DK3690429T3 - Tunnel ct scanner - Google Patents
Tunnel ct scanner Download PDFInfo
- Publication number
- DK3690429T3 DK3690429T3 DK19155347.8T DK19155347T DK3690429T3 DK 3690429 T3 DK3690429 T3 DK 3690429T3 DK 19155347 T DK19155347 T DK 19155347T DK 3690429 T3 DK3690429 T3 DK 3690429T3
- Authority
- DK
- Denmark
- Prior art keywords
- scanner
- tunnel
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
- G01N2223/3303—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object fixed; source and detector move
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/417—Imaging recording with co-ordinate markings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/50—Detectors
- G01N2223/505—Detectors scintillation
Landscapes
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Theoretical Computer Science (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP19155347.8A EP3690429B1 (en) | 2019-02-04 | 2019-02-04 | Tunnel ct scanner |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DK3690429T3 true DK3690429T3 (en) | 2021-12-13 |
Family
ID=65910912
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DK19155347.8T DK3690429T3 (en) | 2019-02-04 | 2019-02-04 | Tunnel ct scanner |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US11226296B2 (https=) |
| EP (1) | EP3690429B1 (https=) |
| JP (1) | JP7506677B2 (https=) |
| AU (1) | AU2020219470B2 (https=) |
| DK (1) | DK3690429T3 (https=) |
| IL (1) | IL284650B2 (https=) |
| WO (1) | WO2020161581A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| IT202000004246A1 (it) | 2020-02-28 | 2021-08-28 | Microtec Srl | Apparecchiatura e metodo per eseguire una tomografia computerizzata di un oggetto che presenti forma allungata, in particolare tavole di legno |
| CN116472474A (zh) * | 2020-11-25 | 2023-07-21 | 浜松光子学株式会社 | 摄像单元及摄像系统 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5685328A (en) * | 1979-12-17 | 1981-07-11 | Uni Pitsutsubaagu | Radioactive photographing apparatus |
| JPH0293351A (ja) * | 1988-09-30 | 1990-04-04 | Toshiba Corp | 産業用ｃｔ装置 |
| JPH06265487A (ja) * | 1993-03-15 | 1994-09-22 | Hitachi Ltd | 透過ｘ線による断層像検出方法とその装置 |
| RU2071725C1 (ru) * | 1993-06-22 | 1997-01-20 | Научно-производственная коммерческая фирма "Ренси Лтд." | Вычислительный томограф (варианты) |
| WO1999019716A1 (en) | 1997-10-10 | 1999-04-22 | Analogic Corporation | Ct target detection using surface normals |
| GB0903198D0 (en) | 2009-02-25 | 2009-04-08 | Cxr Ltd | X-Ray scanners |
| JP4386812B2 (ja) | 2003-08-27 | 2009-12-16 | パナソニック株式会社 | Ｘ線検査装置 |
| US8340245B2 (en) * | 2009-06-05 | 2012-12-25 | Sentinel Scanning Corporation | Transportation container inspection system and method |
| JP5784916B2 (ja) | 2011-01-25 | 2015-09-24 | 浜松ホトニクス株式会社 | 放射線画像取得装置 |
| US9250200B1 (en) * | 2011-08-15 | 2016-02-02 | Physical Optics Corporation | Compton tomography system |
| JP5944254B2 (ja) | 2012-07-20 | 2016-07-05 | 浜松ホトニクス株式会社 | 放射線画像取得装置 |
| DE102016206444A1 (de) | 2016-04-15 | 2017-10-19 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Vorrichtung zur optischen Aufnahme eines Schirms |
| WO2018115325A1 (en) * | 2016-12-22 | 2018-06-28 | Teknologisk Institut | System and method of x-ray dark field analysis |
-
2019
- 2019-02-04 EP EP19155347.8A patent/EP3690429B1/en active Active
- 2019-02-04 DK DK19155347.8T patent/DK3690429T3/da active
-
2020
- 2020-01-31 WO PCT/IB2020/050797 patent/WO2020161581A1/en not_active Ceased
- 2020-01-31 AU AU2020219470A patent/AU2020219470B2/en active Active
- 2020-01-31 JP JP2021545951A patent/JP7506677B2/ja active Active
- 2020-01-31 IL IL284650A patent/IL284650B2/en unknown
- 2020-01-31 US US17/259,869 patent/US11226296B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| IL284650B2 (en) | 2025-01-01 |
| IL284650B1 (en) | 2024-09-01 |
| EP3690429A1 (en) | 2020-08-05 |
| US11226296B2 (en) | 2022-01-18 |
| AU2020219470B2 (en) | 2024-11-14 |
| IL284650A (en) | 2021-08-31 |
| JP2022520547A (ja) | 2022-03-31 |
| AU2020219470A1 (en) | 2021-07-29 |
| EP3690429B1 (en) | 2021-11-03 |
| WO2020161581A1 (en) | 2020-08-13 |
| US20210278352A1 (en) | 2021-09-09 |
| JP7506677B2 (ja) | 2024-06-26 |
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