JPH0127399Y2 - - Google Patents
Info
- Publication number
- JPH0127399Y2 JPH0127399Y2 JP1980164468U JP16446880U JPH0127399Y2 JP H0127399 Y2 JPH0127399 Y2 JP H0127399Y2 JP 1980164468 U JP1980164468 U JP 1980164468U JP 16446880 U JP16446880 U JP 16446880U JP H0127399 Y2 JPH0127399 Y2 JP H0127399Y2
- Authority
- JP
- Japan
- Prior art keywords
- test
- section
- voltage
- leakage
- leakage current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 23
- 230000010355 oscillation Effects 0.000 description 13
- 239000003990 capacitor Substances 0.000 description 10
- 230000007257 malfunction Effects 0.000 description 9
- 238000010586 diagram Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 3
- 230000001960 triggered effect Effects 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 238000012790 confirmation Methods 0.000 description 2
- 101000668165 Homo sapiens RNA-binding motif, single-stranded-interacting protein 1 Proteins 0.000 description 1
- 102100039692 RNA-binding motif, single-stranded-interacting protein 1 Human genes 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000010008 shearing Methods 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Emergency Protection Circuit Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1980164468U JPH0127399Y2 (de) | 1980-11-14 | 1980-11-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1980164468U JPH0127399Y2 (de) | 1980-11-14 | 1980-11-14 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5785827U JPS5785827U (de) | 1982-05-27 |
| JPH0127399Y2 true JPH0127399Y2 (de) | 1989-08-16 |
Family
ID=29523195
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1980164468U Expired JPH0127399Y2 (de) | 1980-11-14 | 1980-11-14 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0127399Y2 (de) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB9606751D0 (en) * | 1996-03-29 | 1996-06-05 | Robin Electronics Ltd | RCD loop tester |
| JP2010210361A (ja) * | 2009-03-10 | 2010-09-24 | American Denki Co Ltd | 配電線の漏洩電流検査装置 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5356537U (de) * | 1976-10-18 | 1978-05-15 |
-
1980
- 1980-11-14 JP JP1980164468U patent/JPH0127399Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5785827U (de) | 1982-05-27 |
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