JP7807439B2 - 製造ラインの異常予兆検知装置、方法及びプログラム並びに製造装置及び検品装置 - Google Patents

製造ラインの異常予兆検知装置、方法及びプログラム並びに製造装置及び検品装置

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Publication number
JP7807439B2
JP7807439B2 JP2023516351A JP2023516351A JP7807439B2 JP 7807439 B2 JP7807439 B2 JP 7807439B2 JP 2023516351 A JP2023516351 A JP 2023516351A JP 2023516351 A JP2023516351 A JP 2023516351A JP 7807439 B2 JP7807439 B2 JP 7807439B2
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defect
singularity
product
evaluation value
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Japanese (ja)
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JPWO2022224657A1 (https=
JPWO2022224657A5 (https=
Inventor
遼 池田
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Fujifilm Corp
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Fujifilm Corp
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/4184—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by fault tolerance, reliability of production system
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/10—Plc systems
    • G05B2219/11—Plc I-O input output

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Automation & Control Theory (AREA)
  • General Factory Administration (AREA)
  • Image Processing (AREA)
JP2023516351A 2021-04-19 2022-03-18 製造ラインの異常予兆検知装置、方法及びプログラム並びに製造装置及び検品装置 Active JP7807439B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021070135 2021-04-19
JP2021070135 2021-04-19
PCT/JP2022/012546 WO2022224657A1 (ja) 2021-04-19 2022-03-18 製造ラインの異常予兆検知装置、方法及びプログラム並びに製造装置及び検品装置

Publications (3)

Publication Number Publication Date
JPWO2022224657A1 JPWO2022224657A1 (https=) 2022-10-27
JPWO2022224657A5 JPWO2022224657A5 (https=) 2024-01-29
JP7807439B2 true JP7807439B2 (ja) 2026-01-27

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JP2023516351A Active JP7807439B2 (ja) 2021-04-19 2022-03-18 製造ラインの異常予兆検知装置、方法及びプログラム並びに製造装置及び検品装置

Country Status (5)

Country Link
US (1) US20240045407A1 (https=)
EP (1) EP4328691A4 (https=)
JP (1) JP7807439B2 (https=)
CN (1) CN117120951A (https=)
WO (1) WO2022224657A1 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7734604B2 (ja) * 2022-02-04 2025-09-05 三菱電機株式会社 外観検査支援装置、外観検査支援方法、及び外観検査支援プログラム
JP2024029776A (ja) * 2023-09-29 2024-03-06 日本製鉄株式会社 遠隔作業制御システム、遠隔作業制御方法及びコンピュータープログラム
CN117151554A (zh) * 2023-11-01 2023-12-01 豆黄金食品有限公司 一种用于腐竹输送线的智能控制系统
CN118096733B (zh) * 2024-04-22 2024-07-26 浙江宋氏实业有限公司 一种基于图像分析的包装纸箱质量评估方法及系统
CN119090832B (zh) * 2024-08-22 2025-05-13 深圳市科鸿展塑胶模具有限公司 基于图像处理的塑胶制品缺陷检测方法及系统
CN119044205B (zh) * 2024-08-23 2025-04-08 浙江威尔鹰新材料线缆有限公司 一种隔离型矿物绝缘柔性电缆检测方法及系统
CN119359329A (zh) * 2024-12-25 2025-01-24 诸暨市亿格袜业有限公司 一种基于大数据的袜品生产溯源系统及方法
CN120125535B (zh) * 2025-02-21 2025-09-19 扬州市管件厂有限公司 Lng船用管件的焊接质量检测方法及平台
CN120276338A (zh) * 2025-04-11 2025-07-08 深圳市民信食品有限公司 一种适配于豆腐加工产线的环境控制系统
CN120912598B (zh) * 2025-10-09 2025-12-12 浙江高强度紧固件有限公司 一种紧固件产品质量追溯方法及系统

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007294361A (ja) 2006-04-27 2007-11-08 Sekisui Chem Co Ltd 導電ペースト
JP2012242982A (ja) 2011-05-18 2012-12-10 Mitsubishi Electric Corp プラントの機器維持管理システム
JP2015197396A (ja) 2014-04-02 2015-11-09 三菱電機株式会社 画像検査方法および画像検査装置

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3812185B2 (ja) * 1998-12-01 2006-08-23 株式会社日立製作所 欠陥分類方法およびその装置
JP2001331784A (ja) * 2000-05-18 2001-11-30 Hitachi Ltd 欠陥分類方法及びその装置
JP2008015930A (ja) 2006-07-07 2008-01-24 Nsk Ltd 製造ラインの生産管理方法および生産管理システム
JP2008145226A (ja) * 2006-12-08 2008-06-26 Olympus Corp 欠陥検査装置及び欠陥検査方法
JP5103058B2 (ja) * 2007-05-28 2012-12-19 株式会社日立ハイテクノロジーズ 欠陥観察装置及び欠陥観察方法
JP5594886B2 (ja) * 2010-10-19 2014-09-24 富士機械製造株式会社 部品実装ラインの管理装置
JP5779906B2 (ja) * 2011-02-25 2015-09-16 オムロン株式会社 検査システム、管理サーバ、検査装置および検査データ管理方法
JP6264072B2 (ja) * 2014-02-10 2018-01-24 オムロン株式会社 品質管理装置及びその制御方法
JP6265253B1 (ja) * 2016-12-15 2018-01-24 オムロン株式会社 検査装置および検査方法
JP6988499B2 (ja) * 2018-01-16 2022-01-05 オムロン株式会社 検査管理システム、検査管理装置、検査管理方法
JP6977686B2 (ja) * 2018-08-06 2021-12-08 オムロン株式会社 制御システムおよび制御装置
JP6847898B2 (ja) * 2018-08-10 2021-03-24 東京エレクトロンデバイス株式会社 予防保全装置及び予防保全システム
JP6680430B1 (ja) * 2018-10-04 2020-04-15 山本　隆義 生産ラインにおける品質と設備の統合的監視方法
JP2020106469A (ja) * 2018-12-28 2020-07-09 オムロン株式会社 画像処理装置、画像処理方法、及び画像処理プログラム
CN112579640B (zh) * 2019-09-29 2024-09-20 京东方科技集团股份有限公司 用于生产异常检测的方法和设备
JP7396886B2 (ja) * 2019-12-13 2023-12-12 ファナック株式会社 監視装置及びプログラム

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007294361A (ja) 2006-04-27 2007-11-08 Sekisui Chem Co Ltd 導電ペースト
JP2012242982A (ja) 2011-05-18 2012-12-10 Mitsubishi Electric Corp プラントの機器維持管理システム
JP2015197396A (ja) 2014-04-02 2015-11-09 三菱電機株式会社 画像検査方法および画像検査装置

Also Published As

Publication number Publication date
US20240045407A1 (en) 2024-02-08
EP4328691A1 (en) 2024-02-28
CN117120951A (zh) 2023-11-24
WO2022224657A1 (ja) 2022-10-27
JPWO2022224657A1 (https=) 2022-10-27
EP4328691A4 (en) 2024-10-16

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