JPH0191264U - - Google Patents

Info

Publication number
JPH0191264U
JPH0191264U JP18750587U JP18750587U JPH0191264U JP H0191264 U JPH0191264 U JP H0191264U JP 18750587 U JP18750587 U JP 18750587U JP 18750587 U JP18750587 U JP 18750587U JP H0191264 U JPH0191264 U JP H0191264U
Authority
JP
Japan
Prior art keywords
laser diode
diode module
power supply
output current
light emission
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18750587U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0617292Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987187505U priority Critical patent/JPH0617292Y2/ja
Publication of JPH0191264U publication Critical patent/JPH0191264U/ja
Application granted granted Critical
Publication of JPH0617292Y2 publication Critical patent/JPH0617292Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1987187505U 1987-12-09 1987-12-09 半導体受光素子の検査装置 Expired - Lifetime JPH0617292Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987187505U JPH0617292Y2 (ja) 1987-12-09 1987-12-09 半導体受光素子の検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987187505U JPH0617292Y2 (ja) 1987-12-09 1987-12-09 半導体受光素子の検査装置

Publications (2)

Publication Number Publication Date
JPH0191264U true JPH0191264U (enrdf_load_stackoverflow) 1989-06-15
JPH0617292Y2 JPH0617292Y2 (ja) 1994-05-02

Family

ID=31478653

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987187505U Expired - Lifetime JPH0617292Y2 (ja) 1987-12-09 1987-12-09 半導体受光素子の検査装置

Country Status (1)

Country Link
JP (1) JPH0617292Y2 (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007208253A (ja) * 2006-01-09 2007-08-16 Samsung Electronics Co Ltd イメージセンサテスト方法及びその装置
JP2009195968A (ja) * 2008-02-25 2009-09-03 Mitsubishi Electric Corp レーザスクライブ装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59178742A (ja) * 1983-03-30 1984-10-11 Fujitsu Ltd 半導体受光素子の特性測定方法
JPS6168324U (enrdf_load_stackoverflow) * 1984-10-12 1986-05-10
JPS62145356U (enrdf_load_stackoverflow) * 1986-03-07 1987-09-12
JPS62261187A (ja) * 1986-05-07 1987-11-13 Ricoh Co Ltd 半導体レ−ザ−ユニツト

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59178742A (ja) * 1983-03-30 1984-10-11 Fujitsu Ltd 半導体受光素子の特性測定方法
JPS6168324U (enrdf_load_stackoverflow) * 1984-10-12 1986-05-10
JPS62145356U (enrdf_load_stackoverflow) * 1986-03-07 1987-09-12
JPS62261187A (ja) * 1986-05-07 1987-11-13 Ricoh Co Ltd 半導体レ−ザ−ユニツト

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007208253A (ja) * 2006-01-09 2007-08-16 Samsung Electronics Co Ltd イメージセンサテスト方法及びその装置
JP2009195968A (ja) * 2008-02-25 2009-09-03 Mitsubishi Electric Corp レーザスクライブ装置

Also Published As

Publication number Publication date
JPH0617292Y2 (ja) 1994-05-02

Similar Documents

Publication Publication Date Title
US6377840B1 (en) Signal acquisition and processing system for reduced output signal drift in a spectrophotometric instrument
KR100778197B1 (ko) 기체 검출 방법 및 기체 검출기 장치
US4040740A (en) Opto-electronic sensor
JP4245669B2 (ja) 複数の光源を用いたパイロメータの校正
JPH1026557A (ja) 熱処理システムの赤外パイロメータの校正方法及び装置
CN101354287A (zh) 一种光谱仪及其校正方法
JPS60183531A (ja) 色差検知装置
JPS60259935A (ja) 濁度計
JPH0191264U (enrdf_load_stackoverflow)
JPH05142146A (ja) ガス測定装置
US4930134A (en) Precision temperature sensor
JPH106064A (ja) レーザはんだ付け方法およびその装置
CN114112314A (zh) 一种多功能光电探测系统探测性能测试方法
JP2003518616A (ja) 光ビームの空間平均強度を測定する方法および装置、ならびに光源を調整するための方法および装置
JPS6311634Y2 (enrdf_load_stackoverflow)
JPH051991B2 (enrdf_load_stackoverflow)
JPH11142326A (ja) グリコヘモグロビン測定用の吸光度計
JP2814992B2 (ja) 標準化光源用半導体レーザダイオード
JPS6271510U (enrdf_load_stackoverflow)
CN221426449U (zh) 一种二级温控co激光检测探头
JPH038384A (ja) 半導体レーザ装置
JPH04332841A (ja) 半導体発光装置の検査方法
JPH0515083Y2 (enrdf_load_stackoverflow)
RU2038585C1 (ru) Фотоколориметрический газоанализатор
JP2776501B2 (ja) 光送信器