JPH0125429B2 - - Google Patents

Info

Publication number
JPH0125429B2
JPH0125429B2 JP56167598A JP16759881A JPH0125429B2 JP H0125429 B2 JPH0125429 B2 JP H0125429B2 JP 56167598 A JP56167598 A JP 56167598A JP 16759881 A JP16759881 A JP 16759881A JP H0125429 B2 JPH0125429 B2 JP H0125429B2
Authority
JP
Japan
Prior art keywords
voltage
current
power supply
measurement
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56167598A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5868679A (ja
Inventor
Masahiro Yoshida
Kotaro Mitsui
Susumu Yoshida
Takao Oda
Yoshinori Yukimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP16759881A priority Critical patent/JPS5868679A/ja
Publication of JPS5868679A publication Critical patent/JPS5868679A/ja
Publication of JPH0125429B2 publication Critical patent/JPH0125429B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP16759881A 1981-10-19 1981-10-19 半導体素子の特性測定方法 Granted JPS5868679A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16759881A JPS5868679A (ja) 1981-10-19 1981-10-19 半導体素子の特性測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16759881A JPS5868679A (ja) 1981-10-19 1981-10-19 半導体素子の特性測定方法

Publications (2)

Publication Number Publication Date
JPS5868679A JPS5868679A (ja) 1983-04-23
JPH0125429B2 true JPH0125429B2 (pl) 1989-05-17

Family

ID=15852731

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16759881A Granted JPS5868679A (ja) 1981-10-19 1981-10-19 半導体素子の特性測定方法

Country Status (1)

Country Link
JP (1) JPS5868679A (pl)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102928249B (zh) * 2012-11-26 2015-01-21 中国人民解放军国防科学技术大学 基于程控电源的太阳电池阵输出的模拟系统、方法
CN103576080A (zh) * 2013-11-15 2014-02-12 上海华岭集成电路技术股份有限公司 芯片扫描电压测试方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4828176A (pl) * 1971-08-16 1973-04-13
JPS50110286A (pl) * 1974-02-06 1975-08-30

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4828176A (pl) * 1971-08-16 1973-04-13
JPS50110286A (pl) * 1974-02-06 1975-08-30

Also Published As

Publication number Publication date
JPS5868679A (ja) 1983-04-23

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