JPH02114104A - Apparatus for inspecting lead terminal of ic package - Google Patents

Apparatus for inspecting lead terminal of ic package

Info

Publication number
JPH02114104A
JPH02114104A JP26707788A JP26707788A JPH02114104A JP H02114104 A JPH02114104 A JP H02114104A JP 26707788 A JP26707788 A JP 26707788A JP 26707788 A JP26707788 A JP 26707788A JP H02114104 A JPH02114104 A JP H02114104A
Authority
JP
Japan
Prior art keywords
lead terminal
image
illumination
lgt
coordinate values
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP26707788A
Other languages
Japanese (ja)
Other versions
JPH0672772B2 (en
Inventor
Toshio Sasano
笹野 敏雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PFU Ltd
Original Assignee
PFU Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PFU Ltd filed Critical PFU Ltd
Priority to JP63267077A priority Critical patent/JPH0672772B2/en
Publication of JPH02114104A publication Critical patent/JPH02114104A/en
Publication of JPH0672772B2 publication Critical patent/JPH0672772B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To enhance the reliability of inspection by eliminating the difficulty in discriminating the projection image of a lead terminal by illuminating the lead terminal from just-above and diagonally-above positions by the first and second illumination devices and calculating the coordinate values of the taken images. CONSTITUTION:In order to obtain the projection images of a lead terminal in different directions, the first and second illumination devices LGT 1, LGT 2 respectively illuminating the lead terminal from a just-above position and a position having a predetermined inclination and a camera CMR successively taking the first and second projection images due to the illumination devices LGT 1, LGT 2 are provided. At first, the lead terminal is illuminated by the illumination device LGT 1 and the image thereof is taken by the camera CMR and the coordinate value thereof is calculated by an image processing part. Next, the lead terminal is illuminated by the illumination device LGT 2 and the image thereof is taken by the camera CMR and the coordinate value of said image is calculated by the image processing part. Further, the levitation quantity of the lead wire is calculated from the trigonometric functions of the coordinate values and compared with a reference value to judge the quality of the levitation of the lead terminal.

Description

【発明の詳細な説明】 〔1既  要〕 ICパッケージのリード端子の検査装置に関し、リード
端子の投影像の識別の難しさを解消し検査の信軌性の向
上を図ることを目的とし、ICパッケージのリード端子
検査装置であって、リード端子の投影像を異なる方向か
ら得るため一方を真上から照明し他方を所定の傾きで照
明する第1及び第2の照明部と、前記第1及び第2の照
明部による第1及び第2の投影像を順次に撮影する撮像
部と、前記第1及び第2の照明部の照明を切り換えるシ
ャッタ機構部と、前記撮像部による第1及び第2の撮像
の座標値を求めこれらの座標値からリード端子の縦方向
の浮きを算出し基準値と比較する画像処理部と、前記シ
ャッタ機構部及び画像処理部の動作を制御する制御部と
により構成される。
[Detailed Description of the Invention] [1 Remarks] Regarding an inspection device for lead terminals of an IC package, the purpose of this invention is to solve the difficulty of identifying projected images of lead terminals and improve the reliability of inspection. The package lead terminal inspection apparatus includes first and second illumination sections that illuminate one from directly above and the other at a predetermined tilt in order to obtain projected images of the lead terminal from different directions; an imaging unit that sequentially photographs first and second projected images by a second illumination unit; a shutter mechanism unit that switches illumination of the first and second illumination units; an image processing section that calculates the coordinate values of the imaging of the image, calculates the vertical lift of the lead terminal from these coordinate values, and compares it with a reference value, and a control section that controls the operation of the shutter mechanism section and the image processing section. be done.

〔産業上の利用分野〕[Industrial application field]

本発明はICパッケージのリード端子の検査、特にリー
ド端子の浮きの検査装置に関する。
The present invention relates to inspection of lead terminals of IC packages, and particularly to an apparatus for inspecting floating lead terminals.

情報機器には種々のtCパッケージが使用されている。Various tC packages are used in information equipment.

ICパッケージには非常の多くの足(リード端子)があ
るが、これらのリード端子は、ソケットとの位置関係か
ら出来るだけ浮き等の変形をなくし一列に並んでいるこ
とが望ましい。そのため製造メーカの出荷時には厳しい
検査がなされるが、昨今の需要増大に伴い検査の効率向
上と信顛性の向上が要望されている。
An IC package has a large number of legs (lead terminals), and it is desirable that these lead terminals are lined up in a line to avoid deformation such as floating as much as possible in view of their positional relationship with the socket. For this reason, strict inspections are carried out by manufacturers before shipment, but with the recent increase in demand, improvements in inspection efficiency and reliability are desired.

