JP7352717B2 - 光検出素子およびイメージセンサ - Google Patents
光検出素子およびイメージセンサ Download PDFInfo
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- JP7352717B2 JP7352717B2 JP2022500385A JP2022500385A JP7352717B2 JP 7352717 B2 JP7352717 B2 JP 7352717B2 JP 2022500385 A JP2022500385 A JP 2022500385A JP 2022500385 A JP2022500385 A JP 2022500385A JP 7352717 B2 JP7352717 B2 JP 7352717B2
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- semiconductor quantum
- group
- ligand
- quantum dots
- atoms
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- 239000002096 quantum dot Substances 0.000 claims description 181
- 239000004065 semiconductor Substances 0.000 claims description 180
- 125000004429 atom Chemical group 0.000 claims description 142
- 239000003446 ligand Substances 0.000 claims description 109
- 238000006243 chemical reaction Methods 0.000 claims description 58
- 230000005525 hole transport Effects 0.000 claims description 49
- 229910052751 metal Inorganic materials 0.000 claims description 35
- 239000002184 metal Substances 0.000 claims description 35
- 150000001875 compounds Chemical class 0.000 claims description 26
- CWERGRDVMFNCDR-UHFFFAOYSA-N thioglycolic acid Chemical compound OC(=O)CS CWERGRDVMFNCDR-UHFFFAOYSA-N 0.000 claims description 26
- 125000005843 halogen group Chemical group 0.000 claims description 17
- 125000003396 thiol group Chemical group [H]S* 0.000 claims description 12
- 229910001502 inorganic halide Inorganic materials 0.000 claims description 8
- 229910052725 zinc Inorganic materials 0.000 claims description 4
- 239000010410 layer Substances 0.000 description 170
- 239000000463 material Substances 0.000 description 77
- 239000010408 film Substances 0.000 description 46
- 238000004040 coloring Methods 0.000 description 40
- -1 InN Chemical compound 0.000 description 30
- 239000006185 dispersion Substances 0.000 description 24
- 238000000034 method Methods 0.000 description 23
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 21
- 230000005540 biological transmission Effects 0.000 description 20
- 239000000243 solution Substances 0.000 description 19
- 239000000758 substrate Substances 0.000 description 19
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- UAYWVJHJZHQCIE-UHFFFAOYSA-L zinc iodide Chemical compound I[Zn]I UAYWVJHJZHQCIE-UHFFFAOYSA-L 0.000 description 14
- DGVVWUTYPXICAM-UHFFFAOYSA-N β‐Mercaptoethanol Chemical compound OCCS DGVVWUTYPXICAM-UHFFFAOYSA-N 0.000 description 14
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- 125000004432 carbon atom Chemical group C* 0.000 description 11
