JPH0110616Y2 - - Google Patents
Info
- Publication number
- JPH0110616Y2 JPH0110616Y2 JP10098980U JP10098980U JPH0110616Y2 JP H0110616 Y2 JPH0110616 Y2 JP H0110616Y2 JP 10098980 U JP10098980 U JP 10098980U JP 10098980 U JP10098980 U JP 10098980U JP H0110616 Y2 JPH0110616 Y2 JP H0110616Y2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- high voltage
- output
- transformer
- comparator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 28
- 230000000087 stabilizing effect Effects 0.000 claims 2
- 230000007547 defect Effects 0.000 claims 1
- 238000001514 detection method Methods 0.000 description 11
- 238000010586 diagram Methods 0.000 description 11
- 238000000034 method Methods 0.000 description 9
- 238000005259 measurement Methods 0.000 description 5
- 238000010248 power generation Methods 0.000 description 5
- 239000003381 stabilizer Substances 0.000 description 5
- 229910052754 neon Inorganic materials 0.000 description 4
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 4
- 230000001681 protective effect Effects 0.000 description 3
- 230000006378 damage Effects 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 244000145845 chattering Species 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Landscapes
- Testing Relating To Insulation (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10098980U JPH0110616Y2 (de) | 1980-07-17 | 1980-07-17 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10098980U JPH0110616Y2 (de) | 1980-07-17 | 1980-07-17 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5724563U JPS5724563U (de) | 1982-02-08 |
JPH0110616Y2 true JPH0110616Y2 (de) | 1989-03-27 |
Family
ID=29462517
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10098980U Expired JPH0110616Y2 (de) | 1980-07-17 | 1980-07-17 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0110616Y2 (de) |
-
1980
- 1980-07-17 JP JP10098980U patent/JPH0110616Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS5724563U (de) | 1982-02-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN101363895B (zh) | 检测直流回路故障的方法及系统 | |
EP1465313B1 (de) | Verfahren und Gerät zum Erkennen eines elektrischen Kurzschlusses und einer offenen Last | |
US6356086B1 (en) | Method and apparatus for the in-circuit testing of a capacitor | |
US10139454B2 (en) | Test device and alternating current power detection method of the same | |
JP2610640B2 (ja) | 自動車の少なくとも2つの電気的負荷を検査する装置 | |
JPH0110616Y2 (de) | ||
US10944259B2 (en) | System and method for over voltage protection in both positive and negative polarities | |
JP4259692B2 (ja) | 回路基板検査装置 | |
JP3964654B2 (ja) | 電気回路診断装置 | |
JPH0245826Y2 (de) | ||
JP2730504B2 (ja) | 試験用プローブピンの接触不良判断方法およびインサーキットテスタ | |
US20170205449A1 (en) | Test device and alternating current power detection method of the same | |
KR100352598B1 (ko) | 디지털멀티메터입력자동제어장치 | |
Sato et al. | Degradation-Diagnosis Technology for Surge Protection Device for power line. | |
KR200210620Y1 (ko) | 피뢰기 시험장치 | |
JPH1130641A (ja) | Ic試験装置 | |
JPH09243693A (ja) | コンデンサのリーク電流の測定方法およびその装置 | |
JPH0245825Y2 (de) | ||
JP2006226917A (ja) | 耐圧試験器および断線検出器 | |
JPH08170975A (ja) | 電機機器の部分放電検出回路 | |
JP2002131368A (ja) | Cmos−lsi試験方法及び装置 | |
JP2561076Y2 (ja) | 抵抗測定装置 | |
JPH11295385A (ja) | 電子回路素子の接触確認装置 | |
JPH0743411B2 (ja) | 集積回路の試験装置 | |
JPH04109177A (ja) | 半導体回路の電源短絡検査方法 |