DE3903719C2 - Verfahren zur Impedanzanpassung - Google Patents

Verfahren zur Impedanzanpassung

Info

Publication number
DE3903719C2
DE3903719C2 DE3903719A DE3903719A DE3903719C2 DE 3903719 C2 DE3903719 C2 DE 3903719C2 DE 3903719 A DE3903719 A DE 3903719A DE 3903719 A DE3903719 A DE 3903719A DE 3903719 C2 DE3903719 C2 DE 3903719C2
Authority
DE
Germany
Prior art keywords
impedance
test head
capacitance
variable
capacitors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3903719A
Other languages
German (de)
English (en)
Other versions
DE3903719A1 (de
Inventor
Motoji Haragashira
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of DE3903719A1 publication Critical patent/DE3903719A1/de
Application granted granted Critical
Publication of DE3903719C2 publication Critical patent/DE3903719C2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H7/00Multiple-port networks comprising only passive electrical elements as network components
    • H03H7/38Impedance-matching networks
    • H03H7/40Automatic matching of load impedance to source impedance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/20Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/32Excitation or detection systems, e.g. using radio frequency signals
    • G01R33/36Electrical details, e.g. matching or coupling of the coil to the receiver
    • G01R33/3628Tuning/matching of the transmit/receive coil

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
DE3903719A 1988-02-08 1989-02-08 Verfahren zur Impedanzanpassung Expired - Fee Related DE3903719C2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8826788A JPH01201244A (ja) 1988-02-08 1988-02-08 Mri装置のインピーダンス自動調整装置

Publications (2)

Publication Number Publication Date
DE3903719A1 DE3903719A1 (de) 1989-08-17
DE3903719C2 true DE3903719C2 (de) 1993-10-28

Family

ID=12203053

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3903719A Expired - Fee Related DE3903719C2 (de) 1988-02-08 1989-02-08 Verfahren zur Impedanzanpassung

Country Status (3)

Country Link
US (1) US4890062A (enExample)
JP (1) JPH01201244A (enExample)
DE (1) DE3903719C2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4428579C1 (de) * 1994-08-12 1996-02-01 Spectrospin Ag Verfahren und automatische Hilfsvorrichtung zur Abstimmung einer NMR-Empfangsspule

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5433717A (en) * 1993-03-23 1995-07-18 The Regents Of The University Of California Magnetic resonance imaging assisted cryosurgery
US5777475A (en) * 1993-12-21 1998-07-07 Siemens Aktiengesellschaft Automatic impedance adapter for a H.F. emitter or receiver in a nuclear spin tomography installation and process for operating the device
US5793162A (en) * 1995-12-29 1998-08-11 Lam Research Corporation Apparatus for controlling matching network of a vacuum plasma processor and memory for same
US5689215A (en) * 1996-05-23 1997-11-18 Lam Research Corporation Method of and apparatus for controlling reactive impedances of a matching network connected between an RF source and an RF plasma processor
DE19631895A1 (de) * 1996-08-07 1998-02-12 Siemens Ag Verfahren zur Anpassung eines Spulenresonators eines Magnetresonanzgerätes
US6459265B1 (en) * 1998-11-25 2002-10-01 General Electric Company Method and apparatus for reducing input impedance of a preamplifier
US6349216B1 (en) 1999-07-22 2002-02-19 Motorola, Inc. Load envelope following amplifier system
US6166598A (en) * 1999-07-22 2000-12-26 Motorola, Inc. Power amplifying circuit with supply adjust to control adjacent and alternate channel power
US6438360B1 (en) 1999-07-22 2002-08-20 Motorola, Inc. Amplifier system with load control to produce an amplitude envelope
US6160449A (en) * 1999-07-22 2000-12-12 Motorola, Inc. Power amplifying circuit with load adjust for control of adjacent and alternate channel power
US20050185769A1 (en) * 2004-02-25 2005-08-25 Pickerd John J. Calibration method and apparatus
US7782059B2 (en) * 2004-11-23 2010-08-24 M2M Imaging Corp. Bandwidth expansion in magnetic resonance
US20060210022A1 (en) * 2005-01-27 2006-09-21 Kan Tan Apparatus and method for processing acquired signals for arbitrary impedance loads
US7187176B2 (en) * 2005-02-08 2007-03-06 Bruker Biospin Corp. NMR probe circuit with nodal impedance bridge
DE102005005887A1 (de) * 2005-02-09 2006-08-10 Rohde & Schwarz Gmbh & Co. Kg Verfahren und Anordnung zur Korrektur der Rückwirkung elektrischer Messwandler auf das Messobjekt
WO2007090192A2 (en) * 2006-02-01 2007-08-09 Premier Dental Products Company Stable one-part aqueous tooth whitening composition
US20070273389A1 (en) * 2006-05-25 2007-11-29 Kan Tan Apparatus and method for processing a signal under test using a trigger signal synchronous with the signal under test for arbitrary impedance loads
US7460983B2 (en) * 2006-08-23 2008-12-02 Tektronix, Inc. Signal analysis system and calibration method
US7405575B2 (en) * 2006-08-23 2008-07-29 Tektronix, Inc. Signal analysis system and calibration method for measuring the impedance of a device under test
US7408363B2 (en) * 2006-08-23 2008-08-05 Tektronix, Inc. Signal analysis system and calibration method for processing acquires signal samples with an arbitrary load
US7414411B2 (en) * 2006-08-23 2008-08-19 Tektronix, Inc. Signal analysis system and calibration method for multiple signal probes
US20100256481A1 (en) * 2007-09-27 2010-10-07 Mareci Thomas H Method and Apparatus for Providing a Wireless Multiple-Frequency MR Coil
CN111566496B (zh) 2017-11-23 2023-06-02 通泰克股份公司 带压电致动器的nmr探头
US10571538B2 (en) 2018-06-01 2020-02-25 General Electric Company Diagnostic device and method for diagnosing a faulty condition in a gradient amplifier system

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3919644A (en) * 1970-02-02 1975-11-11 Gen Dynamics Corp Automatic antenna coupler utilizing system for measuring the real part of the complex impedance or admittance presented by an antenna or other network
US4356458A (en) * 1981-08-31 1982-10-26 Harry H. Leveen Automatic impedance matching apparatus
US4493112A (en) * 1981-11-19 1985-01-08 Rockwell International Corporation Antenna tuner discriminator
US4602213A (en) * 1982-12-28 1986-07-22 Tokyo Shibaura Denki Kabushiki Kaisha Automatic tuning circuit for nuclear magnetic resonance apparatus
DE3576408D1 (de) * 1984-12-21 1990-04-12 Philips Patentverwaltung Verfahren zur erzeugung eines bewegungssignals und kernspintomograph fuer ein solches verfahren.
JPS6252443A (ja) * 1985-08-30 1987-03-07 Toshiba Corp Mr装置のプロ−ブ同調回路
FR2590993B1 (fr) * 1985-11-29 1988-04-29 Thomson Cgr Dispositif et procede de reglage d'une antenne radiofrequence d'un appareil de resonance magnetique nucleaire
JPS63277049A (ja) * 1987-05-08 1988-11-15 Toshiba Corp Mri装置のインピ−ダンス自動調整装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4428579C1 (de) * 1994-08-12 1996-02-01 Spectrospin Ag Verfahren und automatische Hilfsvorrichtung zur Abstimmung einer NMR-Empfangsspule

Also Published As

Publication number Publication date
JPH01201244A (ja) 1989-08-14
JPH0578340B2 (enExample) 1993-10-28
DE3903719A1 (de) 1989-08-17
US4890062A (en) 1989-12-26

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8125 Change of the main classification

Ipc: G01R 33/20

D2 Grant after examination
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Free format text: BLUMBACH, KRAMER & PARTNER, 81245 MUENCHEN

8339 Ceased/non-payment of the annual fee