JP7519956B2 - スイッチング装置、半導体装置、およびスイッチング装置の製造方法 - Google Patents
スイッチング装置、半導体装置、およびスイッチング装置の製造方法 Download PDFInfo
- Publication number
- JP7519956B2 JP7519956B2 JP2021089994A JP2021089994A JP7519956B2 JP 7519956 B2 JP7519956 B2 JP 7519956B2 JP 2021089994 A JP2021089994 A JP 2021089994A JP 2021089994 A JP2021089994 A JP 2021089994A JP 7519956 B2 JP7519956 B2 JP 7519956B2
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- switching device
- gate
- switching
- switching element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000004065 semiconductor Substances 0.000 title claims description 28
- 238000004519 manufacturing process Methods 0.000 title claims description 7
- 238000000034 method Methods 0.000 title claims description 6
- 239000000758 substrate Substances 0.000 claims description 25
- 239000003566 sealing material Substances 0.000 description 11
- 238000010586 diagram Methods 0.000 description 9
- 239000000463 material Substances 0.000 description 6
- 238000001816 cooling Methods 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49541—Geometry of the lead-frame
- H01L23/49562—Geometry of the lead-frame for devices being provided for in H01L29/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/49—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions wire-like arrangements or pins or rods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/60—Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49503—Lead-frames or other flat leads characterised by the die pad
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L24/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/93—Batch processes
- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/07—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
- H01L25/072—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00 the devices being arranged next to each other
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table
- H01L29/1608—Silicon carbide
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/04042—Bonding areas specifically adapted for wire connectors, e.g. wirebond pads
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48153—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being arranged next to each other, e.g. on a common substrate
- H01L2224/48175—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being arranged next to each other, e.g. on a common substrate the item being metallic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/4901—Structure
- H01L2224/4903—Connectors having different sizes, e.g. different diameters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/10—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers
- H01L25/11—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers the devices being of a type provided for in group H01L29/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Wire Bonding (AREA)
Description
<A-1.構成>
図7および図8は本実施の形態のスイッチング装置であるスイッチング装置11aおよびスイッチング装置11bをそれぞれ示す図である。
<B-1.構成>
図4および図5は本実施の形態のスイッチング装置であるスイッチング装置12aおよびスイッチング装置12bをそれぞれ示す図である。
<C-1.構成>
図9は、本実施の形態の半導体装置50を示す図である。半導体装置50は、基板30とスイッチング装置11a(第1のスイッチング装置の一例)とスイッチング装置11b(第2のスイッチング装置の一例)とヒートシンク31とを備える。半導体装置50は例えば電力変換装置である。
Claims (10)
- スイッチング素子と、
ダイパッドと、
前記ダイパッドと非一体のゲート端子と、
前記ダイパッドと一体の第1電力端子と、
前記ダイパッドと非一体の第2電力端子と、
を備え、
前記スイッチング素子は前記ダイパッド上に配置され、
前記スイッチング素子の下面と前記ダイパッドとは電気的に接続されており、
前記ゲート端子、前記第1電力端子、および前記第2電力端子は、それぞれ、平面視において前記ダイパッドに対し第1方向側に位置し、
前記ゲート端子、前記第1電力端子、および前記第2電力端子は、平面視において、前記第1方向と直行する第2方向に前記ゲート端子、前記第1電力端子、前記第2電力端子の順またはその逆順に並んでおり、
前記スイッチング素子は上面に1つのみのゲートパッドを備え、
前記ゲートパッドは、前記スイッチング素子の上面のうち前記第1方向に関する中心を含む領域に設けられており、
前記ゲートパッドと前記第2電力端子との距離よりも前記ゲートパッドと前記ゲート端子との距離の方が小さく、
