is an advantage that the chip can be made smaller.

〔Effect of the invention〕

As explained above, the present invention configures a pull-up resistor of an input/output circuit using a transistor element built in an internal functional block area of a semiconductor integrated circuit, and further connects a switch circuit between this pull-up resistor and a power supply. configure,
By providing at least one external control terminal for controlling the opening and closing of this switch circuit, there is an effect that burn-in tests can be carried out inexpensively and efficiently even if TAB products have more pins and are made smaller.

[Brief explanation of the drawing]

FIG. 1 is a schematic layout diagram showing a first embodiment of the present invention. FIG. 2 is a circuit diagram showing an example of the input circuit, pull-up resistor, and switch circuit. FIG. 3 is a schematic layout diagram showing a second embodiment of the present invention. FIG. 4 is a block diagram showing the burn-in control circuit. DESCRIPTION OF SYMBOLS 1... Semiconductor chip, 2... Internal functional block area, 3... Input/output circuit, 3a... Input circuit, 4...
Pull-up resistor, 5... Switch circuit, 6... External control terminal, 7... Input terminal, 8... Input protection circuit,
9.11.12...P channel MOS transistor (
PMO5T), 10.13... N-channel MO3) transistor (NMO3T), 14... Burn-in control circuit.

Claims (1)

[Claims] 1. An internal functional block area including a transistor element;
In a semiconductor integrated circuit including a plurality of input/output circuits arranged around this internal functional block area, a pull-up resistor of the input/output circuit and a switch circuit inserted between the pull-up resistor and a power supply, A semiconductor integrated circuit configured using the transistor element in the internal functional block area, and further comprising at least one external terminal to which a signal for controlling opening/closing of the switch circuit is applied.