JP7604860B2 - 調整方法、計測方法、投写システム、情報処理装置、及びプログラム - Google Patents

調整方法、計測方法、投写システム、情報処理装置、及びプログラム Download PDF

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JP7604860B2
JP7604860B2 JP2020201006A JP2020201006A JP7604860B2 JP 7604860 B2 JP7604860 B2 JP 7604860B2 JP 2020201006 A JP2020201006 A JP 2020201006A JP 2020201006 A JP2020201006 A JP 2020201006A JP 7604860 B2 JP7604860 B2 JP 7604860B2
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JP2022088887A (ja
JP2022088887A5 (https=
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泰介 山内
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Seiko Epson Corp
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Seiko Epson Corp
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Priority to JP2020201006A priority Critical patent/JP7604860B2/ja
Priority to CN202111462972.9A priority patent/CN114615483B/zh
Priority to US17/540,855 priority patent/US11898838B2/en
Publication of JP2022088887A publication Critical patent/JP2022088887A/ja
Publication of JP2022088887A5 publication Critical patent/JP2022088887A5/ja
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/10—Processing, recording or transmission of stereoscopic or multi-view image signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/90—Dynamic range modification of images or parts thereof
    • G06T5/94—Dynamic range modification of images or parts thereof based on local image properties, e.g. for local contrast enhancement
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20—Image signal generators
    • H04N13/204—Image signal generators using stereoscopic image cameras
    • H04N13/25—Image signal generators using stereoscopic image cameras using two or more image sensors with different characteristics other than in their location or field of view, e.g. having different resolutions or colour pickup characteristics; using image signals from one sensor to control the characteristics of another sensor
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/30—Image reproducers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10141—Special mode during image acquisition
    • G06T2207/10152—Varying illumination

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Projection Apparatus (AREA)
  • Image Processing (AREA)
  • Transforming Electric Information Into Light Information (AREA)
JP2020201006A 2020-12-03 2020-12-03 調整方法、計測方法、投写システム、情報処理装置、及びプログラム Active JP7604860B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2020201006A JP7604860B2 (ja) 2020-12-03 2020-12-03 調整方法、計測方法、投写システム、情報処理装置、及びプログラム
CN202111462972.9A CN114615483B (zh) 2020-12-03 2021-12-02 调整方法、测量方法、投射系统、信息处理装置和记录介质
US17/540,855 US11898838B2 (en) 2020-12-03 2021-12-02 Adjustment method and measurement method

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JP2020201006A JP7604860B2 (ja) 2020-12-03 2020-12-03 調整方法、計測方法、投写システム、情報処理装置、及びプログラム

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JP2022088887A JP2022088887A (ja) 2022-06-15
JP2022088887A5 JP2022088887A5 (https=) 2023-10-24
JP7604860B2 true JP7604860B2 (ja) 2024-12-24

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Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2024056522A (ja) * 2022-10-11 2024-04-23 セイコーエプソン株式会社 表示画像の調整方法、表示システム、及び情報処理用プログラム
CN115839677B (zh) * 2022-10-27 2026-03-03 河北工业大学 高动态范围物体表面三维形貌测量方法及系统
CN116824069B (zh) * 2023-08-31 2023-11-10 四川省产品质量监督检验检测院 利用高频信号检测饱和点的自适应条纹方法

Citations (4)

* Cited by examiner, † Cited by third party
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JP2009253636A (ja) 2008-04-04 2009-10-29 Sony Corp 画像処理装置と画像処理方法および撮像装置
CN104168467A (zh) 2014-09-02 2014-11-26 四川大学 运用时间序列结构光技术实现投影显示几何校正的方法
JP2015087243A (ja) 2013-10-30 2015-05-07 キヤノン株式会社 画像処理装置、画像処理方法、
JP2018017653A (ja) 2016-07-29 2018-02-01 セイコーエプソン株式会社 三次元計測装置、ロボット、ロボット制御装置、及びロボットシステム

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US20040070565A1 (en) * 2001-12-05 2004-04-15 Nayar Shree K Method and apparatus for displaying images
JP4335024B2 (ja) 2004-01-27 2009-09-30 オリンパス株式会社 ３次元形状測定方法及びその装置
JP5032943B2 (ja) * 2007-11-06 2012-09-26 パナソニック株式会社 ３次元形状計測装置及び３次元形状計測方法
JP4629136B2 (ja) 2008-10-15 2011-02-09 富士フイルム株式会社 測距装置および測距方法並びにプログラム
WO2010129361A2 (en) * 2009-04-28 2010-11-11 The Regents Of The University Of California Color seamlessness across tiled multi-projector displays
JP6238521B2 (ja) 2012-12-19 2017-11-29 キヤノン株式会社 ３次元計測装置およびその制御方法
CN104036475A (zh) * 2013-07-22 2014-09-10 成都智慧星球科技有限公司 适应于任意投影机群及投影屏幕的高鲁棒性几何校正方法
JP2018105671A (ja) 2016-12-26 2018-07-05 セイコーエプソン株式会社 画像処理装置及び画像処理方法
CN110168562B (zh) * 2017-03-09 2023-06-09 Oppo广东移动通信有限公司 基于深度的控制方法、基于深度的控制装置和电子装置
CN108088654A (zh) * 2017-12-07 2018-05-29 东莞职业技术学院 投影仪投影质量检测方法及其电子设备
GB2569656B (en) * 2017-12-22 2020-07-22 Zivid Labs As Method and system for generating a three-dimensional image of an object
US12030243B2 (en) * 2020-03-19 2024-07-09 Ricoh Company, Ltd. Measuring apparatus, movable apparatus, robot, electronic device, fabricating apparatus, and measuring method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009253636A (ja) 2008-04-04 2009-10-29 Sony Corp 画像処理装置と画像処理方法および撮像装置
JP2015087243A (ja) 2013-10-30 2015-05-07 キヤノン株式会社 画像処理装置、画像処理方法、
CN104168467A (zh) 2014-09-02 2014-11-26 四川大学 运用时间序列结构光技术实现投影显示几何校正的方法
JP2018017653A (ja) 2016-07-29 2018-02-01 セイコーエプソン株式会社 三次元計測装置、ロボット、ロボット制御装置、及びロボットシステム

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CN114615483B (zh) 2023-08-01
JP2022088887A (ja) 2022-06-15
US20220182519A1 (en) 2022-06-09
CN114615483A (zh) 2022-06-10
US11898838B2 (en) 2024-02-13

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