前記スイッチング素子を面内において前記スイッチング素子の中心の回りで仮想的に180°回転させた際には、前記ゲートパッドと前記ゲート端子との距離よりも前記ゲートパッドと前記第2電力端子との距離の方が小さく、
前記ゲート端子と前記ゲートパッドとがワイヤにより接続されている、
スイッチング装置。 - 請求項1に記載のスイッチング装置であって、
前記ゲートパッドと前記ゲート端子との距離と、前記スイッチング素子を面内において前記スイッチング素子の中心の回りで仮想的に180°回転させた際の前記ゲートパッドと前記第2電力端子との距離と、が同じである、
スイッチング装置。 - 請求項1または2に記載のスイッチング装置であって、
前記スイッチング素子の前記第1方向側の端から前記ゲートパッドまでの前記第1方向に関する距離と、前記スイッチング素子の前記第1方向と逆側の端から前記ゲートパッドまでの前記第1方向に関する距離と、が同じである、
スイッチング装置。 - 請求項1から3のいずれか1項に記載のスイッチング装置であって、
前記ダイパッドの前記第2方向に関する中心から前記スイッチング素子の前記第2方向側の端までの距離と、前記ダイパッドの前記第2方向に関する中心から前記スイッチング素子の前記第2方向と逆側の端までの距離とが同じである、
スイッチング装置。 - 請求項1から4のいずれか1項に記載のスイッチング装置であって、
前記ゲート端子と前記第2電力端子とは前記ダイパッドの前記第2方向に関する中心から前記第2方向に関し逆側に位置し、
前記ダイパッドの前記第2方向に関する中心から前記ゲート端子までの前記第2方向に関する距離と、前記ダイパッドの前記第2方向に関する中心から前記第2電力端子までの前記第2方向に関する距離と、は同じである、
スイッチング装置。 - 請求項1から5のいずれか1項に記載のスイッチング装置であって、
前記スイッチング素子はSiC半導体を含む、
スイッチング装置。 - それぞれが請求項1から6のいずれか1項に記載のスイッチング装置である第1のスイッチング装置と第2のスイッチング装置とを備える半導体装置であって、
前記第1のスイッチング装置では前記ゲート端子、前記第1電力端子、および前記第2電力端子が、前記第2方向に前記ゲート端子、前記第1電力端子、前記第2電力端子の順に並んでおり、
前記第2のスイッチング装置では前記ゲート端子、前記第1電力端子、および前記第2電力端子が、前記第2方向に前記第2電力端子、前記第1電力端子、前記ゲート端子の順に並んでおり、
前記第1のスイッチング装置と前記第2のスイッチング装置とが並列に接続されている、
半導体装置。 - 請求項7に記載の半導体装置であって、
基板を更に備え、
前記第1のスイッチング装置と前記第2のスイッチング装置とは前記基板を挟んで対向するように前記基板の一方主面側と他方主面側にそれぞれ配置され、
前記第1のスイッチング装置のゲート端子と第1電力端子と第2電力端子との並んでいる方向に沿って、前記第1のスイッチング装置のゲート端子と第1電力端子と第2電力端子との並びと同じ順で、前記第2のスイッチング装置のゲート端子と第1電力端子と第2電力端子とが並んでいる、
半導体装置。 - 請求項8に記載の半導体装置であって、
ヒートシンクを更に備え、
前記第1のスイッチング装置と前記第2のスイッチング装置とはそれぞれ、前記基板の面内方向に関して前記ヒートシンクに対し同じ側に取り付けられている、
半導体装置。 - それぞれが請求項1から6のいずれか1項に記載のスイッチング装置であってかつ請求項1に記載のスイッチング装置を複数製造するスイッチング装置の製造方法であって、
前記スイッチング素子と、
前記ダイパッドと、
前記ダイパッドと非一体であって前記ゲート端子または前記第2電力端子となる第1端子と、
前記ダイパッドと一体であって前記第1電力端子である第2端子と、
前記ダイパッドと非一体であって前記第2電力端子または前記ゲート端子となる第3端子と、
をそれぞれ複数準備し、
前記複数のダイパッドそれぞれに前記複数のスイッチング素子をそれぞれ配置し、
前記ゲートパッドが前記スイッチング素子の前記第2方向に関する中心よりも前記第1端子側に位置する向きで前記スイッチング素子を前記ダイパッド上に配置してかつ前記ゲートパッドと前記第1端子とをワイヤにより接続するか、前記ゲートパッドが前記スイッチング素子の前記第2方向に関する中心よりも前記第3端子側に位置する向きで前記スイッチング素子を前記ダイパッド上に配置してかつ前記ゲートパッドと前記第3端子とをワイヤにより接続するか、を変えることにより、前記ゲート端子、前記第1電力端子、および前記第2電力端子が、前記第2方向に前記ゲート端子、前記第1電力端子、前記第2電力端子の順に並んでいる前記スイッチング装置と、前記ゲート端子、前記第1電力端子、および前記第2電力端子が、前記第2方向に前記ゲート端子、前記第1電力端子、前記第2電力端子の逆の順に並んでいる前記スイッチング装置と、の両方を製造する、
スイッチング装置の製造方法。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021089994A JP7519956B2 (ja) | 2021-05-28 | 2021-05-28 | スイッチング装置、半導体装置、およびスイッチング装置の製造方法 |
US17/715,070 US20220384318A1 (en) | 2021-05-28 | 2022-04-07 | Switching device, semiconductor device, and switching device manufacturing method |
DE102022112559.9A DE102022112559A1 (de) | 2021-05-28 | 2022-05-19 | Schaltvorrichtung, Halbleitervorrichtung und Verfahren zum Herstellen einer Schaltvorrichtung |
CN202210566942.0A CN115411008A (zh) | 2021-05-28 | 2022-05-23 | 开关装置、半导体装置及开关装置的制造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021089994A JP7519956B2 (ja) | 2021-05-28 | 2021-05-28 | スイッチング装置、半導体装置、およびスイッチング装置の製造方法 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2022182438A JP2022182438A (ja) | 2022-12-08 |
JP2022182438A5 JP2022182438A5 (ja) | 2023-06-30 |
JP7519956B2 true JP7519956B2 (ja) | 2024-07-22 |
Family
ID=83997099
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021089994A Active JP7519956B2 (ja) | 2021-05-28 | 2021-05-28 | スイッチング装置、半導体装置、およびスイッチング装置の製造方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20220384318A1 (ja) |
JP (1) | JP7519956B2 (ja) |
CN (1) | CN115411008A (ja) |
DE (1) | DE102022112559A1 (ja) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010129801A (ja) | 2008-11-28 | 2010-06-10 | Mitsubishi Electric Corp | 電力用半導体装置 |
JP2013197331A (ja) | 2012-03-21 | 2013-09-30 | Sumitomo Electric Ind Ltd | 半導体デバイス |
JP2018014490A (ja) | 2016-07-08 | 2018-01-25 | ローム株式会社 | 半導体装置の製造方法および半導体装置 |