〔従来の技術〕[Conventional technology]

第7図(a)、(ハ)は従来のICパッケージのリード
端子の浮き検査を行うための検査装置の要部配置図であ
る。第7図(a)は検査装置を上方から見た図、(b)
は側面から見た図である。図において、fCPはICパ
ッケージ、LTはリード端子、LGT1、LGT2は照
明装置、CMRはカメラである2台の照明装置LGT1
、LGT2によってリード端子の正面から同時に照明を
当て、リード端子からの反射光をカメラCMHにより撮
像する。
FIGS. 7(a) and 7(c) are layout diagrams of main parts of a conventional inspection device for inspecting floating lead terminals of an IC package. Figure 7 (a) is a view of the inspection device viewed from above, (b)
is a side view. In the figure, fCP is an IC package, LT is a lead terminal, LGT1 and LGT2 are lighting devices, and CMR is a camera. Two lighting devices LGT1
, LGT2 simultaneously illuminate the lead terminals from the front, and the camera CMH images the reflected light from the lead terminals.

リード端子の先端部■の像である。浮きの検査は各機■
のY軸方向の座標値を求め、その平均値を重心座標値C
とし、この重心座標値と各機■の差を求め基準値と比較
することにより行う。
This is an image of the tip part (■) of the lead terminal. Each machine inspects the float■
Find the coordinate value in the Y-axis direction of
This is done by finding the difference between this center of gravity coordinate value and each machine (2) and comparing it with the standard value.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

第9図は従来の実際の描像を示す図である。斜線部はり
−F端子の実際の撮像である。第7図(b)に示すよう
に、この場合、カメラは先端部■の像に焦点を合わせる
が■の像の他に、立下がり部■の像と折り曲げ部■の像
を同時に撮像することになる。リート端子の折り曲げ部
の長さdが短いタイプでは焦点が接近しているため反射
光が混合され、図示のようにこれらの像の識別が不明瞭
となり正確な重心座標値を得ることが困難であり検査に
支障を来している。
FIG. 9 is a diagram showing a conventional actual image. The shaded area is an actual image of the beam-F terminal. As shown in FIG. 7(b), in this case, the camera focuses on the image of the tip part ■, but in addition to the image of ■, it simultaneously captures the image of the falling part ■ and the image of the bending part ■. become. In the type where the length d of the bent portion of the REIT terminal is short, the reflected light is mixed because the focal points are close together, and as shown in the figure, the identification of these images becomes unclear and it is difficult to obtain accurate barycenter coordinate values. Yes, it is interfering with inspection.

本発明の目的は、リード端子の投影像の識別の難しさを
解消し検査の信顛性の向上を図ることが可能なリード端
子検査装置を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a lead terminal inspection device that can solve the difficulty of identifying projected images of lead terminals and improve the reliability of inspection.

〔課題を解決するための手段〕[Means to solve the problem]

本発明は、第3図に基本構成図を示すように、tCパッ
ケージのリード端子検査装置であって、リード端子の投
影像を異なる方向から得るため一方を真上から照明し他
方を所定の傾きで照明する第1及び第2の照明部(LG
Tl、LGT2)と、前記第1及び第2の照明部による
第1及び第2の投影像を順次に撮影する礒像部(CMR
)と、前記第1及び第2の照明部の照明を切り換えるシ
ャッタ機構部(3)と、前記撮像部による第1及び第2
の撮像の座標値を求めこれらの座標値からリード端子の
縦方向の浮きを算出し基準値と比較する画像処理部(4
)と、前記シャッタ機構部及び画像処理部の動作を制御
する制御部(5)とを具備することを特徴とする。
As shown in the basic configuration diagram in FIG. 3, the present invention is a tC package lead terminal inspection device, in which one side is illuminated from directly above and the other side is illuminated at a predetermined inclination in order to obtain projected images of the lead terminals from different directions. The first and second lighting sections (LG
Tl, LGT2), and a imaging unit (CMR) that sequentially photographs first and second projected images by the first and second illumination units.
), a shutter mechanism section (3) that switches the illumination of the first and second illumination sections, and a shutter mechanism section (3) that switches the illumination of the first and second illumination sections;
An image processing unit (4) calculates the vertical lift of the lead terminal from these coordinate values and compares it with a reference value.
), and a control section (5) that controls the operations of the shutter mechanism section and the image processing section.

