JP7467152B2 - 収容容器及び基板状センサの充電方法 - Google Patents

収容容器及び基板状センサの充電方法 Download PDF

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Publication number
JP7467152B2
JP7467152B2 JP2020022759A JP2020022759A JP7467152B2 JP 7467152 B2 JP7467152 B2 JP 7467152B2 JP 2020022759 A JP2020022759 A JP 2020022759A JP 2020022759 A JP2020022759 A JP 2020022759A JP 7467152 B2 JP7467152 B2 JP 7467152B2
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Japan
Prior art keywords
sensor
substrate
container body
storage container
container
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JP2020022759A
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Japanese (ja)
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JP2021129024A (ja
JP2021129024A5 (https=
Inventor
侑治 秋月
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Tokyo Electron Ltd
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Tokyo Electron Ltd
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Priority to JP2020022759A priority Critical patent/JP7467152B2/ja
Priority to US17/168,555 priority patent/US11984332B2/en
Publication of JP2021129024A publication Critical patent/JP2021129024A/ja
Publication of JP2021129024A5 publication Critical patent/JP2021129024A5/ja
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/06Apparatus for monitoring, sorting, marking, testing or measuring
    • H10P72/0604Process monitoring, e.g. flow or thickness monitoring
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/06Apparatus for monitoring, sorting, marking, testing or measuring
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D11/00Component parts of measuring arrangements not specially adapted for a specific variable
    • G01D11/24Housings ; Casings for instruments
    • G01D11/245Housings for sensors
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02JELECTRIC POWER NETWORKS; CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
    • H02J7/00Circuit arrangements for charging or discharging batteries or for supplying loads from batteries
    • H02J7/70Circuit arrangements for charging or discharging batteries or for supplying loads from batteries characterised by the mechanical construction
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02JELECTRIC POWER NETWORKS; CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
    • H02J7/00Circuit arrangements for charging or discharging batteries or for supplying loads from batteries
    • H02J7/70Circuit arrangements for charging or discharging batteries or for supplying loads from batteries characterised by the mechanical construction
    • H02J7/731Circuit arrangements for charging or discharging batteries or for supplying loads from batteries characterised by the mechanical construction specially adapted for holding portable devices containing batteries
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/19Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
    • H10P72/1922Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by the construction of the closed carrier

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Charge And Discharge Circuits For Batteries Or The Like (AREA)
JP2020022759A 2020-02-13 2020-02-13 収容容器及び基板状センサの充電方法 Active JP7467152B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2020022759A JP7467152B2 (ja) 2020-02-13 2020-02-13 収容容器及び基板状センサの充電方法
US17/168,555 US11984332B2 (en) 2020-02-13 2021-02-05 Container and method for charging substrate-like sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020022759A JP7467152B2 (ja) 2020-02-13 2020-02-13 収容容器及び基板状センサの充電方法

Publications (3)

Publication Number Publication Date
JP2021129024A JP2021129024A (ja) 2021-09-02
JP2021129024A5 JP2021129024A5 (https=) 2023-01-31
JP7467152B2 true JP7467152B2 (ja) 2024-04-15

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ID=77273061

Family Applications (1)

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JP2020022759A Active JP7467152B2 (ja) 2020-02-13 2020-02-13 収容容器及び基板状センサの充電方法

Country Status (2)

Country Link
US (1) US11984332B2 (https=)
JP (1) JP7467152B2 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11924972B2 (en) 2020-06-02 2024-03-05 Applied Materials, Inc. Diagnostic disc with a high vacuum and temperature tolerant power source
US11589474B2 (en) 2020-06-02 2023-02-21 Applied Materials, Inc. Diagnostic disc with a high vacuum and temperature tolerant power source
TWI899491B (zh) * 2021-08-04 2025-10-01 日商東京威力科創股份有限公司 收容容器及基板狀感測器之充電方法
JP7648310B2 (ja) * 2021-08-04 2025-03-18 東京エレクトロン株式会社 収容容器及び基板状センサの充電方法
US11817724B2 (en) 2022-03-02 2023-11-14 Applied Materials, Inc. Enclosure system with charging assembly
KR102748315B1 (ko) * 2022-09-28 2024-12-31 주식회사 저스템 웨이퍼 용기의 습도 및 온도 센싱 장치
KR102765965B1 (ko) * 2023-02-20 2025-02-07 이규옥 Oht로 이동 가능한 foup 내의 로봇감지 레이저 센서 시스템의 위치 판정 장치
US12562351B2 (en) 2024-01-30 2026-02-24 Applied Materials, Inc. Extreme edge sheath tunability with non-movable edge ring