JP2021061263A (ja) | 2018-02-07 | 2021-04-15 | 株式会社東芝 | 半導体ユニット及び半導体装置 |
JP2021061331A (ja) | 2019-10-08 | 2021-04-15 | ローム株式会社 | 半導体装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI238503B (en) | 2003-03-14 | 2005-08-21 | Analog Power Intellectual Prop | Electronic devices |
US7443014B2 (en) * | 2005-10-25 | 2008-10-28 | Infineon Technologies Ag | Electronic module and method of assembling the same |
JP2011182591A (ja) * | 2010-03-02 | 2011-09-15 | Panasonic Corp | 半導体装置 |
US8766430B2 (en) * | 2012-06-14 | 2014-07-01 | Infineon Technologies Ag | Semiconductor modules and methods of formation thereof |
EP3240026A4 (en) * | 2014-12-24 | 2018-09-05 | NSK Ltd. | Power semiconductor module and electric power steering device employing same |
US20200111727A1 (en) * | 2017-03-01 | 2020-04-09 | Sumitomo Electric Industries, Ltd. | Semiconductor device |
IT201800004782A1 (it) * | 2018-04-23 | 2019-10-23 | Dispositivo a semiconduttore di potenza con incapsulamento a montaggio superficiale a doppia isola |
-
2021
- 2021-05-28 JP JP2021089994A patent/JP7519956B2/ja active Active
-
2022
- 2022-04-07 US US17/715,070 patent/US20220384318A1/en active Pending
- 2022-05-19 DE DE102022112559.9A patent/DE102022112559A1/de active Pending
- 2022-05-23 CN CN202210566942.0A patent/CN115411008A/zh active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010129801A (ja) | 2008-11-28 | 2010-06-10 | Mitsubishi Electric Corp | 電力用半導体装置 |
JP2013197331A (ja) | 2012-03-21 | 2013-09-30 | Sumitomo Electric Ind Ltd | 半導体デバイス |
JP2018014490A (ja) | 2016-07-08 | 2018-01-25 | ローム株式会社 | 半導体装置の製造方法および半導体装置 |
JP2021061263A (ja) | 2018-02-07 | 2021-04-15 | 株式会社東芝 | 半導体ユニット及び半導体装置 |
JP2021061331A (ja) | 2019-10-08 | 2021-04-15 | ローム株式会社 | 半導体装置 |
Also Published As
Publication number | Publication date |
---|---|
DE102022112559A1 (de) | 2022-12-01 |
CN115411008A (zh) | 2022-11-29 |
JP2022182438A (ja) | 2022-12-08 |
US20220384318A1 (en) | 2022-12-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100430772B1 (ko) | 반도체장치 | |
JP7025181B2 (ja) | パワーモジュールおよびその製造方法、グラファイトプレート、および電源装置 | |
JP4532303B2 (ja) | 半導体モジュール | |
JP7428018B2 (ja) | 半導体モジュール | |
JP7532813B2 (ja) | 半導体モジュール | |
JP7428017B2 (ja) | 半導体モジュール | |
JP7139881B2 (ja) | 半導体装置 | |
WO2018096734A1 (ja) | 半導体モジュール | |
WO2017056176A1 (ja) | 半導体装置およびそれを備える半導体モジュール | |
US8466549B2 (en) | Semiconductor device for power conversion | |
WO2020021843A1 (ja) | 半導体装置 | |
JP2012175070A (ja) | 半導体パッケージ | |
JP7567191B2 (ja) | 半導体モジュール | |
US20230282622A1 (en) | Semiconductor device | |
CN116435278A (zh) | 功率半导体器件模块中的杂散电感降低 | |
WO2022059251A1 (ja) | 半導体装置 | |
JP7428019B2 (ja) | 半導体モジュール | |
JP7519956B2 (ja) | スイッチング装置、半導体装置、およびスイッチング装置の製造方法 | |
JP2017079307A (ja) | 半導体装置および半導体装置の製造方法 | |
JP7491043B2 (ja) | 半導体モジュール | |
US11302612B2 (en) | Lead frame wiring structure and semiconductor module | |
US10964630B2 (en) | Semiconductor device having a conductor plate and semiconductor elements | |
JP6274380B1 (ja) | 半導体モジュール | |
JP7557476B2 (ja) | 半導体装置 | |
US20230420341A1 (en) | Power module for half-bridge circuit with scalable architecture and improved layout |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20230622 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20230622 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20240329 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20240402 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240527 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20240611 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20240709 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 7519956 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |