JPH02114936U - - Google Patents

Info

Publication number
JPH02114936U
JPH02114936U JP2382789U JP2382789U JPH02114936U JP H02114936 U JPH02114936 U JP H02114936U JP 2382789 U JP2382789 U JP 2382789U JP 2382789 U JP2382789 U JP 2382789U JP H02114936 U JPH02114936 U JP H02114936U
Authority
JP
Japan
Prior art keywords
inker
objective lens
movable
photo interrupter
mode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2382789U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2382789U priority Critical patent/JPH02114936U/ja
Publication of JPH02114936U publication Critical patent/JPH02114936U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Ink Jet (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2382789U 1989-03-03 1989-03-03 Pending JPH02114936U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2382789U JPH02114936U (enExample) 1989-03-03 1989-03-03

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2382789U JPH02114936U (enExample) 1989-03-03 1989-03-03

Publications (1)

Publication Number Publication Date
JPH02114936U true JPH02114936U (enExample) 1990-09-14

Family

ID=31243147

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2382789U Pending JPH02114936U (enExample) 1989-03-03 1989-03-03

Country Status (1)

Country Link
JP (1) JPH02114936U (enExample)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49105483A (enExample) * 1973-02-07 1974-10-05
JPS5025578A (enExample) * 1973-07-06 1975-03-18
JPS5057379A (enExample) * 1973-09-18 1975-05-19
JPS60101941A (ja) * 1983-11-07 1985-06-06 Nec Corp 半導体ペレツト外観検査装置
JPS61292931A (ja) * 1985-06-21 1986-12-23 Hitachi Ltd 欠陥検査方法及び装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49105483A (enExample) * 1973-02-07 1974-10-05
JPS5025578A (enExample) * 1973-07-06 1975-03-18
JPS5057379A (enExample) * 1973-09-18 1975-05-19
JPS60101941A (ja) * 1983-11-07 1985-06-06 Nec Corp 半導体ペレツト外観検査装置
JPS61292931A (ja) * 1985-06-21 1986-12-23 Hitachi Ltd 欠陥検査方法及び装置

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