JPWO2023135749A1 - - Google Patents

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Publication number
JPWO2023135749A1
JPWO2023135749A1 JP2023573751A JP2023573751A JPWO2023135749A1 JP WO2023135749 A1 JPWO2023135749 A1 JP WO2023135749A1 JP 2023573751 A JP2023573751 A JP 2023573751A JP 2023573751 A JP2023573751 A JP 2023573751A JP WO2023135749 A1 JPWO2023135749 A1 JP WO2023135749A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2023573751A
Other languages
Japanese (ja)
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JP7722473B2 (ja
JPWO2023135749A5 (ja
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Publication of JPWO2023135749A1 publication Critical patent/JPWO2023135749A1/ja
Publication of JPWO2023135749A5 publication Critical patent/JPWO2023135749A5/ja
Application granted granted Critical
Publication of JP7722473B2 publication Critical patent/JP7722473B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95607Inspecting patterns on the surface of objects using a comparative method
    • GPHYSICS
    • G08SIGNALLING
    • G08GTRAFFIC CONTROL SYSTEMS
    • G08G1/00Traffic control systems for road vehicles
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/889Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a bare video image, i.e. without visual measurement aids

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Traffic Control Systems (AREA)
JP2023573751A 2022-01-14 2022-01-14 劣化推定システム、劣化推定方法、及び、プログラム Active JP7722473B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2022/001143 WO2023135749A1 (ja) 2022-01-14 2022-01-14 劣化推定システム、劣化推定方法、及び、記録媒体

Publications (3)

Publication Number Publication Date
JPWO2023135749A1 true JPWO2023135749A1 (https=) 2023-07-20
JPWO2023135749A5 JPWO2023135749A5 (ja) 2024-09-17
JP7722473B2 JP7722473B2 (ja) 2025-08-13

Family

ID=87278604

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023573751A Active JP7722473B2 (ja) 2022-01-14 2022-01-14 劣化推定システム、劣化推定方法、及び、プログラム

Country Status (3)

Country Link
US (1) US20250067681A1 (https=)
JP (1) JP7722473B2 (https=)
WO (1) WO2023135749A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025032633A1 (ja) * 2023-08-04 2025-02-13 日本電気株式会社 情報処理装置、情報処理方法、プログラム

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013140448A (ja) * 2011-12-28 2013-07-18 Fujitsu Ltd 路面調査プログラム及び路面調査装置
JP2019114495A (ja) * 2017-12-26 2019-07-11 岩崎電気株式会社 道路灯照明器具
JP2019185443A (ja) * 2018-04-11 2019-10-24 株式会社村田製作所 道路管理システム、道路管理方法、及び道路管理プログラム
JP2021060656A (ja) * 2019-10-03 2021-04-15 エヌ・ティ・ティ・コムウェア株式会社 道路損傷判定装置、道路損傷判定方法及び道路損傷判定プログラム
WO2021193148A1 (ja) * 2020-03-27 2021-09-30 日本電気株式会社 道路劣化診断装置、道路劣化診断システム、道路劣化診断方法、及び、記録媒体
JP2021162868A (ja) * 2020-03-31 2021-10-11 日本電気株式会社 劣化表示システム、劣化表示方法、及び、プログラム

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013140448A (ja) * 2011-12-28 2013-07-18 Fujitsu Ltd 路面調査プログラム及び路面調査装置
JP2019114495A (ja) * 2017-12-26 2019-07-11 岩崎電気株式会社 道路灯照明器具
JP2019185443A (ja) * 2018-04-11 2019-10-24 株式会社村田製作所 道路管理システム、道路管理方法、及び道路管理プログラム
JP2021060656A (ja) * 2019-10-03 2021-04-15 エヌ・ティ・ティ・コムウェア株式会社 道路損傷判定装置、道路損傷判定方法及び道路損傷判定プログラム
WO2021193148A1 (ja) * 2020-03-27 2021-09-30 日本電気株式会社 道路劣化診断装置、道路劣化診断システム、道路劣化診断方法、及び、記録媒体
JP2021162868A (ja) * 2020-03-31 2021-10-11 日本電気株式会社 劣化表示システム、劣化表示方法、及び、プログラム

Also Published As

Publication number Publication date
WO2023135749A1 (ja) 2023-07-20
JP7722473B2 (ja) 2025-08-13
US20250067681A1 (en) 2025-02-27

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