- 229910052745 lead Inorganic materials 0.000 description 11
- 238000000926 separation method Methods 0.000 description 11
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- LQJBNNIYVWPHFW-UHFFFAOYSA-N 20:1omega9c fatty acid Natural products CCCCCCCCCCC=CCCCCCCCC(O)=O LQJBNNIYVWPHFW-UHFFFAOYSA-N 0.000 description 10
- QSBYPNXLFMSGKH-UHFFFAOYSA-N 9-Heptadecensaeure Natural products CCCCCCCC=CCCCCCCCC(O)=O QSBYPNXLFMSGKH-UHFFFAOYSA-N 0.000 description 10
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- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 6
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- 125000001424 substituent group Chemical group 0.000 description 6
- 125000000020 sulfo group Chemical group O=S(=O)([*])O[H] 0.000 description 6
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- YBNMDCCMCLUHBL-UHFFFAOYSA-N (2,5-dioxopyrrolidin-1-yl) 4-pyren-1-ylbutanoate Chemical compound C=1C=C(C2=C34)C=CC3=CC=CC4=CC=C2C=1CCCC(=O)ON1C(=O)CCC1=O YBNMDCCMCLUHBL-UHFFFAOYSA-N 0.000 description 5
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 5
- 125000000217 alkyl group Chemical group 0.000 description 5
- 238000000576 coating method Methods 0.000 description 5
- 150000002367 halogens Chemical class 0.000 description 5
- ABLZXFCXXLZCGV-UHFFFAOYSA-N phosphonic acid group Chemical group P(O)(O)=O ABLZXFCXXLZCGV-UHFFFAOYSA-N 0.000 description 5
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- 239000011701 zinc Substances 0.000 description 5
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- 229910000673 Indium arsenide Inorganic materials 0.000 description 4
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- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 4
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- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 4
- BJEPYKJPYRNKOW-REOHCLBHSA-N (S)-malic acid Chemical compound OC(=O)[C@@H](O)CC(O)=O BJEPYKJPYRNKOW-REOHCLBHSA-N 0.000 description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 3
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 3
- UKAUYVFTDYCKQA-VKHMYHEASA-N L-homoserine Chemical compound OC(=O)[C@@H](N)CCO UKAUYVFTDYCKQA-VKHMYHEASA-N 0.000 description 3
- WUGQZFFCHPXWKQ-UHFFFAOYSA-N Propanolamine Chemical compound NCCCO WUGQZFFCHPXWKQ-UHFFFAOYSA-N 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 239000006096 absorbing agent Substances 0.000 description 3
- BJEPYKJPYRNKOW-UHFFFAOYSA-N alpha-hydroxysuccinic acid Natural products OC(=O)C(O)CC(O)=O BJEPYKJPYRNKOW-UHFFFAOYSA-N 0.000 description 3
