JP7467152B2 - 収容容器及び基板状センサの充電方法 - Google Patents
収容容器及び基板状センサの充電方法 Download PDFInfo
- Publication number
- JP7467152B2 JP7467152B2 JP2020022759A JP2020022759A JP7467152B2 JP 7467152 B2 JP7467152 B2 JP 7467152B2 JP 2020022759 A JP2020022759 A JP 2020022759A JP 2020022759 A JP2020022759 A JP 2020022759A JP 7467152 B2 JP7467152 B2 JP 7467152B2
- Authority
- JP
- Japan
- Prior art keywords
- sensor
- substrate
- container body
- storage container
- container
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0604—Process monitoring, e.g. flow or thickness monitoring
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D11/00—Component parts of measuring arrangements not specially adapted for a specific variable
- G01D11/24—Housings ; Casings for instruments
- G01D11/245—Housings for sensors
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—ELECTRIC POWER NETWORKS; CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- H02J7/00—Circuit arrangements for charging or discharging batteries or for supplying loads from batteries
- H02J7/70—Circuit arrangements for charging or discharging batteries or for supplying loads from batteries characterised by the mechanical construction
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—ELECTRIC POWER NETWORKS; CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- H02J7/00—Circuit arrangements for charging or discharging batteries or for supplying loads from batteries
- H02J7/70—Circuit arrangements for charging or discharging batteries or for supplying loads from batteries characterised by the mechanical construction
- H02J7/731—Circuit arrangements for charging or discharging batteries or for supplying loads from batteries characterised by the mechanical construction specially adapted for holding portable devices containing batteries
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
- H10P72/19—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
- H10P72/1922—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by the construction of the closed carrier
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
- Charge And Discharge Circuits For Batteries Or The Like (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020022759A JP7467152B2 (ja) | 2020-02-13 | 2020-02-13 | 収容容器及び基板状センサの充電方法 |
| US17/168,555 US11984332B2 (en) | 2020-02-13 | 2021-02-05 | Container and method for charging substrate-like sensor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020022759A JP7467152B2 (ja) | 2020-02-13 | 2020-02-13 | 収容容器及び基板状センサの充電方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2021129024A JP2021129024A (ja) | 2021-09-02 |
| JP2021129024A5 JP2021129024A5 (https=) | 2023-01-31 |
| JP7467152B2 true JP7467152B2 (ja) | 2024-04-15 |
Family
ID=77273061
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2020022759A Active JP7467152B2 (ja) | 2020-02-13 | 2020-02-13 | 収容容器及び基板状センサの充電方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US11984332B2 (https=) |
| JP (1) | JP7467152B2 (https=) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11924972B2 (en) | 2020-06-02 | 2024-03-05 | Applied Materials, Inc. | Diagnostic disc with a high vacuum and temperature tolerant power source |
| US11589474B2 (en) | 2020-06-02 | 2023-02-21 | Applied Materials, Inc. | Diagnostic disc with a high vacuum and temperature tolerant power source |
