JPH01201244A - Ｍｒｉ装置のインピーダンス自動調整装置 - Google Patents

Ｍｒｉ装置のインピーダンス自動調整装置

Info

Publication number
JPH01201244A
JPH01201244A JP8826788A JP2678888A JPH01201244A JP H01201244 A JPH01201244 A JP H01201244A JP 8826788 A JP8826788 A JP 8826788A JP 2678888 A JP2678888 A JP 2678888A JP H01201244 A JPH01201244 A JP H01201244A
Authority
JP
Japan
Prior art keywords
impedance
voltage
probe head
routine
imaginary part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8826788A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0578340B2 (enExample
Inventor
Motoji Haragashira
基司 原頭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP8826788A priority Critical patent/JPH01201244A/ja
Priority to US07/305,935 priority patent/US4890062A/en
Priority to DE3903719A priority patent/DE3903719C2/de
Publication of JPH01201244A publication Critical patent/JPH01201244A/ja
Publication of JPH0578340B2 publication Critical patent/JPH0578340B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
    • H03H7/38—Impedance-matching networks
    • H03H7/40—Automatic matching of load impedance to source impedance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
    • G01R33/36—Electrical details, e.g. matching or coupling of the coil to the receiver
    • G01R33/3628—Tuning/matching of the transmit/receive coil

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP8826788A 1988-02-08 1988-02-08 Ｍｒｉ装置のインピーダンス自動調整装置 Granted JPH01201244A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP8826788A JPH01201244A (ja) 1988-02-08 1988-02-08 Ｍｒｉ装置のインピーダンス自動調整装置
US07/305,935 US4890062A (en) 1988-02-08 1989-02-03 Automatic impedance adjuster for MRI system
DE3903719A DE3903719C2 (de) 1988-02-08 1989-02-08 Verfahren zur Impedanzanpassung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8826788A JPH01201244A (ja) 1988-02-08 1988-02-08 Ｍｒｉ装置のインピーダンス自動調整装置

Publications (2)

Publication Number Publication Date
JPH01201244A true JPH01201244A (ja) 1989-08-14
JPH0578340B2 JPH0578340B2 (enExample) 1993-10-28

Family

ID=12203053

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8826788A Granted JPH01201244A (ja) 1988-02-08 1988-02-08 Ｍｒｉ装置のインピーダンス自動調整装置

Country Status (3)

