JP7722473B2 - 劣化推定システム、劣化推定方法、及び、プログラム - Google Patents

劣化推定システム、劣化推定方法、及び、プログラム

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Publication number
JP7722473B2
JP7722473B2 JP2023573751A JP2023573751A JP7722473B2 JP 7722473 B2 JP7722473 B2 JP 7722473B2 JP 2023573751 A JP2023573751 A JP 2023573751A JP 2023573751 A JP2023573751 A JP 2023573751A JP 7722473 B2 JP7722473 B2 JP 7722473B2
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JP
Japan
Prior art keywords
road surface
deterioration
area
surface image
degree
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JP2023573751A
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English (en)
Japanese (ja)
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JPWO2023135749A1 (https=
JPWO2023135749A5 (ja
Inventor
優介 水越
千里 菅原
俊倫 横手
洋介 木村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
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NEC Corp
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Publication of JPWO2023135749A1 publication Critical patent/JPWO2023135749A1/ja
Publication of JPWO2023135749A5 publication Critical patent/JPWO2023135749A5/ja
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Publication of JP7722473B2 publication Critical patent/JP7722473B2/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
    • G—PHYSICS
    • G08—SIGNALLING
    • G08G—TRAFFIC CONTROL SYSTEMS
    • G08G1/00—Traffic control systems for road vehicles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/889—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a bare video image, i.e. without visual measurement aids

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Traffic Control Systems (AREA)
JP2023573751A 2022-01-14 2022-01-14 劣化推定システム、劣化推定方法、及び、プログラム Active JP7722473B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2022/001143 WO2023135749A1 (ja) 2022-01-14 2022-01-14 劣化推定システム、劣化推定方法、及び、記録媒体

Publications (3)

Publication Number Publication Date
JPWO2023135749A1 JPWO2023135749A1 (https=) 2023-07-20
JPWO2023135749A5 JPWO2023135749A5 (ja) 2024-09-17
JP7722473B2 true JP7722473B2 (ja) 2025-08-13

Family

ID=87278604

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JP2023573751A Active JP7722473B2 (ja) 2022-01-14 2022-01-14 劣化推定システム、劣化推定方法、及び、プログラム

Country Status (3)

Country Link
US (1) US20250067681A1 (https=)
JP (1) JP7722473B2 (https=)
WO (1) WO2023135749A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025032633A1 (ja) * 2023-08-04 2025-02-13 日本電気株式会社 情報処理装置、情報処理方法、プログラム

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013140448A (ja) 2011-12-28 2013-07-18 Fujitsu Ltd 路面調査プログラム及び路面調査装置
JP2019114495A (ja) 2017-12-26 2019-07-11 岩崎電気株式会社 道路灯照明器具
JP2019185443A (ja) 2018-04-11 2019-10-24 株式会社村田製作所 道路管理システム、道路管理方法、及び道路管理プログラム
JP2021060656A (ja) 2019-10-03 2021-04-15 エヌ・ティ・ティ・コムウェア株式会社 道路損傷判定装置、道路損傷判定方法及び道路損傷判定プログラム
WO2021193148A1 (ja) 2020-03-27 2021-09-30 日本電気株式会社 道路劣化診断装置、道路劣化診断システム、道路劣化診断方法、及び、記録媒体
JP2021162868A (ja) 2020-03-31 2021-10-11 日本電気株式会社 劣化表示システム、劣化表示方法、及び、プログラム

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013140448A (ja) 2011-12-28 2013-07-18 Fujitsu Ltd 路面調査プログラム及び路面調査装置
JP2019114495A (ja) 2017-12-26 2019-07-11 岩崎電気株式会社 道路灯照明器具
JP2019185443A (ja) 2018-04-11 2019-10-24 株式会社村田製作所 道路管理システム、道路管理方法、及び道路管理プログラム
JP2021060656A (ja) 2019-10-03 2021-04-15 エヌ・ティ・ティ・コムウェア株式会社 道路損傷判定装置、道路損傷判定方法及び道路損傷判定プログラム
WO2021193148A1 (ja) 2020-03-27 2021-09-30 日本電気株式会社 道路劣化診断装置、道路劣化診断システム、道路劣化診断方法、及び、記録媒体
JP2021162868A (ja) 2020-03-31 2021-10-11 日本電気株式会社 劣化表示システム、劣化表示方法、及び、プログラム

Also Published As

Publication number Publication date
WO2023135749A1 (ja) 2023-07-20
JPWO2023135749A1 (https=) 2023-07-20
US20250067681A1 (en) 2025-02-27

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