- RLECCBFNWDXKPK-UHFFFAOYSA-N bis(trimethylsilyl)sulfide Chemical compound C[Si](C)(C)S[Si](C)(C)C RLECCBFNWDXKPK-UHFFFAOYSA-N 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 230000000875 corresponding effect Effects 0.000 description 3
- 125000004122 cyclic group Chemical group 0.000 description 3
- WQABCVAJNWAXTE-UHFFFAOYSA-N dimercaprol Chemical compound OCC(S)CS WQABCVAJNWAXTE-UHFFFAOYSA-N 0.000 description 3
- 239000003759 ester based solvent Substances 0.000 description 3
- 239000003574 free electron Substances 0.000 description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 3
- 229910052740 iodine Inorganic materials 0.000 description 3
- 239000005453 ketone based solvent Substances 0.000 description 3
- 229910000464 lead oxide Inorganic materials 0.000 description 3
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 3
- 235000011090 malic acid Nutrition 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- YEXPOXQUZXUXJW-UHFFFAOYSA-N oxolead Chemical compound [Pb]=O YEXPOXQUZXUXJW-UHFFFAOYSA-N 0.000 description 3
- 238000005192 partition Methods 0.000 description 3
- 229910052697 platinum Inorganic materials 0.000 description 3
- 125000002924 primary amino group Chemical group [H]N([H])* 0.000 description 3
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 3
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 3
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- 239000011787 zinc oxide Substances 0.000 description 3
- UKAUYVFTDYCKQA-UHFFFAOYSA-N -2-Amino-4-hydroxybutanoic acid Natural products OC(=O)C(N)CCO UKAUYVFTDYCKQA-UHFFFAOYSA-N 0.000 description 2
- DTRIDVOOPAQEEL-UHFFFAOYSA-N 4-sulfanylbutanoic acid Chemical compound OC(=O)CCCS DTRIDVOOPAQEEL-UHFFFAOYSA-N 0.000 description 2
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical group [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- XMWRBQBLMFGWIX-UHFFFAOYSA-N C60 fullerene Chemical class C12=C3C(C4=C56)=C7C8=C5C5=C9C%10=C6C6=C4C1=C1C4=C6C6=C%10C%10=C9C9=C%11C5=C8C5=C8C7=C3C3=C7C2=C1C1=C2C4=C6C4=C%10C6=C9C9=C%11C5=C5C8=C3C3=C7C1=C1C2=C4C6=C2C9=C5C3=C12 XMWRBQBLMFGWIX-UHFFFAOYSA-N 0.000 description 2
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
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- FEWJPZIEWOKRBE-JCYAYHJZSA-N Dextrotartaric acid Chemical compound OC(=O)[C@H](O)[C@@H](O)C(O)=O FEWJPZIEWOKRBE-JCYAYHJZSA-N 0.000 description 2
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- 125000002777 acetyl group Chemical group [H]C([H])([H])C(*)=O 0.000 description 2
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- KPWJBEFBFLRCLH-UHFFFAOYSA-L cadmium bromide Chemical compound Br[Cd]Br KPWJBEFBFLRCLH-UHFFFAOYSA-L 0.000 description 2
