JP7463725B2 - p型不純物拡散組成物とその製造方法、それを用いた半導体素子の製造方法および太陽電池 - Google Patents

p型不純物拡散組成物とその製造方法、それを用いた半導体素子の製造方法および太陽電池 Download PDF

Info

Publication number
JP7463725B2
JP7463725B2 JP2019565963A JP2019565963A JP7463725B2 JP 7463725 B2 JP7463725 B2 JP 7463725B2 JP 2019565963 A JP2019565963 A JP 2019565963A JP 2019565963 A JP2019565963 A JP 2019565963A JP 7463725 B2 JP7463725 B2 JP 7463725B2
Authority
JP
Japan
Prior art keywords
type impurity
impurity diffusion
diffusion composition
semiconductor substrate
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2019565963A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2020116270A1 (ja
Inventor
剛 北田
邦彦 橘
旭 秋本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toray Industries Inc
Original Assignee
Toray Industries Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toray Industries Inc filed Critical Toray Industries Inc
Publication of JPWO2020116270A1 publication Critical patent/JPWO2020116270A1/ja
Application granted granted Critical
Publication of JP7463725B2 publication Critical patent/JP7463725B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/22Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
    • H01L21/225Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a solid phase, e.g. a doped oxide layer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • H01L31/06Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers
    • H01L31/075Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PIN type, e.g. amorphous silicon PIN solar cells
    • H01L31/077Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PIN type, e.g. amorphous silicon PIN solar cells the devices comprising monocrystalline or polycrystalline materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/547Monocrystalline silicon PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Electromagnetism (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Photovoltaic Devices (AREA)
JP2019565963A 2018-12-07 2019-11-27 p型不純物拡散組成物とその製造方法、それを用いた半導体素子の製造方法および太陽電池 Active JP7463725B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2018229582 2018-12-07
JP2018229582 2018-12-07
PCT/JP2019/046319 WO2020116270A1 (ja) 2018-12-07 2019-11-27 p型不純物拡散組成物とその製造方法、それを用いた半導体素子の製造方法および太陽電池

Publications (2)

Publication Number Publication Date
JPWO2020116270A1 JPWO2020116270A1 (ja) 2021-10-14
JP7463725B2 true JP7463725B2 (ja) 2024-04-09

Family

ID=70973772

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019565963A Active JP7463725B2 (ja) 2018-12-07 2019-11-27 p型不純物拡散組成物とその製造方法、それを用いた半導体素子の製造方法および太陽電池

Country Status (4)

Country Link
JP (1) JP7463725B2 (zh)
CN (1) CN113169247A (zh)
TW (1) TW202027291A (zh)
WO (1) WO2020116270A1 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7428478B2 (ja) * 2019-05-24 2024-02-06 東京応化工業株式会社 拡散剤組成物、及び半導体基板の製造方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010062223A (ja) 2008-09-01 2010-03-18 Japan Vam & Poval Co Ltd ホウ素拡散用塗布液
JP2014030011A (ja) 2012-07-04 2014-02-13 Nippon Synthetic Chem Ind Co Ltd:The ドーパント拡散用塗布液、およびその塗布方法、並びにそれを用いた半導体の製法、半導体
WO2016121641A1 (ja) 2015-01-30 2016-08-04 東レ株式会社 不純物拡散組成物、それを用いた半導体素子の製造方法および太陽電池
WO2018021117A1 (ja) 2016-07-26 2018-02-01 東レ株式会社 半導体素子の製造方法および太陽電池の製造方法
WO2018040990A1 (zh) 2016-08-31 2018-03-08 东丽先端材料研究开发(中国)有限公司 聚硅氧烷、半导体用材料、半导体及太阳能电池制备方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010062223A (ja) 2008-09-01 2010-03-18 Japan Vam & Poval Co Ltd ホウ素拡散用塗布液
JP2014030011A (ja) 2012-07-04 2014-02-13 Nippon Synthetic Chem Ind Co Ltd:The ドーパント拡散用塗布液、およびその塗布方法、並びにそれを用いた半導体の製法、半導体
WO2016121641A1 (ja) 2015-01-30 2016-08-04 東レ株式会社 不純物拡散組成物、それを用いた半導体素子の製造方法および太陽電池
WO2018021117A1 (ja) 2016-07-26 2018-02-01 東レ株式会社 半導体素子の製造方法および太陽電池の製造方法
WO2018040990A1 (zh) 2016-08-31 2018-03-08 东丽先端材料研究开发(中国)有限公司 聚硅氧烷、半导体用材料、半导体及太阳能电池制备方法

Also Published As

Publication number Publication date
WO2020116270A1 (ja) 2020-06-11
JPWO2020116270A1 (ja) 2021-10-14
CN113169247A (zh) 2021-07-23
TW202027291A (zh) 2020-07-16

Similar Documents

Publication Publication Date Title
TWI462158B (zh) Film forming composition
JP5283824B2 (ja) 膜形成組成物
JP6760059B2 (ja) p型不純物拡散組成物、それを用いた半導体素子の製造方法ならびに太陽電池およびその製造方法
EP3018699B1 (en) Impurity-diffusing composition and method for producing semiconductor element
US20130109123A1 (en) Diffusing agent composition and method of forming impurity diffusion layer
CN113169248B (zh) 半导体元件的制造方法和太阳能电池的制造方法
JP7463725B2 (ja) p型不純物拡散組成物とその製造方法、それを用いた半導体素子の製造方法および太陽電池
JP2016195203A (ja) p型不純物拡散組成物、それを用いた半導体素子の製造方法および太陽電池。
JP7163774B2 (ja) 半導体用材料、半導体素子の製造方法
JP2002075894A (ja) 液状不純物源材料及びこれを使用した半導体装置の製造方法
TW202112950A (zh) 雜質擴散組成物、使用其的半導體元件的製造方法及太陽電池的製造方法
WO2018021117A1 (ja) 半導体素子の製造方法および太陽電池の製造方法
US9550940B2 (en) Etching material
JP6838399B2 (ja) 半導体素子の製造方法および太陽電池の製造方法
TW201639007A (zh) 不純物擴散組成物、使用其的半導體元件的製造方法及太陽電池
WO2015015642A1 (ja) マスクペースト組成物、これを用いて得られる半導体素子および半導体素子の製造方法
WO2024057722A1 (ja) 不純物拡散組成物、それを用いた半導体素子の製造方法および太陽電池の製造方法
TW201712882A (zh) p型不純物擴散組成物、使用其的半導體元件的製造方法及太陽電池的製造方法
TWI856294B (zh) 蝕刻劑的組合物、使用其之半導體裝置的形成方法、以及半導體裝置
KR20190097476A (ko) 절연막 식각액 조성물 및 이의 제조 방법

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20220729

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20231003

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20231128

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20240227

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20240311

R150 Certificate of patent or registration of utility model

Ref document number: 7463725

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150