〔作 用] 第1図(a)、 (b)は本発明の要部配置図である。[For production] FIGS. 1(a) and 1(b) are layout diagrams of main parts of the present invention.

図に示すように、先ず、第1の照明装置LGTIにより
リード端子LTの真上上方から照明し、その投影像をカ
メラCMRで撮像し像の座標値を求める。次に、第2の
照明装置LGT2により同様にリード端子の斜め上方か
ら照明しその撮像の座標値を求める。そして2つの座標
値の三角関数よりリード端子の浮きを算出する。
As shown in the figure, first, the lead terminal LT is illuminated from directly above by the first illumination device LGTI, and its projected image is captured by the camera CMR to obtain the coordinate values of the image. Next, the second illumination device LGT2 similarly illuminates the lead terminal from diagonally above, and the coordinate values of the image are determined. Then, the float of the lead terminal is calculated from the trigonometric function of the two coordinate values.

第2図はカメラにより撮像されたリード端子の投影像で
ある。図において、実線は照明装置LGTIによる像、
点線は照明装置LGT2による像である。
FIG. 2 is a projected image of the lead terminal taken by a camera. In the figure, the solid line is the image obtained by the illumination device LGTI,
The dotted line is an image obtained by illumination device LGT2.

Sはリード端子の浮きにより生じる投影像のずれ量であ
る。このずれ量からリード端子の浮きを後述するように
画像処理部(4)により算出する。
S is the amount of deviation of the projected image caused by floating of the lead terminal. From this amount of deviation, the image processing section (4) calculates the floating of the lead terminal, as will be described later.

〔実施例〕〔Example〕

第3図は本発明のリード端子検査装置の基本構成ブロッ
ク図である。図において、1は2つの照明部(LGTI
 、 LGT2)、2は撮像部(カメラ) (CMR)
、3はシャッタ機構部、4は画像処理部、5はマイクロ
コンピュータからなる制御部である。 照明部lはリー
ド端子の投影像を異なる方向がら得るための第1及び第
2の照明装置を有し、カメラ2は前記第1及び第2の照
明装置による第1及び第2の投影像を順次撮影し、シャ
ッタ機構部3は前記第1及び第2の照明装置の照射光を
断続し、画像処理部4は前記カメラによる第1及び第2
の撮影像の座標値を求めこれらの座標値からリード端子
の縦方向の浮きを算出し基準値と比較する。第4図は第
3図装置の基本処理フローチャートである。先ず、照明
装置LGTIによりリード端子に照明しカメラでその撮
像を求め(1)、その撮像の座標値を算出する(2)。
FIG. 3 is a basic configuration block diagram of the lead terminal inspection device of the present invention. In the figure, 1 indicates two lighting units (LGTI
, LGT2), 2 is the imaging unit (camera) (CMR)
, 3 is a shutter mechanism section, 4 is an image processing section, and 5 is a control section consisting of a microcomputer. The illumination unit l has first and second illumination devices for obtaining projected images of the lead terminals from different directions, and the camera 2 receives the first and second projected images by the first and second illumination devices. The shutter mechanism section 3 intermittents the illumination light of the first and second illumination devices, and the image processing section 4 sequentially photographs the first and second illumination lights by the camera.
The coordinate values of the captured image are determined, and the vertical lift of the lead terminal is calculated from these coordinate values and compared with a reference value. FIG. 4 is a basic processing flowchart of the apparatus shown in FIG. First, the lead terminal is illuminated by the illumination device LGTI, its image is obtained by a camera (1), and the coordinate values of the image are calculated (2).

次に、照明装置LGT2によりリード端子に照明しカメ
ラでその撮像を求め(3)、その撮像の座標値を算出す
る(4)。そして後述する方法によりこれらの座標値の
三角関数からリード端子の浮き量を算出しく5)、基準
値と比較してリード端子浮きの良否を判定する(6)。
Next, the lead terminal is illuminated by the illumination device LGT2, its image is obtained by the camera (3), and the coordinate values of the image are calculated (4). Then, the floating amount of the lead terminal is calculated from the trigonometric function of these coordinate values using the method described later (5), and compared with a reference value to determine whether the lead terminal floating is good or bad (6).