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- RQGPLDBZHMVWCH-UHFFFAOYSA-N pyrrolo[3,2-b]pyrrole Chemical class C1=NC2=CC=NC2=C1 RQGPLDBZHMVWCH-UHFFFAOYSA-N 0.000 description 1
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- ZMZDMBWJUHKJPS-UHFFFAOYSA-M thiocyanate group Chemical group [S-]C#N ZMZDMBWJUHKJPS-UHFFFAOYSA-M 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/30—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation comprising bulk heterojunctions, e.g. interpenetrating networks of donor and acceptor material domains
- H10K30/35—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation comprising bulk heterojunctions, e.g. interpenetrating networks of donor and acceptor material domains comprising inorganic nanostructures, e.g. CdSe nanoparticles
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/11—OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
- H10K50/115—OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers comprising active inorganic nanostructures, e.g. luminescent quantum dots
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
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Description
<1> 金属原子を含む半導体量子ドットQD1の集合体および上記半導体量子ドットQD1に配位する配位子L1を含む光電変換層と、
上記光電変換層上に配置された、金属原子を含む半導体量子ドットQD2の集合体および上記半導体量子ドットQD2に配位する配位子L2を含む正孔輸送層と、を有し、
上記半導体量子ドットQD2のバンドギャップEg2が上記半導体量子ドットQD1のバンドギャップEg1よりも大きく、かつ、上記半導体量子ドットQD2のバンドギャップEg2と上記半導体量子ドットQD1のバンドギャップEg1との差が0.10eV以上である、
光検出素子。
<2> 半導体量子ドットQD1および半導体量子ドットQD2は、それぞれPb原子を含む、<1>に記載の光検出素子。
<3> 半導体量子ドットQD1および半導体量子ドットQD2は、それぞれ同じ種類の半導体量子ドットを含む、<1>または<2>に記載の光検出素子。
<4> 上記半導体量子ドットQD1および半導体量子ドットQD2は、それぞれPbSを含む、<1>~<3>のいずれか1つに記載の光検出素子。
<5> 上記配位子L1および上記配位子L2は、ハロゲン原子を含む配位子および配位部を2以上含む多座配位子から選ばれる少なくとも1種を含む、<1>~<4>のいずれか1つに記載の光検出素子。
<6> 上記ハロゲン原子を含む配位子が無機ハロゲン化物である、<5>に記載の光検出素子。
<7> 上記無機ハロゲン化物はZn原子を含む、<6>に記載の光検出素子。
<8> 上記配位子L1はチオグリコール酸を含む、<1>~<7>のいずれか1つに記載の光検出素子。
<9> 上記配位子L2はチオール基を有する化合物を含む、<1>~<8>のいずれか1つに記載の光検出素子。
<10> フォトダイオード型の光検出素子である、<1>~<9>のいずれか1つに記載の光検出素子。
<11> <1>~<10>のいずれか1つに記載の光検出素子を含むイメージセンサ。
<12> 赤外線イメージセンサである、<11>に記載のイメージセンサ。
本明細書において、「~」とはその前後に記載される数値を下限値および上限値として含む意味で使用される。
本明細書における基(原子団)の表記において、置換および無置換を記していない表記は、置換基を有さない基(原子団)と共に置換基を有する基(原子団)をも包含する。例えば、「アルキル基」とは、置換基を有さないアルキル基(無置換アルキル基)のみならず、置換基を有するアルキル基(置換アルキル基)をも包含する。
本発明の光検出素子は、
金属原子を含む半導体量子ドットQD1の集合体および半導体量子ドットQD1に配位する配位子L1を含む光電変換層と、
光電変換層上に配置された、金属原子を含む半導体量子ドットQD2の集合体および半導体量子ドットQD2に配位する配位子L2を含む正孔輸送層と、を有し、
半導体量子ドットQD2のバンドギャップEg2が半導体量子ドットQD1のバンドギャップEg1よりも大きく、かつ、半導体量子ドットQD2のバンドギャップEg2と半導体量子ドットQD1のバンドギャップEg1との差が0.10eV以上である、
ことを特徴とする。
