JPS4828176A - - Google Patents

Info

Publication number
JPS4828176A
JPS4828176A JP6221371A JP6221371A JPS4828176A JP S4828176 A JPS4828176 A JP S4828176A JP 6221371 A JP6221371 A JP 6221371A JP 6221371 A JP6221371 A JP 6221371A JP S4828176 A JPS4828176 A JP S4828176A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6221371A
Other languages
Japanese (ja)
Other versions
JPS5137867B2 (pl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6221371A priority Critical patent/JPS5137867B2/ja
Publication of JPS4828176A publication Critical patent/JPS4828176A/ja
Publication of JPS5137867B2 publication Critical patent/JPS5137867B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP6221371A 1971-08-16 1971-08-16 Expired JPS5137867B2 (pl)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6221371A JPS5137867B2 (pl) 1971-08-16 1971-08-16

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6221371A JPS5137867B2 (pl) 1971-08-16 1971-08-16

Publications (2)

Publication Number Publication Date
JPS4828176A true JPS4828176A (pl) 1973-04-13
JPS5137867B2 JPS5137867B2 (pl) 1976-10-18

Family

ID=44515083

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6221371A Expired JPS5137867B2 (pl) 1971-08-16 1971-08-16

Country Status (1)

Country Link
JP (1) JPS5137867B2 (pl)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5075747U (pl) * 1973-11-14 1975-07-02
JPS50110286A (pl) * 1974-02-06 1975-08-30
JPS5231552A (en) * 1975-09-04 1977-03-10 Matsushita Electric Ind Co Ltd Hot water heating and cooling device
JPS5320869U (pl) * 1976-07-30 1978-02-22
JPS53103667U (pl) * 1977-01-26 1978-08-21
JPS5421177A (en) * 1977-07-18 1979-02-17 Mitsubishi Electric Corp Measuring unit for characters
JPS5513588A (en) * 1978-07-17 1980-01-30 Nec Corp Sampling circuit
JPS5521056A (en) * 1978-08-01 1980-02-14 Chiyou Lsi Gijutsu Kenkyu Kumiai Laser scanning microscopic apparatus
JPS5558468A (en) * 1978-10-26 1980-05-01 Ishikawajima Harima Heavy Ind Co Ltd Electrical deterioration degree and deterioration location detection method of electric circuit
JPS5868679A (ja) * 1981-10-19 1983-04-23 Mitsubishi Electric Corp 半導体素子の特性測定方法
JPS61252461A (ja) * 1985-05-02 1986-11-10 ホシザキ電機株式会社 給湯器付き冷凍機

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6113946U (ja) * 1984-06-29 1986-01-27 株式会社安川電機 半導体素子の冷却装置

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5075747U (pl) * 1973-11-14 1975-07-02
JPS50110286A (pl) * 1974-02-06 1975-08-30
JPS5544302B2 (pl) * 1975-09-04 1980-11-11
JPS5231552A (en) * 1975-09-04 1977-03-10 Matsushita Electric Ind Co Ltd Hot water heating and cooling device
JPS5320869U (pl) * 1976-07-30 1978-02-22
JPS53103667U (pl) * 1977-01-26 1978-08-21
JPS5421177A (en) * 1977-07-18 1979-02-17 Mitsubishi Electric Corp Measuring unit for characters
JPS5513588A (en) * 1978-07-17 1980-01-30 Nec Corp Sampling circuit
JPS5521056A (en) * 1978-08-01 1980-02-14 Chiyou Lsi Gijutsu Kenkyu Kumiai Laser scanning microscopic apparatus
JPS6339099B2 (pl) * 1978-08-01 1988-08-03 Cho Eru Esu Ai Gijutsu Kenkyu Kumiai
JPS5558468A (en) * 1978-10-26 1980-05-01 Ishikawajima Harima Heavy Ind Co Ltd Electrical deterioration degree and deterioration location detection method of electric circuit
JPS5868679A (ja) * 1981-10-19 1983-04-23 Mitsubishi Electric Corp 半導体素子の特性測定方法
JPH0125429B2 (pl) * 1981-10-19 1989-05-17 Mitsubishi Electric Corp
JPS61252461A (ja) * 1985-05-02 1986-11-10 ホシザキ電機株式会社 給湯器付き冷凍機
JPH0435659B2 (pl) * 1985-05-02 1992-06-11 Hoshizaki Electric Co Ltd

Also Published As

Publication number Publication date
JPS5137867B2 (pl) 1976-10-18

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