第5図は本発明の照明装置とカメラの一実施例配置図で
ある。図において、51は照明装置の位置を制御するマ
イクロコンピュータによる位置制御装置、52は照射光
を誘導する光ファイバ、53は照明装置LGT2の角度
を調整する調整装置、54はICパッケージ(ICP)
を吸着するバキュームパッドである。前述のように、照
明装置LGTIの投影像と照明装置LGT2の投影像を
順次カメラにて撮像し画像処理部にて座標値を求める。
FIG. 5 is a layout diagram of an embodiment of the lighting device and camera of the present invention. In the figure, 51 is a microcomputer-based position control device that controls the position of the lighting device, 52 is an optical fiber that guides the irradiation light, 53 is an adjustment device that adjusts the angle of the lighting device LGT2, and 54 is an IC package (ICP).
It is a vacuum pad that absorbs. As described above, the projected image of the illumination device LGTI and the projected image of the illumination device LGT2 are sequentially captured by the camera and the coordinate values are determined by the image processing unit.

第6図(a)、 (b)は本発明の投影像を示す図であ
る。
FIGS. 6(a) and 6(b) are diagrams showing projected images of the present invention.

(a)はり一ト端子の側面から、(b)は上面から見た
浮きを示している。(a)において斜線部はリード端子
の先端■像、(b)において実線は照明装置LGTIに
よる投影像、点線は照明装置LGT2による投影像であ
る。
(a) shows the float seen from the side of the beam terminal, and (b) shows the float seen from the top. In (a), the shaded area is an image of the tip of the lead terminal, in (b), the solid line is an image projected by the illumination device LGTI, and the dotted line is an image projected by the illumination device LGT2.

ここで照明装置LGTIによる投影像の幅をa、照明装
置LGT2による投影像の幅をa゛、浮きの高さの任意
の設定値をX、ずれ量をS、リード端子の板厚をH,I
t(明装置LGT2の入射角をθとする。
Here, the width of the projected image by the illumination device LGTI is a, the width of the projected image by the illumination device LGT2 is a゛, the arbitrary setting value of the float height is X, the amount of deviation is S, the plate thickness of the lead terminal is H, I
t (The incident angle of the light device LGT2 is assumed to be θ.

このような関係において、照明装置LGT2の入射角θ
は、 θ−Lan −’(a −a’ )/ H・・・・・1
1)と表せる。
In such a relationship, the incident angle θ of the lighting device LGT2
is θ-Lan-'(a-a')/H...1
It can be expressed as 1).

式(1)から明らかなように、ずれ量Sは、5=x−t
an θ・・・・・・・・・・・(2)と表せるから、
投影像のずれlsは浮きXと関係し、浮きXを所定の許
容基準値に設定すれば、式(2)からSの範囲を見るこ
とによりリード端子浮き検査を行うことができる。例え
ば、 S≦X・tan θを良品と判定し、 S>x・tan θを不良品と判定する。
As is clear from equation (1), the amount of deviation S is 5=x−t
Since it can be expressed as an θ・・・・・・・・・(2),
The deviation ls of the projected image is related to the float X, and if the float X is set to a predetermined allowable reference value, the lead terminal float can be inspected by looking at the range of S from equation (2). For example, S≦X・tan θ is determined to be a good product, and S>x・tan θ is determined to be a defective product.

この場合、前述のように、式(1)、 (2)の算出を
画像処理部4にて行う。
In this case, as described above, the image processing unit 4 calculates equations (1) and (2).

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明によれば、リード端子の折
り曲げ部の長さに無関係に検査ができ、投影光の識別は
不要となり、かつ照明装置の位置調整も容易となるため
、検査の能率向上と信頼性の向上を図ることができる。
As explained above, according to the present invention, inspection can be performed regardless of the length of the bent portion of the lead terminal, there is no need to identify the projected light, and the position of the illumination device can be easily adjusted, thereby increasing inspection efficiency. It is possible to improve performance and reliability.

【図面の簡単な説明】[Brief explanation of drawings]

