JPH02124573U - - Google Patents

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Publication number
JPH02124573U
JPH02124573U JP3280289U JP3280289U JPH02124573U JP H02124573 U JPH02124573 U JP H02124573U JP 3280289 U JP3280289 U JP 3280289U JP 3280289 U JP3280289 U JP 3280289U JP H02124573 U JPH02124573 U JP H02124573U
Authority
JP
Japan
Prior art keywords
block
test mode
tested
asic
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3280289U
Other languages
Japanese (ja)
Other versions
JPH0719016Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3280289U priority Critical patent/JPH0719016Y2/en
Publication of JPH02124573U publication Critical patent/JPH02124573U/ja
Application granted granted Critical
Publication of JPH0719016Y2 publication Critical patent/JPH0719016Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案を実施したASICのテスト・
モード設定回路の一例、第2図は本考案回路の動
作を表わすタイムチヤート、第3図は従来のAS
ICのテスト動作を説明するための図である。 1……ASIC、BA,BB,BC……回路ブ
ロツク、BT……テスト・ブロツク、MA,MB
……マルチプレクサ、FF1〜FFn……フリツ
プ・フロツプ回路。
Figure 1 shows the ASIC test and implementation of this invention.
An example of a mode setting circuit, Fig. 2 is a time chart showing the operation of the circuit of the present invention, and Fig. 3 is a conventional AS
FIG. 3 is a diagram for explaining an IC test operation. 1...ASIC, BA, BB, BC...Circuit block, BT...Test block, MA, MB
...Multiplexer, FF1 to FFn...Flip-flop circuit.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] テストすべきブロツクをn個(nは整数)有す
るASICに付加され、テスト・クロツクをトグ
ルさせて1個目の前記テストすべきブロツクから
所望するブロツクまで順次テスト・モードを設定
し、n個目のブロツクがテスト・モードに設定さ
れた後に通常動作モードに戻すシフト・レジスタ
構成のASICのテスト・モード設定回路。
It is attached to an ASIC having n blocks to be tested (n is an integer), and by toggling the test clock, the test mode is set sequentially from the first block to be tested to the desired block, and the test mode is set sequentially from the first block to be tested to the desired block. A test mode setting circuit for an ASIC having a shift register configuration that returns a block to a normal operation mode after it is set to a test mode.
JP3280289U 1989-03-23 1989-03-23 ASIC test mode setting circuit Expired - Lifetime JPH0719016Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3280289U JPH0719016Y2 (en) 1989-03-23 1989-03-23 ASIC test mode setting circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3280289U JPH0719016Y2 (en) 1989-03-23 1989-03-23 ASIC test mode setting circuit

Publications (2)

Publication Number Publication Date
JPH02124573U true JPH02124573U (en) 1990-10-15
JPH0719016Y2 JPH0719016Y2 (en) 1995-05-01

Family

ID=31535996

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3280289U Expired - Lifetime JPH0719016Y2 (en) 1989-03-23 1989-03-23 ASIC test mode setting circuit

Country Status (1)

Country Link
JP (1) JPH0719016Y2 (en)

Also Published As

Publication number Publication date
JPH0719016Y2 (en) 1995-05-01

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