CN114615483B - 调整方法、测量方法、投射系统、信息处理装置和记录介质 - Google Patents

调整方法、测量方法、投射系统、信息处理装置和记录介质 Download PDF

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Publication number
CN114615483B
CN114615483B CN202111462972.9A CN202111462972A CN114615483B CN 114615483 B CN114615483 B CN 114615483B CN 202111462972 A CN202111462972 A CN 202111462972A CN 114615483 B CN114615483 B CN 114615483B
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image
region
luminance
projected
projector
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CN114615483A (zh
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山内泰介
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Seiko Epson Corp
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Seiko Epson Corp
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/10—Processing, recording or transmission of stereoscopic or multi-view image signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/90—Dynamic range modification of images or parts thereof
    • G06T5/94—Dynamic range modification of images or parts thereof based on local image properties, e.g. for local contrast enhancement
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20—Image signal generators
    • H04N13/204—Image signal generators using stereoscopic image cameras
    • H04N13/25—Image signal generators using stereoscopic image cameras using two or more image sensors with different characteristics other than in their location or field of view, e.g. having different resolutions or colour pickup characteristics; using image signals from one sensor to control the characteristics of another sensor
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/30—Image reproducers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10141—Special mode during image acquisition
    • G06T2207/10152—Varying illumination

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Projection Apparatus (AREA)
  • Image Processing (AREA)
  • Transforming Electric Information Into Light Information (AREA)
CN202111462972.9A 2020-12-03 2021-12-02 调整方法、测量方法、投射系统、信息处理装置和记录介质 Active CN114615483B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020201006A JP7604860B2 (ja) 2020-12-03 2020-12-03 調整方法、計測方法、投写システム、情報処理装置、及びプログラム
JP2020-201006 2020-12-03

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CN114615483A CN114615483A (zh) 2022-06-10
CN114615483B true CN114615483B (zh) 2023-08-01

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CN (1) CN114615483B (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2024056522A (ja) * 2022-10-11 2024-04-23 セイコーエプソン株式会社 表示画像の調整方法、表示システム、及び情報処理用プログラム
CN115839677B (zh) * 2022-10-27 2026-03-03 河北工业大学 高动态范围物体表面三维形貌测量方法及系统
CN116824069B (zh) * 2023-08-31 2023-11-10 四川省产品质量监督检验检测院 利用高频信号检测饱和点的自适应条纹方法

Citations (4)

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JP2009115612A (ja) * 2007-11-06 2009-05-28 Panasonic Electric Works Co Ltd ３次元形状計測装置及び３次元形状計測方法
CN104036475A (zh) * 2013-07-22 2014-09-10 成都智慧星球科技有限公司 适应于任意投影机群及投影屏幕的高鲁棒性几何校正方法
JP2015087243A (ja) * 2013-10-30 2015-05-07 キヤノン株式会社 画像処理装置、画像処理方法、
CN108088654A (zh) * 2017-12-07 2018-05-29 东莞职业技术学院 投影仪投影质量检测方法及其电子设备

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US20040070565A1 (en) * 2001-12-05 2004-04-15 Nayar Shree K Method and apparatus for displaying images
JP4335024B2 (ja) 2004-01-27 2009-09-30 オリンパス株式会社 ３次元形状測定方法及びその装置
JP4479820B2 (ja) 2008-04-04 2010-06-09 ソニー株式会社 画像処理装置と画像処理方法および撮像装置
JP4629136B2 (ja) 2008-10-15 2011-02-09 富士フイルム株式会社 測距装置および測距方法並びにプログラム
WO2010129361A2 (en) * 2009-04-28 2010-11-11 The Regents Of The University Of California Color seamlessness across tiled multi-projector displays
JP6238521B2 (ja) 2012-12-19 2017-11-29 キヤノン株式会社 ３次元計測装置およびその制御方法
CN104168467B (zh) 2014-09-02 2016-06-15 四川大学 运用时间序列结构光技术实现投影显示几何校正的方法
JP6772630B2 (ja) 2016-07-29 2020-10-21 セイコーエプソン株式会社 三次元計測装置及び三次元物体認識方法
JP2018105671A (ja) 2016-12-26 2018-07-05 セイコーエプソン株式会社 画像処理装置及び画像処理方法
CN110168562B (zh) * 2017-03-09 2023-06-09 Oppo广东移动通信有限公司 基于深度的控制方法、基于深度的控制装置和电子装置
GB2569656B (en) * 2017-12-22 2020-07-22 Zivid Labs As Method and system for generating a three-dimensional image of an object
US12030243B2 (en) * 2020-03-19 2024-07-09 Ricoh Company, Ltd. Measuring apparatus, movable apparatus, robot, electronic device, fabricating apparatus, and measuring method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009115612A (ja) * 2007-11-06 2009-05-28 Panasonic Electric Works Co Ltd ３次元形状計測装置及び３次元形状計測方法
CN104036475A (zh) * 2013-07-22 2014-09-10 成都智慧星球科技有限公司 适应于任意投影机群及投影屏幕的高鲁棒性几何校正方法
JP2015087243A (ja) * 2013-10-30 2015-05-07 キヤノン株式会社 画像処理装置、画像処理方法、
CN108088654A (zh) * 2017-12-07 2018-05-29 东莞职业技术学院 投影仪投影质量检测方法及其电子设备

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JP2022088887A (ja) 2022-06-15
US20220182519A1 (en) 2022-06-09
CN114615483A (zh) 2022-06-10
US11898838B2 (en) 2024-02-13
JP7604860B2 (ja) 2024-12-24

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