JPH0157283B2 - - Google Patents

Info

Publication number
JPH0157283B2
JPH0157283B2 JP54018868A JP1886879A JPH0157283B2 JP H0157283 B2 JPH0157283 B2 JP H0157283B2 JP 54018868 A JP54018868 A JP 54018868A JP 1886879 A JP1886879 A JP 1886879A JP H0157283 B2 JPH0157283 B2 JP H0157283B2
Authority
JP
Japan
Prior art keywords
signal
output
inspected
detection
black
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54018868A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55110905A (en
Inventor
Hajime Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hajime Industries Ltd
Original Assignee
Hajime Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hajime Industries Ltd filed Critical Hajime Industries Ltd
Priority to JP1886879A priority Critical patent/JPS55110905A/ja
Priority to US06/121,516 priority patent/US4302773A/en
Priority to CA345,970A priority patent/CA1126855A/en
Priority to DE19803006341 priority patent/DE3006341A1/de
Priority to GB8005710A priority patent/GB2046899B/en
Priority to FR8003716A priority patent/FR2449884A1/fr
Publication of JPS55110905A publication Critical patent/JPS55110905A/ja
Publication of JPH0157283B2 publication Critical patent/JPH0157283B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Medical Preparation Storing Or Oral Administration Devices (AREA)
JP1886879A 1979-02-20 1979-02-20 Defect detecting device Granted JPS55110905A (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP1886879A JPS55110905A (en) 1979-02-20 1979-02-20 Defect detecting device
US06/121,516 US4302773A (en) 1979-02-20 1980-02-14 Defect inspection system
CA345,970A CA1126855A (en) 1979-02-20 1980-02-19 Defect inspection system
DE19803006341 DE3006341A1 (de) 1979-02-20 1980-02-20 Defektpruefsystem
GB8005710A GB2046899B (en) 1979-02-20 1980-02-20 Defect inspection system
FR8003716A FR2449884A1 (fr) 1979-02-20 1980-02-20 Systeme de detection de defauts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1886879A JPS55110905A (en) 1979-02-20 1979-02-20 Defect detecting device

Publications (2)

Publication Number Publication Date
JPS55110905A JPS55110905A (en) 1980-08-27
JPH0157283B2 true JPH0157283B2 (OSRAM) 1989-12-05

Family

ID=11983513

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1886879A Granted JPS55110905A (en) 1979-02-20 1979-02-20 Defect detecting device

Country Status (6)

Country Link
US (1) US4302773A (OSRAM)
JP (1) JPS55110905A (OSRAM)
CA (1) CA1126855A (OSRAM)
DE (1) DE3006341A1 (OSRAM)
FR (1) FR2449884A1 (OSRAM)
GB (1) GB2046899B (OSRAM)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU553069B2 (en) * 1981-07-17 1986-07-03 W.R. Grace & Co.-Conn. Radial scan, pulsed light article inspection ccv system 0
US4598420A (en) * 1983-12-08 1986-07-01 Mts Systems Corporation Optical grid analyzer system for automatically determining strain in deformed sheet metal
GB2175396B (en) * 1985-05-22 1989-06-28 Filler Protection Developments Apparatus for examining objects
JPS6219738A (ja) * 1985-07-19 1987-01-28 Tokan Kogyo Co Ltd 使い捨てコツプのカ−ル部不良検査装置
DE3734294A1 (de) * 1987-10-09 1989-04-27 Sick Optik Elektronik Erwin Optische oberflaechen-inspektionsvorrichtung

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3584963A (en) * 1968-12-27 1971-06-15 Rca Corp Optical flaw detector
US3749496A (en) * 1971-07-16 1973-07-31 Bendix Corp Automatic quality control surface inspection system for determining the character of a surface by measuring the shape and intensity of a modulated beam
US3700909A (en) * 1972-03-09 1972-10-24 Columbia Research Corp Method for detecting pinhole defects in foil material
US4025201A (en) * 1975-04-21 1977-05-24 Ball Brothers Service Corporation Method and apparatus for video inspection of articles of manufacture by decussate paths of light
DE2617111C3 (de) * 1976-04-17 1986-02-20 Robert Bosch Gmbh, 7000 Stuttgart Verfahren zum Feststellen einer Bewegung im Überwachungsbereich einer Fernsehkamera
JPS5571937A (en) * 1978-11-24 1980-05-30 Kanebo Ltd Method of and device for inspecting surface

Also Published As

Publication number Publication date
US4302773A (en) 1981-11-24
FR2449884B1 (OSRAM) 1984-11-02
GB2046899B (en) 1983-10-26
CA1126855A (en) 1982-06-29
JPS55110905A (en) 1980-08-27
DE3006341A1 (de) 1980-08-28
GB2046899A (en) 1980-11-19
FR2449884A1 (fr) 1980-09-19
DE3006341C2 (OSRAM) 1990-01-25

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