第1図(a)、 (b)は本発明による第1及び第2の
照明装置とICパッケージとリード端子とカメラの要部
配置図、 第2図は第1図のカメラにより撮像されたり−ト端子の
投影像を示す図、 第:3図は本発明のリード端子検査装置の基本構成ブロ
ック図、 第4図は第3図装置の処理フローチャート、第5図は本
発明の照明装置とカメラの一実施例要部構成図、 第6図(a)、 (b)は本発明のリード端子の側面及
び上面から見たリード端子の投影像を示す図、第7図(
a)、 (b)は従来のlCパッケージのリード端子の
検査の要部配置図、 第8図は従来の先端部の描像を示す図、及び第9図は従
来の実際の撮像明する図である。 (符号の説明) 1 、 LGT1、LGT2・・・照明装置、2、CM
R・・・カメラ、    3・・・シャッタ機構部、4
・・・画像処理部、   5・・・制御部、ICP・・
・ICパッケージ、LT・・・リード端子。 本発明の要部配置図 第112I 第3図装置の処理フローチャート 第 図 カメラ上の投影像を示マ図 ’$2FjJ 本発明の基本構成ブロック図 )83図 本発明の一実施例要部構成図 第5図 (a) Y (b) 本発明[よる投影像を示す図 第 図 しGTI (Q) 従来の要部配置図 #I7図
1(a) and 1(b) are main part layout diagrams of the first and second lighting devices, IC packages, lead terminals, and cameras according to the present invention, and FIG. 2 is an image taken by the camera of FIG. 1. Figure 3 is a basic configuration block diagram of the lead terminal inspection device of the present invention, Figure 4 is a processing flowchart of the device shown in Figure 3, and Figure 5 is the illumination device and camera of the present invention. 6(a) and 6(b) are diagrams showing projected images of the lead terminal of the present invention as seen from the side and top surfaces, and FIG. 7(
a) and (b) are layout diagrams of the main parts of conventional IC package lead terminal inspection, Figure 8 is a diagram showing the conventional depiction of the tip, and Figure 9 is a diagram showing the actual conventional imaging. be. (Explanation of symbols) 1. LGT1, LGT2...Lighting device, 2. CM
R...Camera, 3...Shutter mechanism section, 4
...Image processing unit, 5...Control unit, ICP...
・IC package, LT...lead terminal. Layout of essential parts of the present invention Figure 112I Figure 3 Processing flowchart of the device Figure 2: Diagram showing the projected image on the camera Figure '$2FjJ Basic configuration block diagram of the present invention) Figure 83 Configuration diagram of essential parts of an embodiment of the present invention Figure 5 (a) Y (b) Diagram showing a projected image according to the present invention Figure 5 (Q) Conventional layout diagram of main parts #I7 Figure

Claims (1)

【特許請求の範囲】 1、ICパッケージのリード端子検査装置であって、 リード端子の投影像を異なる方向から得るため一方を真
上から照明し他方を所定の傾きで照明する第1及び第2
の照明部(LGT1、LGT2)と、前記第1及び第2
の照明部による第1及び第2の投影像を順次に撮影する
撮像部(CMR)と、前記第1及び第2の照明部の照明
を切り換えるシャッタ機構部(3)と、 前記撮像部による第1及び第2の撮像の座標値を求めこ
れらの座標値からリード端子の縦方向の浮きを算出し基
準値と比較する画像処理部(4)と、前記シャッタ機構
部及び画像処理部の動作を制御する制御部(5)と、 を具備することを特徴とするICパッケージのリード端
子検査装置。
[Scope of Claims] 1. A lead terminal inspection device for an IC package, comprising first and second lamps that illuminate one side from directly above and the other at a predetermined inclination in order to obtain projected images of the lead terminals from different directions.
lighting units (LGT1, LGT2), and the first and second illumination units (LGT1, LGT2);
an imaging unit (CMR) that sequentially photographs first and second projection images by the illumination unit; a shutter mechanism unit (3) that switches the illumination of the first and second illumination units; An image processing unit (4) that calculates the coordinate values of the first and second imaging, calculates the vertical lift of the lead terminal from these coordinate values, and compares it with a reference value, and controls the operation of the shutter mechanism unit and the image processing unit. An IC package lead terminal inspection device, comprising: a control section (5) for controlling;
JP63267077A 1988-10-25 1988-10-25 IC package lead terminal inspection device Expired - Lifetime JPH0672772B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63267077A JPH0672772B2 (en) 1988-10-25 1988-10-25 IC package lead terminal inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63267077A JPH0672772B2 (en) 1988-10-25 1988-10-25 IC package lead terminal inspection device

Publications (2)

Publication Number Publication Date
JPH02114104A true JPH02114104A (en) 1990-04-26
JPH0672772B2 JPH0672772B2 (en) 1994-09-14

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP63267077A Expired - Lifetime JPH0672772B2 (en) 1988-10-25 1988-10-25 IC package lead terminal inspection device

Country Status (1)

Country Link
JP (1) JPH0672772B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06160057A (en) * 1992-11-24 1994-06-07 Just:Kk Device for inspecting lead shape of electronic part

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6486532A (en) * 1987-09-28 1989-03-31 Dakku Eng Kk Two-field image sensing method

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6486532A (en) * 1987-09-28 1989-03-31 Dakku Eng Kk Two-field image sensing method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06160057A (en) * 1992-11-24 1994-06-07 Just:Kk Device for inspecting lead shape of electronic part

Also Published As

Publication number Publication date
JPH0672772B2 (en) 1994-09-14

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