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002261159A (ja) 2000-12-04 2002-09-13 Ebara Corp 基板搬送容器
JP2004153119A (ja) 2002-10-31 2004-05-27 Tokyo Electron Ltd プロセスモニタ及び半導体製造装置
JP2005521926A (ja) 2002-02-06 2005-07-21 サイバーオプティクス セミコンダクタ インコーポレイテッド ワイヤレス基板状センサ
JP2006513583A (ja) 2002-12-03 2006-04-20 センサレー コーポレイション 統合化されたプロセス条件検知用ウェハおよびデータ解析システム
JP2013506297A (ja) 2009-09-25 2013-02-21 ケーエルエー−テンカー・コーポレーション 非接触インタフェースシステム
JP2016500929A (ja) 2012-10-30 2016-01-14 ケーエルエー−テンカー コーポレイション 半導体ウェーハ搬送システムに利用するための自動インターフェース装置及び方法
JP2018526814A (ja) 2015-06-16 2018-09-13 ケーエルエー−テンカー コーポレイション 半導体工場自動化システムのパラメタを監視するシステム及び方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7282889B2 (en) * 2001-04-19 2007-10-16 Onwafer Technologies, Inc. Maintenance unit for a sensor apparatus
US6781205B1 (en) * 2002-10-11 2004-08-24 Ion Systems, Inc. Electrostatic charge measurement on semiconductor wafers
TWI268429B (en) 2003-11-29 2006-12-11 Onwafer Technologies Inc Systems, maintenance units and substrate processing systems for wirelessly charging and wirelessly communicating with sensor apparatus as well as methods for wirelessly charging and communicating with sensor apparatus
JP7037379B2 (ja) * 2018-02-06 2022-03-16 ローツェ株式会社 薄板状基板保持装置、及び保持装置を備える搬送ロボット
US10916464B1 (en) * 2019-07-26 2021-02-09 Applied Materials, Inc. Method of pre aligning carrier, wafer and carrier-wafer combination for throughput efficiency
US12237189B2 (en) * 2019-11-19 2025-02-25 Micron Technology, Inc. Wafer storage devices configured to measure physical properties of wafers stored therein

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002261159A (ja) 2000-12-04 2002-09-13 Ebara Corp 基板搬送容器
JP2005521926A (ja) 2002-02-06 2005-07-21 サイバーオプティクス セミコンダクタ インコーポレイテッド ワイヤレス基板状センサ
JP2004153119A (ja) 2002-10-31 2004-05-27 Tokyo Electron Ltd プロセスモニタ及び半導体製造装置
JP2006513583A (ja) 2002-12-03 2006-04-20 センサレー コーポレイション 統合化されたプロセス条件検知用ウェハおよびデータ解析システム
JP2013506297A (ja) 2009-09-25 2013-02-21 ケーエルエー−テンカー・コーポレーション 非接触インタフェースシステム
JP2016500929A (ja) 2012-10-30 2016-01-14 ケーエルエー−テンカー コーポレイション 半導体ウェーハ搬送システムに利用するための自動インターフェース装置及び方法
JP2018526814A (ja) 2015-06-16 2018-09-13 ケーエルエー−テンカー コーポレイション 半導体工場自動化システムのパラメタを監視するシステム及び方法

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JP2021129024A (ja) 2021-09-02
US20210257234A1 (en) 2021-08-19
US11984332B2 (en) 2024-05-14

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