JP7506677B2 - トンネル型コンピュータ断層撮影スキャナおよびトンネル型コンピュータ断層撮影スキャナのシンチレータから画像を取得する方法 - Google Patents

トンネル型コンピュータ断層撮影スキャナおよびトンネル型コンピュータ断層撮影スキャナのシンチレータから画像を取得する方法 Download PDF

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JP7506677B2
JP7506677B2 JP2021545951A JP2021545951A JP7506677B2 JP 7506677 B2 JP7506677 B2 JP 7506677B2 JP 2021545951 A JP2021545951 A JP 2021545951A JP 2021545951 A JP2021545951 A JP 2021545951A JP 7506677 B2 JP7506677 B2 JP 7506677B2
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computed tomography
scintillator
tomography scanner
tunnel
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JP2022520547A5 (https=
JPWO2020161581A5 (https=
JP2022520547A (ja
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ボスケッティ マルコ
ウルセラ エンリコ
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Microtec SRL
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Microtec SRL
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3303—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object fixed; source and detector move
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/417—Imaging recording with co-ordinate markings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/505—Detectors scintillation

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  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
JP2021545951A 2019-02-04 2020-01-31 トンネル型コンピュータ断層撮影スキャナおよびトンネル型コンピュータ断層撮影スキャナのシンチレータから画像を取得する方法 Active JP7506677B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP19155347.8A EP3690429B1 (en) 2019-02-04 2019-02-04 Tunnel ct scanner
EP19155347.8 2019-02-04
PCT/IB2020/050797 WO2020161581A1 (en) 2019-02-04 2020-01-31 Tunnel computerised tomographic scanner and method for acquiring images from a scintillator of a tunnel computerised tomography scanner

Publications (4)

Publication Number Publication Date
JP2022520547A JP2022520547A (ja) 2022-03-31
JP2022520547A5 JP2022520547A5 (https=) 2023-12-01
JPWO2020161581A5 JPWO2020161581A5 (https=) 2023-12-01
JP7506677B2 true JP7506677B2 (ja) 2024-06-26

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US (1) US11226296B2 (https=)
EP (1) EP3690429B1 (https=)
JP (1) JP7506677B2 (https=)
AU (1) AU2020219470B2 (https=)
DK (1) DK3690429T3 (https=)
IL (1) IL284650B2 (https=)
WO (1) WO2020161581A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT202000004246A1 (it) 2020-02-28 2021-08-28 Microtec Srl Apparecchiatura e metodo per eseguire una tomografia computerizzata di un oggetto che presenti forma allungata, in particolare tavole di legno
CN116472474A (zh) * 2020-11-25 2023-07-21 浜松光子学株式会社 摄像单元及摄像系统

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001520376A (ja) 1997-10-10 2001-10-30 アナロジック コーポレーション 法線曲面を用いたｃｔ目標物の検出
JP2005121633A (ja) 2003-08-27 2005-05-12 Matsushita Electric Ind Co Ltd Ｘ線検査装置及びｘ線検査方法
JP2012518782A (ja) 2009-02-25 2012-08-16 シーエックスアール リミテッド Ｘ線スキャナ
JP2012154733A (ja) 2011-01-25 2012-08-16 Hamamatsu Photonics Kk 放射線画像取得装置
WO2018115325A1 (en) 2016-12-22 2018-06-28 Teknologisk Institut System and method of x-ray dark field analysis

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5685328A (en) * 1979-12-17 1981-07-11 Uni Pitsutsubaagu Radioactive photographing apparatus
JPH0293351A (ja) * 1988-09-30 1990-04-04 Toshiba Corp 産業用ｃｔ装置
JPH06265487A (ja) * 1993-03-15 1994-09-22 Hitachi Ltd 透過ｘ線による断層像検出方法とその装置
RU2071725C1 (ru) * 1993-06-22 1997-01-20 Научно-производственная коммерческая фирма "Ренси Лтд." Вычислительный томограф (варианты)
US8340245B2 (en) * 2009-06-05 2012-12-25 Sentinel Scanning Corporation Transportation container inspection system and method
US9250200B1 (en) * 2011-08-15 2016-02-02 Physical Optics Corporation Compton tomography system
JP5944254B2 (ja) 2012-07-20 2016-07-05 浜松ホトニクス株式会社 放射線画像取得装置
DE102016206444A1 (de) 2016-04-15 2017-10-19 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur optischen Aufnahme eines Schirms

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001520376A (ja) 1997-10-10 2001-10-30 アナロジック コーポレーション 法線曲面を用いたｃｔ目標物の検出
JP2005121633A (ja) 2003-08-27 2005-05-12 Matsushita Electric Ind Co Ltd Ｘ線検査装置及びｘ線検査方法
JP2012518782A (ja) 2009-02-25 2012-08-16 シーエックスアール リミテッド Ｘ線スキャナ
JP2012154733A (ja) 2011-01-25 2012-08-16 Hamamatsu Photonics Kk 放射線画像取得装置
WO2018115325A1 (en) 2016-12-22 2018-06-28 Teknologisk Institut System and method of x-ray dark field analysis

Also Published As

Publication number Publication date
IL284650B2 (en) 2025-01-01
IL284650B1 (en) 2024-09-01
EP3690429A1 (en) 2020-08-05
US11226296B2 (en) 2022-01-18
DK3690429T3 (en) 2021-12-13
AU2020219470B2 (en) 2024-11-14
IL284650A (en) 2021-08-31
JP2022520547A (ja) 2022-03-31
AU2020219470A1 (en) 2021-07-29
EP3690429B1 (en) 2021-11-03
WO2020161581A1 (en) 2020-08-13
US20210278352A1 (en) 2021-09-09

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