JPWO2024236730A1 - - Google Patents
Info
- Publication number
- JPWO2024236730A1 JPWO2024236730A1 JP2023579132A JP2023579132A JPWO2024236730A1 JP WO2024236730 A1 JPWO2024236730 A1 JP WO2024236730A1 JP 2023579132 A JP2023579132 A JP 2023579132A JP 2023579132 A JP2023579132 A JP 2023579132A JP WO2024236730 A1 JPWO2024236730 A1 JP WO2024236730A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3177—Testing of logic operation, e.g. by logic analysers
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2023/018258 WO2024236730A1 (ja) | 2023-05-16 | 2023-05-16 | 集積回路試験システム、集積回路試験装置、集積回路試験方法、及びプログラム |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP7483165B1 JP7483165B1 (ja) | 2024-05-14 |
| JPWO2024236730A1 true JPWO2024236730A1 (https=) | 2024-11-21 |
| JPWO2024236730A5 JPWO2024236730A5 (https=) | 2025-04-22 |
Family
ID=91030969
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023579132A Active JP7483165B1 (ja) | 2023-05-16 | 2023-05-16 | 集積回路試験システム、集積回路試験装置、集積回路試験方法、及びプログラム |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP7483165B1 (https=) |
| WO (1) | WO2024236730A1 (https=) |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2873833B1 (fr) * | 2004-07-29 | 2006-10-13 | Temento Systems | Debogueur d'un circuit electronique fabrique a partir d'un programme en langage de description de materiel |
| JP4890086B2 (ja) * | 2006-04-21 | 2012-03-07 | アオイ電子株式会社 | 回路検証装置及び回路検証方法 |
| JP2008060819A (ja) * | 2006-08-30 | 2008-03-13 | Fujitsu Ltd | 集積回路の試験方法 |
| JP2022162860A (ja) * | 2021-04-13 | 2022-10-25 | 日立Astemo株式会社 | 演算装置、演算システム、テスト方法 |
-
2023
- 2023-05-16 JP JP2023579132A patent/JP7483165B1/ja active Active
- 2023-05-16 WO PCT/JP2023/018258 patent/WO2024236730A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2024236730A1 (ja) | 2024-11-21 |
| JP7483165B1 (ja) | 2024-05-14 |
Similar Documents
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