JP7740548B2 - 接合型発光素子ウェーハの製造方法およびマイクロledの移載方法 - Google Patents

接合型発光素子ウェーハの製造方法およびマイクロledの移載方法

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Publication number
JP7740548B2
JP7740548B2 JP2024528371A JP2024528371A JP7740548B2 JP 7740548 B2 JP7740548 B2 JP 7740548B2 JP 2024528371 A JP2024528371 A JP 2024528371A JP 2024528371 A JP2024528371 A JP 2024528371A JP 7740548 B2 JP7740548 B2 JP 7740548B2
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Japan
Prior art keywords
light
emitting element
bonded
wafer
map data
Prior art date
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JP2024528371A
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English (en)
Japanese (ja)
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JPWO2023243255A5 (https=
JPWO2023243255A1 (https=
Inventor
順也 石崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Handotai Co Ltd
Original Assignee
Shin Etsu Handotai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by Shin Etsu Handotai Co Ltd filed Critical Shin Etsu Handotai Co Ltd
Publication of JPWO2023243255A1 publication Critical patent/JPWO2023243255A1/ja
Publication of JPWO2023243255A5 publication Critical patent/JPWO2023243255A5/ja
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Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • H10H20/011Manufacture or treatment of bodies, e.g. forming semiconductor layers
    • H10H20/018Bonding of wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • H10P74/23Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H29/00Integrated devices, or assemblies of multiple devices, comprising at least one light-emitting semiconductor element covered by group H10H20/00
    • H10H29/01Manufacture or treatment
    • H10H29/03Manufacture or treatment using mass transfer of LEDs, e.g. by using liquid suspensions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • H10P95/11Separation of active layers from substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • H10H20/011Manufacture or treatment of bodies, e.g. forming semiconductor layers
    • H10H20/019Removal of at least a part of a substrate on which semiconductor layers have been formed
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • H10H20/021Singulating, e.g. dicing
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/81Bodies
    • H10H20/822Materials of the light-emitting regions
    • H10H20/824Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP

Landscapes

  • Led Devices (AREA)
JP2024528371A 2022-06-15 2023-05-08 接合型発光素子ウェーハの製造方法およびマイクロledの移載方法 Active JP7740548B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2022096574 2022-06-15
JP2022096574 2022-06-15
PCT/JP2023/017250 WO2023243255A1 (ja) 2022-06-15 2023-05-08 接合型発光素子ウェーハの製造方法およびマイクロledの移載方法

Publications (3)

Publication Number Publication Date
JPWO2023243255A1 JPWO2023243255A1 (https=) 2023-12-21
JPWO2023243255A5 JPWO2023243255A5 (https=) 2025-02-04
JP7740548B2 true JP7740548B2 (ja) 2025-09-17

Family

ID=89191002

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024528371A Active JP7740548B2 (ja) 2022-06-15 2023-05-08 接合型発光素子ウェーハの製造方法およびマイクロledの移載方法

Country Status (6)

Country Link
US (1) US20250316541A1 (https=)
EP (1) EP4542632A1 (https=)
JP (1) JP7740548B2 (https=)
CN (1) CN119325643A (https=)
TW (1) TW202414510A (https=)
WO (1) WO2023243255A1 (https=)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008527719A (ja) 2005-01-11 2008-07-24 セミエルイーディーズ コーポレーション 発光ダイオードアレイを製造するためのシステム及び方法
JP2016502265A (ja) 2012-11-12 2016-01-21 晶元光▲電▼股▲ふん▼有限公司 半導体発光素子及びその製造方法
JP2021158159A (ja) 2020-03-25 2021-10-07 信越半導体株式会社 接合ウェーハの製造方法及び接合ウェーハ

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH118438A (ja) * 1997-06-16 1999-01-12 Furukawa Electric Co Ltd:The 半導体レーザ装置の製造方法
JP2004119243A (ja) 2002-09-27 2004-04-15 Dainippon Printing Co Ltd 有機エレクトロルミネッセント素子の欠陥除去方法
JP5169509B2 (ja) 2007-06-12 2013-03-27 信越半導体株式会社 欠陥検出方法及び欠陥検出システム並びに発光素子の製造方法
WO2010092749A1 (ja) 2009-02-10 2010-08-19 パナソニック株式会社 有機elディスプレイおよびその製造方法
JP6918537B2 (ja) 2017-03-24 2021-08-11 東レエンジニアリング株式会社 ピックアップ方法、ピックアップ装置、及び実装装置
KR102167268B1 (ko) 2019-02-11 2020-10-19 (주)에스티아이 불량 led 제거 장치
JP7253994B2 (ja) 2019-07-23 2023-04-07 株式会社ディスコ 光デバイスの移設方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008527719A (ja) 2005-01-11 2008-07-24 セミエルイーディーズ コーポレーション 発光ダイオードアレイを製造するためのシステム及び方法
JP2016502265A (ja) 2012-11-12 2016-01-21 晶元光▲電▼股▲ふん▼有限公司 半導体発光素子及びその製造方法
JP2021158159A (ja) 2020-03-25 2021-10-07 信越半導体株式会社 接合ウェーハの製造方法及び接合ウェーハ

Also Published As

Publication number Publication date
US20250316541A1 (en) 2025-10-09
CN119325643A (zh) 2025-01-17
JPWO2023243255A1 (https=) 2023-12-21
EP4542632A1 (en) 2025-04-23
WO2023243255A1 (ja) 2023-12-21
TW202414510A (zh) 2024-04-01

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