(ΔE2-ΔE1)≧0.1eV ・・・(1)
本発明の光検出素子の光電変換層は、金属原子を含む半導体量子ドットQD1の集合体を有する。なお、半導体量子ドットの集合体とは、多数(例えば、1μm2あたり100個以上)の半導体量子ドットが互いに近接して配置された形態をいう。また、本発明における「半導体」とは、比抵抗値が10-2Ωcm以上108Ωcm以下である物質を意味する。
LD1は炭化水素基を表す。
XE3は、S、OまたはNHを表し、
LE1およびLE2は、それぞれ独立して炭化水素基を表す。
XF4は、Nを表し、
LF1~LF3は、それぞれ独立して炭化水素基を表す。
式(b)において、[ML]は、金属原子と配位子が結合した錯体のモル濃度を表し、[M]は配位結合に寄与する金属原子のモル濃度を表し、[L]は配位子のモル濃度を表す。
本発明の光検出素子は、光電変換層上に、金属原子を含む半導体量子ドットQD2の集合体および半導体量子ドットQD2に配位する配位子L2を含む正孔輸送層(以下、正孔輸送層QDともいう)が配置されている。正孔輸送層とは、光電変換層で発生した正孔を電極へと輸送する機能を有する層である。正孔輸送層は電子ブロック層ともいわれている。本発明の光検出素子は、光電変換層の表面に正孔輸送層QDが配置されていることが好ましい。
0.10+m/2≦Lλ/λ≦0.30+m/2 ・・・(1-2)
Lλは、下部電極12の光電変換層13側の表面12aから、光電変換層13の上部電極層側の表面13aまでの波長λの光の光路長であり、
mは0以上の整数である。
また、光電変換層13と上部電極11との間にブロッキング層や電子輸送層が設けられていてもよい。
本発明のイメージセンサは、上述した本発明の光検出素子を含む。イメージセンサの構成としては、本発明の光検出素子を備え、イメージセンサとして機能する構成であれば特に限定はない。
(C1)赤色色材と青色色材とを含有する態様。
(C2)赤色色材と青色色材と黄色色材とを含有する態様。
(C3)赤色色材と青色色材と黄色色材と紫色色材とを含有する態様。
(C4)赤色色材と青色色材と黄色色材と紫色色材と緑色色材とを含有する態様。
(C5)赤色色材と青色色材と黄色色材と緑色色材とを含有する態様。
(C6)赤色色材と青色色材と緑色色材とを含有する態様。
(C7)黄色色材と紫色色材とを含有する態様。
(1):膜の厚み方向における光の透過率の、波長400~750nmの範囲における最大値が20%以下(好ましくは15%以下、より好ましくは10%以下)で、膜の厚み方向における光の透過率の、波長900~1500nmの範囲における最小値が70%以上(好ましくは75%以上、より好ましくは80%以上)であるフィルタ層。
(2):膜の厚み方向における光の透過率の、波長400~830nmの範囲における最大値が20%以下(好ましくは15%以下、より好ましくは10%以下)で、膜の厚み方向における光の透過率の、波長1000~1500nmの範囲における最小値が70%以上(好ましくは75%以上、より好ましくは80%以上)であるフィルタ層。
(3):膜の厚み方向における光の透過率の、波長400~950nmの範囲における最大値が20%以下(好ましくは15%以下、より好ましくは10%以下)で、膜の厚み方向における光の透過率の、波長1100~1500nmの範囲における最小値が70%以上(好ましくは75%以上、より好ましくは80%以上)であるフィルタ層。
(4):膜の厚み方向における光の透過率の、波長400~1100nmの範囲における最大値が20%以下(好ましくは15%以下、より好ましくは10%以下)で、波長1400~1500nmの範囲における最小値が70%以上(好ましくは75%以上、より好ましくは80%以上)であるフィルタ層。
(5):膜の厚み方向における光の透過率の、波長400~1300nmの範囲における最大値が20%以下(好ましくは15%以下、より好ましくは10%以下)で、波長1600~2000nmの範囲における最小値が70%以上(好ましくは75%以上、より好ましくは80%以上)であるフィルタ層。
(PbS量子ドットの分散液1)
フラスコ中に6.74mLのオレイン酸と、6.3mmolの酸化鉛と、30mLのオクタデセンを測りとり、真空下120℃で100分加熱することで、前駆体溶液を得た。その後、溶液の温度を100℃に調整し、次いで、系を窒素フロー状態にし、次いで、2.5mmolのヘキサメチルジシラチアンを5mLのオクタデセンと共に注入した。注入後1分保持した後、フラスコを自然冷却し、30℃になった段階でトルエン40mLを加え、溶液を回収した。溶液に過剰量のエタノールを加え、10000rpmで10分間遠心分離を行い、沈殿物をオクタンに分散させ、PbS量子ドットの表面にオレイン酸が配位子として配位したPbS量子ドットの分散液1(濃度40mg/mL)を得た。得られたPbS量子ドットの分散液1について、紫外可視近赤外分光光度計(日本分光(株)製、V-670)を用いた可視~赤外領域の光吸収測定から見積もったPbS量子ドットのバンドギャップはおよそ1.35eVであった。
酸化鉛とオレイン酸の比率、合成温度、ヘキサメチルジシラチアンの添加量を変更する以外は分散液1と同様の手法でPbS量子ドットの表面にオレイン酸が配位子として配位したPbS量子ドットの分散液2(濃度40mg/mL)を得た。得られたPbS量子ドットの分散液2について、紫外可視近赤外分光光度計(日本分光(株)製、V-670)を用いた可視~赤外領域の光吸収測定から見積もったPbS量子ドットのバンドギャップはおよそ1.55eVであった。
酸化鉛とオレイン酸の比率、合成温度、ヘキサメチルジシラチアンの添加量を変更する以外は分散液1と同様の手法でPbS量子ドットの表面にオレイン酸が配位子として配位したPbS量子ドットの分散液3(濃度40mg/mL)を得た。得られたPbS量子ドットの分散液3について、紫外可視近赤外分光光度計(日本分光(株)製、V-670)を用いた可視~赤外領域の光吸収測定から見積もったPbS量子ドットのバンドギャップはおよそ1.61eVであった。