Country Link
US (1) US4890062A (enExample)
JP (1) JPH01201244A (enExample)
DE (1) DE3903719C2 (enExample)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5433717A (en) * 1993-03-23 1995-07-18 The Regents Of The University Of California Magnetic resonance imaging assisted cryosurgery
US5777475A (en) * 1993-12-21 1998-07-07 Siemens Aktiengesellschaft Automatic impedance adapter for a H.F. emitter or receiver in a nuclear spin tomography installation and process for operating the device
DE4428579C1 (de) * 1994-08-12 1996-02-01 Spectrospin Ag Verfahren und automatische Hilfsvorrichtung zur Abstimmung einer NMR-Empfangsspule
US5793162A (en) * 1995-12-29 1998-08-11 Lam Research Corporation Apparatus for controlling matching network of a vacuum plasma processor and memory for same
US5689215A (en) * 1996-05-23 1997-11-18 Lam Research Corporation Method of and apparatus for controlling reactive impedances of a matching network connected between an RF source and an RF plasma processor
DE19631895A1 (de) * 1996-08-07 1998-02-12 Siemens Ag Verfahren zur Anpassung eines Spulenresonators eines Magnetresonanzgerätes
US6459265B1 (en) * 1998-11-25 2002-10-01 General Electric Company Method and apparatus for reducing input impedance of a preamplifier
US6349216B1 (en) 1999-07-22 2002-02-19 Motorola, Inc. Load envelope following amplifier system
US6166598A (en) * 1999-07-22 2000-12-26 Motorola, Inc. Power amplifying circuit with supply adjust to control adjacent and alternate channel power
US6438360B1 (en) 1999-07-22 2002-08-20 Motorola, Inc. Amplifier system with load control to produce an amplitude envelope
US6160449A (en) * 1999-07-22 2000-12-12 Motorola, Inc. Power amplifying circuit with load adjust for control of adjacent and alternate channel power
US20050185769A1 (en) * 2004-02-25 2005-08-25 Pickerd John J. Calibration method and apparatus
US7782059B2 (en) * 2004-11-23 2010-08-24 M2M Imaging Corp. Bandwidth expansion in magnetic resonance
US20060210022A1 (en) * 2005-01-27 2006-09-21 Kan Tan Apparatus and method for processing acquired signals for arbitrary impedance loads
US7187176B2 (en) * 2005-02-08 2007-03-06 Bruker Biospin Corp. NMR probe circuit with nodal impedance bridge
DE102005005887A1 (de) * 2005-02-09 2006-08-10 Rohde & Schwarz Gmbh & Co. Kg Verfahren und Anordnung zur Korrektur der Rückwirkung elektrischer Messwandler auf das Messobjekt
WO2007090192A2 (en) * 2006-02-01 2007-08-09 Premier Dental Products Company Stable one-part aqueous tooth whitening composition
US20070273389A1 (en) * 2006-05-25 2007-11-29 Kan Tan Apparatus and method for processing a signal under test using a trigger signal synchronous with the signal under test for arbitrary impedance loads
US7460983B2 (en) * 2006-08-23 2008-12-02 Tektronix, Inc. Signal analysis system and calibration method
US7405575B2 (en) * 2006-08-23 2008-07-29 Tektronix, Inc. Signal analysis system and calibration method for measuring the impedance of a device under test
US7408363B2 (en) * 2006-08-23 2008-08-05 Tektronix, Inc. Signal analysis system and calibration method for processing acquires signal samples with an arbitrary load
US7414411B2 (en) * 2006-08-23 2008-08-19 Tektronix, Inc. Signal analysis system and calibration method for multiple signal probes
US20100256481A1 (en) * 2007-09-27 2010-10-07 Mareci Thomas H Method and Apparatus for Providing a Wireless Multiple-Frequency MR Coil
CN111566496B (zh) 2017-11-23 2023-06-02 通泰克股份公司 带压电致动器的nmr探头
US10571538B2 (en) 2018-06-01 2020-02-25 General Electric Company Diagnostic device and method for diagnosing a faulty condition in a gradient amplifier system

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63277049A (ja) * 1987-05-08 1988-11-15 Toshiba Corp Ｍｒｉ装置のインピ−ダンス自動調整装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3919644A (en) * 1970-02-02 1975-11-11 Gen Dynamics Corp Automatic antenna coupler utilizing system for measuring the real part of the complex impedance or admittance presented by an antenna or other network
US4356458A (en) * 1981-08-31 1982-10-26 Harry H. Leveen Automatic impedance matching apparatus
US4493112A (en) * 1981-11-19 1985-01-08 Rockwell International Corporation Antenna tuner discriminator
US4602213A (en) * 1982-12-28 1986-07-22 Tokyo Shibaura Denki Kabushiki Kaisha Automatic tuning circuit for nuclear magnetic resonance apparatus
DE3576408D1 (de) * 1984-12-21 1990-04-12 Philips Patentverwaltung Verfahren zur erzeugung eines bewegungssignals und kernspintomograph fuer ein solches verfahren.
JPS6252443A (ja) * 1985-08-30 1987-03-07 Toshiba Corp Ｍｒ装置のプロ−ブ同調回路
FR2590993B1 (fr) * 1985-11-29 1988-04-29 Thomson Cgr Dispositif et procede de reglage d'une antenne radiofrequence d'un appareil de resonance magnetique nucleaire

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63277049A (ja) * 1987-05-08 1988-11-15 Toshiba Corp Ｍｒｉ装置のインピ−ダンス自動調整装置

Also Published As

Publication number Publication date
JPH0578340B2 (enExample) 1993-10-28
DE3903719A1 (de) 1989-08-17
US4890062A (en) 1989-12-26
DE3903719C2 (de) 1993-10-28

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees