JPH0119545B2 - - Google Patents
Info
- Publication number
- JPH0119545B2 JPH0119545B2 JP57158098A JP15809882A JPH0119545B2 JP H0119545 B2 JPH0119545 B2 JP H0119545B2 JP 57158098 A JP57158098 A JP 57158098A JP 15809882 A JP15809882 A JP 15809882A JP H0119545 B2 JPH0119545 B2 JP H0119545B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- input signal
- period
- output
- counter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Frequencies, Analyzing Spectra (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15809882A JPS5948658A (ja) | 1982-09-13 | 1982-09-13 | エイリアシングエラ−検出回路 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15809882A JPS5948658A (ja) | 1982-09-13 | 1982-09-13 | エイリアシングエラ−検出回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5948658A JPS5948658A (ja) | 1984-03-19 |
| JPH0119545B2 true JPH0119545B2 (enEXAMPLES) | 1989-04-12 |
Family
ID=15664255
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15809882A Granted JPS5948658A (ja) | 1982-09-13 | 1982-09-13 | エイリアシングエラ−検出回路 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5948658A (enEXAMPLES) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4621217A (en) * | 1984-09-21 | 1986-11-04 | Tektronix, Inc. | Anti-aliasing filter circuit for oscilloscopes |
| US4656598A (en) * | 1984-11-06 | 1987-04-07 | Hewlett Packard Company | Alias detector for digital oscilloscopes |
| JP2732419B2 (ja) * | 1991-11-19 | 1998-03-30 | 松下電器産業株式会社 | エイリアシング検出方法とその装置 |
| JP2023034920A (ja) * | 2021-08-31 | 2023-03-13 | キヤノン株式会社 | 撮像装置、フリッカー検出方法およびプログラム |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4979284A (enEXAMPLES) * | 1972-12-04 | 1974-07-31 |
-
1982
- 1982-09-13 JP JP15809882A patent/JPS5948658A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5948658A (ja) | 1984-03-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US3843893A (en) | Logical synchronization of test instruments | |
| US6950375B2 (en) | Multi-phase clock time stamping | |
| JPH0119545B2 (enEXAMPLES) | ||
| US6807117B2 (en) | Semiconductor device having PLL-circuit | |
| JPH0210915A (ja) | パルス状信号の極性統一回路 | |
| RU2777306C1 (ru) | Устройство обработки аналоговых сигналов с применением цифровой фильтрации | |
| Thomas Jr | Expanded interleaved solid-state memory for a wide bandwidth transient waveform recorder | |
| JPS6233394Y2 (enEXAMPLES) | ||
| JP2908080B2 (ja) | 可変分周回路 | |
| JP2556038B2 (ja) | 混成集積回路 | |
| JPS6329226B2 (enEXAMPLES) | ||
| SU1742812A1 (ru) | Указатель экстремума | |
| Varasano et al. | New developments in neutron counting chains for safeguards | |
| JP3965473B2 (ja) | クロック周波数比較回路 | |
| KR940002522B1 (ko) | 디지탈 분주 확인 회로 | |
| JPH0222567A (ja) | デューティ検出回路 | |
| RU1798901C (ru) | Однотактный умножитель частоты | |
| SU1734034A1 (ru) | Устройство дл измерени частоты | |
| CN119961106A (zh) | 时序检测电路、芯片、电子设备和时序检测方法 | |
| KR950010490Y1 (ko) | 지연주파수 검사회로 | |
| JPH0524227Y2 (enEXAMPLES) | ||
| JP2734861B2 (ja) | Dtmf回路 | |
| JPH07111440A (ja) | マルチバイブレータ回路および任意クロック生成回路 | |
| JPH05196648A (ja) | ロジックアナライザ | |
| JPS6249936B2 (enEXAMPLES) |