[実施例1]
酸化インジウムスズ膜付き石英ガラス基板上に酸化チタン膜を50nmスパッタリングで成膜した。次に、上記のPbS量子ドットの分散液1を上記基板に成膜した酸化チタン膜上に滴下し、2500rpmでスピンコートして、PbS量子ドット集合体膜を形成した(工程PC1)。次いで、このPbS量子ドット集合体膜上に、配位子溶液として、ヨウ化亜鉛25mmol/Lのメタノール溶液と、3-メルカプトプロピオン酸0.01体積%のメタノール溶液を滴下した後、1分間静置し、2500rpmで20秒間スピンドライを行った。次いで、アセトニトリルをPbS量子ドット集合体膜上に滴下し、2500rpmで20秒間スピンドライを行い、PbS量子ドットに配位している配位子を、オレイン酸から3-メルカプトプロピオン酸およびヨウ化亜鉛に配位子交換した(工程PC2)。工程PC1と工程PC2とを1サイクルとする操作を10サイクル繰り返し、配位子がオレイン酸から3-メルカプトプロピオン酸およびヨウ化亜鉛に配位子交換されたPbS量子ドット集合体膜である光電変換層を200nmの厚さで形成した。
次に、この光電変換層上に、上記のPbS量子ドットの分散液3を滴下し、2500rpmでスピンコートして、PbS量子ドット集合体膜を形成した(工程HT1)。
次に、配位子溶液として、エタンジチオールの0.01体積%メタノール溶液を滴下した後、1分間静置し、2500rpmでスピンドライを行った。次いで、アセトニトリルをPbS量子ドット集合体膜上に滴下し、2500rpmで20秒間スピンドライを行い、PbS量子ドットに配位している配位子を、オレイン酸からエタンジチオールに配位子交換した(工程HT2)。工程HT1と工程HT2とを1サイクルとする操作を2サイクル繰り返し、配位子がオレイン酸からエタンジチオールに配位子交換されたPbS量子ドット集合体膜である正孔輸送層を40nmの厚さで形成した。
次に、正孔輸送層上に、金を100nmの厚さで蒸着により形成してフォトダイオード型の光検出素子を得た。
工程HT1においてPbS量子ドットの分散液3のかわりにPbS量子ドットの分散液1を用いたこと以外は実施例1と同様の手法でフォトダイオード型の光検出素子を得た。
製造した光検出素子について半導体パラメータアナライザー(C4156、Agilent製)を用いて、外部量子効率(EQE)および暗電流をそれぞれ測定した。
まず、光を照射しない状態において0Vから-5Vまで電圧を掃引しながら電流-電圧特性(I-V特性)を測定し、-2Vでの電流値を暗電流として評価した。
続いて、940nmのモノクロ光を照射した状態で、0Vから-5Vまで電圧を掃引しながらI-V特性を測定した。-2Vを印加した状態での光電流値から、外部量子効率(EQE)を算出した。
なお、暗電流は数値が小さいほど優れる。
工程HT1においてPbS量子ドットの分散液3のかわりにPbS量子ドットの分散液2を用いた以外は実施例1と同様の手法でフォトダイオード型の光検出素子を得た。
工程PC2において配位子溶液としてテトラブチルアンモニウムヨージド25mmol/Lのメタノール溶液を用いた以外は実施例1と同様の手法でフォトダイオード型の光検出素子を得た。
工程HT2において配位子溶液としてチオグリコール酸0.01体積%のメタノール溶液を用いた以外は実施例1と同様の手法でフォトダイオード型の光検出素子を得た。
工程HT2において配位子溶液として塩化鉛25mmol/Lのメタノール溶液と、エタンジチオール0.01体積%のメタノール溶液を用いた以外は実施例1と同様の手法でフォトダイオード型の光検出素子を得た。
11:上部電極
12:下部電極
13:光電変換層
14:正孔輸送層
Claims (12)
- 金属原子を含む半導体量子ドットQD1の集合体および前記半導体量子ドットQD1に配位する配位子L1を含む光電変換層と、
前記光電変換層上に配置された、金属原子を含む半導体量子ドットQD2の集合体および前記半導体量子ドットQD2に配位する配位子L2を含む正孔輸送層と、を有し、
前記半導体量子ドットQD1のバンドギャップEg1は、0.5~2.0eVであり、
前記半導体量子ドットQD2のバンドギャップEg2が前記半導体量子ドットQD1のバンドギャップEg1よりも大きく、かつ、前記半導体量子ドットQD2のバンドギャップEg2と前記半導体量子ドットQD1のバンドギャップEg1との差が0.10~1.0eVである、
光検出素子。 - 半導体量子ドットQD1および半導体量子ドットQD2は、それぞれPb原子を含む、請求項1に記載の光検出素子。
- 半導体量子ドットQD1および半導体量子ドットQD2は、それぞれ同じ種類の半導体量子ドットを含む、請求項1または2に記載の光検出素子。
- 前記半導体量子ドットQD1および半導体量子ドットQD2は、それぞれPbSを含む、請求項1~3のいずれか1項に記載の光検出素子。
- 前記配位子L1および前記配位子L2は、ハロゲン原子を含む配位子および配位部を2以上含む多座配位子から選ばれる少なくとも1種を含む、請求項1~4のいずれか1項に記載の光検出素子。
- 前記ハロゲン原子を含む配位子が無機ハロゲン化物である、請求項5に記載の光検出素子。
- 前記無機ハロゲン化物はZn原子を含む、請求項6に記載の光検出素子。
- 前記配位子L1はチオグリコール酸を含む、請求項1~7のいずれか1項に記載の光検出素子。
- 前記配位子L2はチオール基を有する化合物を含む、請求項1~8のいずれか1項に記載の光検出素子。
- フォトダイオード型の光検出素子である、請求項1~9のいずれか1項に記載の光検出素子。
- 請求項1~10のいずれか1項に記載の光検出素子を含むイメージセンサ。
- 赤外線イメージセンサである、請求項11に記載のイメージセンサ。
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