JPS5558468A - Electrical deterioration degree and deterioration location detection method of electric circuit - Google Patents

Electrical deterioration degree and deterioration location detection method of electric circuit

Info

Publication number
JPS5558468A
JPS5558468A JP13193678A JP13193678A JPS5558468A JP S5558468 A JPS5558468 A JP S5558468A JP 13193678 A JP13193678 A JP 13193678A JP 13193678 A JP13193678 A JP 13193678A JP S5558468 A JPS5558468 A JP S5558468A
Authority
JP
Japan
Prior art keywords
value
electric circuit
branch passage
deterioration
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13193678A
Other languages
Japanese (ja)
Inventor
Hisamori Tofuji
Hideo Shibata
Mitsuru Chizuwa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IHI Corp
Original Assignee
IHI Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by IHI Corp filed Critical IHI Corp
Priority to JP13193678A priority Critical patent/JPS5558468A/en
Publication of JPS5558468A publication Critical patent/JPS5558468A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Locating Faults (AREA)

Abstract

PURPOSE: To beforehand prevent the generation of trouble, by detecting the electrical deterioration degree of each branch passage under deterioration conditions by comparing the display value of the set quantity of electricity of an electric circuit with a plurality of branch passages with the display value of the actual quantity of electricity.
CONSTITUTION: An electric circuit 1 is formed in such a manner that a branch passage lab to which electric heating resistors a1, a2 are connected in parallel, a branch passage 1bc to which electric heating resistors b1, b2 are connected in parallel and a branch passage 1ca to which electric heating resistors c1, c2 are connected in parallel are delta-connected. In the electric circuit 1, the display value of set currents is previously prepared to a generator or a memory storage for comparing it as voltage value or digital value. Actual current value is obtained from current transformers CTa, CTb, CTc, and the value is compared with value beforehand prepared, thus detecting the electrical deterioration degree of each branch passage and passages under deterioration conditions.
COPYRIGHT: (C)1980,JPO&Japio
JP13193678A 1978-10-26 1978-10-26 Electrical deterioration degree and deterioration location detection method of electric circuit Pending JPS5558468A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13193678A JPS5558468A (en) 1978-10-26 1978-10-26 Electrical deterioration degree and deterioration location detection method of electric circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13193678A JPS5558468A (en) 1978-10-26 1978-10-26 Electrical deterioration degree and deterioration location detection method of electric circuit

Publications (1)

Publication Number Publication Date
JPS5558468A true JPS5558468A (en) 1980-05-01

Family

ID=15069668

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13193678A Pending JPS5558468A (en) 1978-10-26 1978-10-26 Electrical deterioration degree and deterioration location detection method of electric circuit

Country Status (1)

Country Link
JP (1) JPS5558468A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004046209A (en) * 1997-08-21 2004-02-12 Seiko Epson Corp Display device
JP2004146388A (en) * 1997-08-21 2004-05-20 Seiko Epson Corp Method for forming organic semiconductor film, and method for manufacturing active matrix substrate
JP2016110732A (en) * 2014-12-03 2016-06-20 大同プラント工業株式会社 Resistance value detection method for three-phase heater
JP2019079612A (en) * 2017-10-20 2019-05-23 光洋サーモシステム株式会社 Abnormality detection device of large current circuit, and large current circuit device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4828176A (en) * 1971-08-16 1973-04-13

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4828176A (en) * 1971-08-16 1973-04-13

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004046209A (en) * 1997-08-21 2004-02-12 Seiko Epson Corp Display device
JP2004146388A (en) * 1997-08-21 2004-05-20 Seiko Epson Corp Method for forming organic semiconductor film, and method for manufacturing active matrix substrate
JP2016110732A (en) * 2014-12-03 2016-06-20 大同プラント工業株式会社 Resistance value detection method for three-phase heater
JP2019079612A (en) * 2017-10-20 2019-05-23 光洋サーモシステム株式会社 Abnormality detection device of large current circuit, and large current circuit device
JP2021170550A (en) * 2017-10-20 2021-10-28 光洋サーモシステム株式会社 Abnormality detection device of large current circuit, and large current circuit device
JP2021170551A (en) * 2017-10-20 2021-10-28 光洋サーモシステム株式会社 Abnormality detection device of large current circuit, and large current circuit device

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