JP7578200B2 - 要因推論装置、要因推論方法、要因推論システムおよび端末装置 - Google Patents

要因推論装置、要因推論方法、要因推論システムおよび端末装置 Download PDF

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JP7578200B2
JP7578200B2 JP2023536874A JP2023536874A JP7578200B2 JP 7578200 B2 JP7578200 B2 JP 7578200B2 JP 2023536874 A JP2023536874 A JP 2023536874A JP 2023536874 A JP2023536874 A JP 2023536874A JP 7578200 B2 JP7578200 B2 JP 7578200B2
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abnormality
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information
knowledge model
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JPWO2023176464A1 (https=
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洋平 原田
丈英 平田
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JFE Steel Corp
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N5/00—Computing arrangements using knowledge-based models
    • G06N5/04—Inference or reasoning models
    • G06N5/045—Explanation of inference; Explainable artificial intelligence [XAI]; Interpretable artificial intelligence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N5/00—Computing arrangements using knowledge-based models
    • G06N5/02—Knowledge representation; Symbolic representation
    • G06N5/022—Knowledge engineering; Knowledge acquisition
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0275—Fault isolation and identification, e.g. classify fault; estimate cause or root of failure

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Evolutionary Computation (AREA)
  • Computing Systems (AREA)
  • Data Mining & Analysis (AREA)
  • Mathematical Physics (AREA)
  • Software Systems (AREA)
  • Computational Linguistics (AREA)
  • Artificial Intelligence (AREA)
  • Medical Informatics (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
JP2023536874A 2022-03-16 2023-03-02 要因推論装置、要因推論方法、要因推論システムおよび端末装置 Active JP7578200B2 (ja)

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JP2022040921 2022-03-16
JP2022040921 2022-03-16
PCT/JP2023/007709 WO2023176464A1 (ja) 2022-03-16 2023-03-02 要因推論装置、要因推論方法、要因推論システムおよび端末装置

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JPWO2023176464A1 JPWO2023176464A1 (https=) 2023-09-21
JPWO2023176464A5 JPWO2023176464A5 (https=) 2024-02-22
JP7578200B2 true JP7578200B2 (ja) 2024-11-06

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US (1) US20250200396A1 (https=)
EP (1) EP4474931A4 (https=)
JP (1) JP7578200B2 (https=)
KR (1) KR20240142544A (https=)
CN (1) CN118786397A (https=)
WO (1) WO2023176464A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN121094102B (zh) * 2025-07-22 2026-04-28 山东海博科技信息系统股份有限公司 一种基于事件驱动与大模型微调的根因推理方法及系统

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000075923A (ja) 1998-09-03 2000-03-14 Yamatake Corp 異常診断装置
JP2007257285A (ja) 2006-03-23 2007-10-04 Omron Corp 要因推定装置、要因推定方法、プログラムおよびコンピュータ読取可能記録媒体
JP2010122847A (ja) 2008-11-19 2010-06-03 Hitachi Ltd 装置異常診断方法及びシステム
JP2014059639A (ja) 2012-09-14 2014-04-03 Mitsubishi Chemicals Corp Ｆｔ計算支援プログラム、ｆｔ計算支援方法及びｆｔ計算支援装置
JP2016122332A (ja) 2014-12-25 2016-07-07 株式会社東芝 プロセス評価装置およびプロセス評価プログラム
JP2017167847A (ja) 2016-03-16 2017-09-21 株式会社東芝 運用計画案作成装置、運用計画案作成方法、プログラムおよび運用計画案作成システム
JP2019082943A (ja) 2017-10-31 2019-05-30 株式会社日立製作所 因果関係モデル構築システムおよび方法
JP2019194849A (ja) 2018-04-30 2019-11-07 富士通株式会社 機械学習システムのための因果関係
WO2020161835A1 (ja) 2019-02-06 2020-08-13 オーウエル株式会社 管理システム及びそのための機械学習装置並びに管理方法
JP2021174408A (ja) 2020-04-28 2021-11-01 Ｊｆｅスチール株式会社 支援装置及び支援方法
JP2022028620A (ja) 2020-08-03 2022-02-16 パロ アルト リサーチ センター インコーポレイテッド 製造プロセスにおける因果推論のためのシステム及び方法

Family Cites Families (8)

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Publication number Priority date Publication date Assignee Title
JPS57123409A (en) * 1981-01-23 1982-07-31 Hitachi Ltd Process system of plant faulty signal
JPS6214210A (ja) * 1985-07-11 1987-01-22 Nippon Atom Ind Group Co Ltd 異常診断分析方法
KR960016138B1 (ko) * 1988-06-17 1996-12-04 가부시기가이샤 히다찌세이꾸쇼 지식정보생성 시스템
JP2890815B2 (ja) * 1990-11-08 1999-05-17 三菱電機株式会社 プラントの異常診断装置
JPH06137908A (ja) * 1992-10-27 1994-05-20 Toshiba Corp プラント監視装置
JP3651693B2 (ja) * 1995-02-24 2005-05-25 株式会社東芝 プラント監視診断装置および方法
JP6831743B2 (ja) * 2017-04-19 2021-02-17 株式会社日立製作所 因果関係モデルの検証方法およびシステム、および不良原因抽出システム
JP7230600B2 (ja) * 2019-03-13 2023-03-01 オムロン株式会社 表示システム

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000075923A (ja) 1998-09-03 2000-03-14 Yamatake Corp 異常診断装置
JP2007257285A (ja) 2006-03-23 2007-10-04 Omron Corp 要因推定装置、要因推定方法、プログラムおよびコンピュータ読取可能記録媒体
JP2010122847A (ja) 2008-11-19 2010-06-03 Hitachi Ltd 装置異常診断方法及びシステム
JP2014059639A (ja) 2012-09-14 2014-04-03 Mitsubishi Chemicals Corp Ｆｔ計算支援プログラム、ｆｔ計算支援方法及びｆｔ計算支援装置
JP2016122332A (ja) 2014-12-25 2016-07-07 株式会社東芝 プロセス評価装置およびプロセス評価プログラム
JP2017167847A (ja) 2016-03-16 2017-09-21 株式会社東芝 運用計画案作成装置、運用計画案作成方法、プログラムおよび運用計画案作成システム
JP2019082943A (ja) 2017-10-31 2019-05-30 株式会社日立製作所 因果関係モデル構築システムおよび方法
JP2019194849A (ja) 2018-04-30 2019-11-07 富士通株式会社 機械学習システムのための因果関係
WO2020161835A1 (ja) 2019-02-06 2020-08-13 オーウエル株式会社 管理システム及びそのための機械学習装置並びに管理方法
JP2021174408A (ja) 2020-04-28 2021-11-01 Ｊｆｅスチール株式会社 支援装置及び支援方法
JP2022028620A (ja) 2020-08-03 2022-02-16 パロ アルト リサーチ センター インコーポレイテッド 製造プロセスにおける因果推論のためのシステム及び方法

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KR20240142544A (ko) 2024-09-30
WO2023176464A1 (ja) 2023-09-21
EP4474931A1 (en) 2024-12-11
JPWO2023176464A1 (https=) 2023-09-21
US20250200396A1 (en) 2025-06-19
EP4474931A4 (en) 2025-05-28
CN118786397A (zh) 2024-10-15

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