| TWI899491B (zh) * | 2021-08-04 | 2025-10-01 | 日商東京威力科創股份有限公司 | 收容容器及基板狀感測器之充電方法 |
| JP7648310B2 (ja) * | 2021-08-04 | 2025-03-18 | 東京エレクトロン株式会社 | 収容容器及び基板状センサの充電方法 |
| US11817724B2 (en) | 2022-03-02 | 2023-11-14 | Applied Materials, Inc. | Enclosure system with charging assembly |
| KR102748315B1 (ko) * | 2022-09-28 | 2024-12-31 | 주식회사 저스템 | 웨이퍼 용기의 습도 및 온도 센싱 장치 |
| KR102765965B1 (ko) * | 2023-02-20 | 2025-02-07 | 이규옥 | Oht로 이동 가능한 foup 내의 로봇감지 레이저 센서 시스템의 위치 판정 장치 |
| US12562351B2 (en) | 2024-01-30 | 2026-02-24 | Applied Materials, Inc. | Extreme edge sheath tunability with non-movable edge ring |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002261159A (ja) | 2000-12-04 | 2002-09-13 | Ebara Corp | 基板搬送容器 |
| JP2004153119A (ja) | 2002-10-31 | 2004-05-27 | Tokyo Electron Ltd | プロセスモニタ及び半導体製造装置 |
| JP2005521926A (ja) | 2002-02-06 | 2005-07-21 | サイバーオプティクス セミコンダクタ インコーポレイテッド | ワイヤレス基板状センサ |
| JP2006513583A (ja) | 2002-12-03 | 2006-04-20 | センサレー コーポレイション | 統合化されたプロセス条件検知用ウェハおよびデータ解析システム |
| JP2013506297A (ja) | 2009-09-25 | 2013-02-21 | ケーエルエー−テンカー・コーポレーション | 非接触インタフェースシステム |
| JP2016500929A (ja) | 2012-10-30 | 2016-01-14 | ケーエルエー−テンカー コーポレイション | 半導体ウェーハ搬送システムに利用するための自動インターフェース装置及び方法 |
| JP2018526814A (ja) | 2015-06-16 | 2018-09-13 | ケーエルエー−テンカー コーポレイション | 半導体工場自動化システムのパラメタを監視するシステム及び方法 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7282889B2 (en) * | 2001-04-19 | 2007-10-16 | Onwafer Technologies, Inc. | Maintenance unit for a sensor apparatus |
| US6781205B1 (en) * | 2002-10-11 | 2004-08-24 | Ion Systems, Inc. | Electrostatic charge measurement on semiconductor wafers |
| TWI268429B (en) | 2003-11-29 | 2006-12-11 | Onwafer Technologies Inc | Systems, maintenance units and substrate processing systems for wirelessly charging and wirelessly communicating with sensor apparatus as well as methods for wirelessly charging and communicating with sensor apparatus |
| JP7037379B2 (ja) * | 2018-02-06 | 2022-03-16 | ローツェ株式会社 | 薄板状基板保持装置、及び保持装置を備える搬送ロボット |
| US10916464B1 (en) * | 2019-07-26 | 2021-02-09 | Applied Materials, Inc. | Method of pre aligning carrier, wafer and carrier-wafer combination for throughput efficiency |
| US12237189B2 (en) * | 2019-11-19 | 2025-02-25 | Micron Technology, Inc. | Wafer storage devices configured to measure physical properties of wafers stored therein |
-
2020
- 2020-02-13 JP JP2020022759A patent/JP7467152B2/ja active Active
-
2021
- 2021-02-05 US US17/168,555 patent/US11984332B2/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002261159A (ja) | 2000-12-04 | 2002-09-13 | Ebara Corp | 基板搬送容器 |
| JP2005521926A (ja) | 2002-02-06 | 2005-07-21 | サイバーオプティクス セミコンダクタ インコーポレイテッド | ワイヤレス基板状センサ |
| JP2004153119A (ja) | 2002-10-31 | 2004-05-27 | Tokyo Electron Ltd | プロセスモニタ及び半導体製造装置 |
| JP2006513583A (ja) | 2002-12-03 | 2006-04-20 | センサレー コーポレイション | 統合化されたプロセス条件検知用ウェハおよびデータ解析システム |
| JP2013506297A (ja) | 2009-09-25 | 2013-02-21 | ケーエルエー−テンカー・コーポレーション | 非接触インタフェースシステム |
| JP2016500929A (ja) | 2012-10-30 | 2016-01-14 | ケーエルエー−テンカー コーポレイション | 半導体ウェーハ搬送システムに利用するための自動インターフェース装置及び方法 |
| JP2018526814A (ja) | 2015-06-16 | 2018-09-13 | ケーエルエー−テンカー コーポレイション | 半導体工場自動化システムのパラメタを監視するシステム及び方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2021129024A (ja) | 2021-09-02 |
| US20210257234A1 (en) | 2021-08-19 |
| US11984332B2 (en) | 2024-05-14 |
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