JP7483165B1 - 集積回路試験システム、集積回路試験装置、集積回路試験方法、及びプログラム - Google Patents

集積回路試験システム、集積回路試験装置、集積回路試験方法、及びプログラム Download PDF

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Publication number
JP7483165B1
JP7483165B1 JP2023579132A JP2023579132A JP7483165B1 JP 7483165 B1 JP7483165 B1 JP 7483165B1 JP 2023579132 A JP2023579132 A JP 2023579132A JP 2023579132 A JP2023579132 A JP 2023579132A JP 7483165 B1 JP7483165 B1 JP 7483165B1
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unit
integrated circuit
variable function
function unit
signal
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JPWO2024236730A1 (https=
JPWO2024236730A5 (https=
Inventor
直也 香川
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP2023579132A 2023-05-16 2023-05-16 集積回路試験システム、集積回路試験装置、集積回路試験方法、及びプログラム Active JP7483165B1 (ja)

Applications Claiming Priority (1)

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PCT/JP2023/018258 WO2024236730A1 (ja) 2023-05-16 2023-05-16 集積回路試験システム、集積回路試験装置、集積回路試験方法、及びプログラム

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JP7483165B1 true JP7483165B1 (ja) 2024-05-14
JPWO2024236730A1 JPWO2024236730A1 (https=) 2024-11-21
JPWO2024236730A5 JPWO2024236730A5 (https=) 2025-04-22

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JP (1) JP7483165B1 (https=)
WO (1) WO2024236730A1 (https=)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006048677A (ja) * 2004-07-29 2006-02-16 Temento Systems 電子回路をデバッグするデバイス及び方法
JP2007292492A (ja) * 2006-04-21 2007-11-08 Aoi Electronics Co Ltd 回路検証装置及び回路検証方法
JP2008060819A (ja) * 2006-08-30 2008-03-13 Fujitsu Ltd 集積回路の試験方法
JP2022162860A (ja) * 2021-04-13 2022-10-25 日立Astemo株式会社 演算装置、演算システム、テスト方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006048677A (ja) * 2004-07-29 2006-02-16 Temento Systems 電子回路をデバッグするデバイス及び方法
JP2007292492A (ja) * 2006-04-21 2007-11-08 Aoi Electronics Co Ltd 回路検証装置及び回路検証方法
JP2008060819A (ja) * 2006-08-30 2008-03-13 Fujitsu Ltd 集積回路の試験方法
JP2022162860A (ja) * 2021-04-13 2022-10-25 日立Astemo株式会社 演算装置、演算システム、テスト方法

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JPWO2024236730A1 (https=) 2024-11-21
WO2024236730A1 (ja) 2024-11-21

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