JPH0152898B2 - - Google Patents
Info
- Publication number
- JPH0152898B2 JPH0152898B2 JP60015797A JP1579785A JPH0152898B2 JP H0152898 B2 JPH0152898 B2 JP H0152898B2 JP 60015797 A JP60015797 A JP 60015797A JP 1579785 A JP1579785 A JP 1579785A JP H0152898 B2 JPH0152898 B2 JP H0152898B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- adsorption
- installation
- base
- suction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/50—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for positioning, orientation or alignment
- H10P72/57—Mask-wafer alignment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/78—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks
Landscapes
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Jigs For Machine Tools (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60015797A JPS61174734A (ja) | 1985-01-30 | 1985-01-30 | 基体吸着法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60015797A JPS61174734A (ja) | 1985-01-30 | 1985-01-30 | 基体吸着法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61174734A JPS61174734A (ja) | 1986-08-06 |
| JPH0152898B2 true JPH0152898B2 (enExample) | 1989-11-10 |
Family
ID=11898828
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60015797A Granted JPS61174734A (ja) | 1985-01-30 | 1985-01-30 | 基体吸着法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61174734A (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5146183B2 (ja) * | 2008-07-31 | 2013-02-20 | 株式会社ニコン | 露光方法、デバイスの製造方法及び露光装置 |
| CN110919420A (zh) * | 2019-11-26 | 2020-03-27 | 芜湖诚拓汽车部件股份有限公司 | 汽车铸造件自动化生产铸件加工夹持工装 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4433835A (en) * | 1981-11-30 | 1984-02-28 | Tencor Instruments | Wafer chuck with wafer cleaning feature |
| JPS5946030A (ja) * | 1982-09-08 | 1984-03-15 | Canon Inc | ウェハの吸着固定方法 |
-
1985
- 1985-01-30 JP JP60015797A patent/JPS61174734A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61174734A (ja) | 1986-08-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP3224157B2 (ja) | X線マスクとその製造方法、並びに該x線マスクを用いたデバイス製造方法とx線露光装置 | |
| JP4286194B2 (ja) | ペリクルフレーム、および該フレームを用いたフォトリソグラフィー用ペリクル | |
| US6820525B2 (en) | Precision Fiducial | |
| JPS61174734A (ja) | 基体吸着法 | |
| KR101143628B1 (ko) | 펠리클, 펠리클을 포함하는 포토마스크, 포토마스크의 제조방법 | |
| JPH05267116A (ja) | ウェハチャックの取り付け構造 | |
| JPH0329313A (ja) | X線マスクおよびその製造方法 | |
| JP4331604B2 (ja) | 露光マスク装置及び露光マスクに多数の基板を整列する方法 | |
| JPS63150918A (ja) | X線露光用マスク | |
| JPH0235445B2 (enExample) | ||
| KR960010726B1 (ko) | 반도체 소자의 레지스트 패턴 형성방법 | |
| JPH0262939B2 (enExample) | ||
| JPS622610Y2 (enExample) | ||
| JPH09330866A (ja) | プロキシミティー露光方法及びプロキシミティー露光装置 | |
| JPH07263329A (ja) | X線マスクの製造治具およびそれを用いたx線マスクの製造方法 | |
| CN101661218A (zh) | 透明光掩模的制备方法 | |
| JP3549932B2 (ja) | 露光機 | |
| JPS5984245A (ja) | フオトマスク | |
| JPH04136855A (ja) | 露光用マスクの製造方法 | |
| JPS60229336A (ja) | 電子ビ−ム露光用基板装着装置 | |
| JPH04212406A (ja) | X線マスクの製造方法 | |
| JPH0437113A (ja) | 縮小投影露光装置 | |
| JPH05217863A (ja) | 支持体付きx線マスク材料および支持体付きx線マスク | |
| JPS62113424A (ja) | 半導体装置製造用基板 | |
| JP2000150361A (ja) | 位置計測方法および位置計測装置 |