JPS5558468A - Electrical deterioration degree and deterioration location detection method of electric circuit - Google Patents
Electrical deterioration degree and deterioration location detection method of electric circuitInfo
- Publication number
- JPS5558468A JPS5558468A JP13193678A JP13193678A JPS5558468A JP S5558468 A JPS5558468 A JP S5558468A JP 13193678 A JP13193678 A JP 13193678A JP 13193678 A JP13193678 A JP 13193678A JP S5558468 A JPS5558468 A JP S5558468A
- Authority
- JP
- Japan
- Prior art keywords
- value
- electric circuit
- branch passage
- deterioration
- electrical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Locating Faults (AREA)
Abstract
PURPOSE: To beforehand prevent the generation of trouble, by detecting the electrical deterioration degree of each branch passage under deterioration conditions by comparing the display value of the set quantity of electricity of an electric circuit with a plurality of branch passages with the display value of the actual quantity of electricity.
CONSTITUTION: An electric circuit 1 is formed in such a manner that a branch passage lab to which electric heating resistors a1, a2 are connected in parallel, a branch passage 1bc to which electric heating resistors b1, b2 are connected in parallel and a branch passage 1ca to which electric heating resistors c1, c2 are connected in parallel are delta-connected. In the electric circuit 1, the display value of set currents is previously prepared to a generator or a memory storage for comparing it as voltage value or digital value. Actual current value is obtained from current transformers CTa, CTb, CTc, and the value is compared with value beforehand prepared, thus detecting the electrical deterioration degree of each branch passage and passages under deterioration conditions.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13193678A JPS5558468A (en) | 1978-10-26 | 1978-10-26 | Electrical deterioration degree and deterioration location detection method of electric circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13193678A JPS5558468A (en) | 1978-10-26 | 1978-10-26 | Electrical deterioration degree and deterioration location detection method of electric circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5558468A true JPS5558468A (en) | 1980-05-01 |
Family
ID=15069668
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13193678A Pending JPS5558468A (en) | 1978-10-26 | 1978-10-26 | Electrical deterioration degree and deterioration location detection method of electric circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5558468A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004046209A (en) * | 1997-08-21 | 2004-02-12 | Seiko Epson Corp | Display device |
JP2004146388A (en) * | 1997-08-21 | 2004-05-20 | Seiko Epson Corp | Method for forming organic semiconductor film, and method for manufacturing active matrix substrate |
JP2016110732A (en) * | 2014-12-03 | 2016-06-20 | 大同プラント工業株式会社 | Resistance value detection method for three-phase heater |
JP2019079612A (en) * | 2017-10-20 | 2019-05-23 | 光洋サーモシステム株式会社 | Abnormality detection device of large current circuit, and large current circuit device |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4828176A (en) * | 1971-08-16 | 1973-04-13 |
-
1978
- 1978-10-26 JP JP13193678A patent/JPS5558468A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4828176A (en) * | 1971-08-16 | 1973-04-13 |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004046209A (en) * | 1997-08-21 | 2004-02-12 | Seiko Epson Corp | Display device |
JP2004146388A (en) * | 1997-08-21 | 2004-05-20 | Seiko Epson Corp | Method for forming organic semiconductor film, and method for manufacturing active matrix substrate |
JP2016110732A (en) * | 2014-12-03 | 2016-06-20 | 大同プラント工業株式会社 | Resistance value detection method for three-phase heater |
JP2019079612A (en) * | 2017-10-20 | 2019-05-23 | 光洋サーモシステム株式会社 | Abnormality detection device of large current circuit, and large current circuit device |
JP2021170550A (en) * | 2017-10-20 | 2021-10-28 | 光洋サーモシステム株式会社 | Abnormality detection device of large current circuit, and large current circuit device |
JP2021170551A (en) * | 2017-10-20 | 2021-10-28 | 光洋サーモシステム株式会社 | Abnormality detection device of large current circuit, and large current circuit device |
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