JP7332043B2 - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
JP7332043B2
JP7332043B2 JP2022522515A JP2022522515A JP7332043B2 JP 7332043 B2 JP7332043 B2 JP 7332043B2 JP 2022522515 A JP2022522515 A JP 2022522515A JP 2022522515 A JP2022522515 A JP 2022522515A JP 7332043 B2 JP7332043 B2 JP 7332043B2
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JP
Japan
Prior art keywords
opening
door
closing
hinge
hinge portion
Prior art date
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Active
Application number
JP2022522515A
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English (en)
Japanese (ja)
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JPWO2021229870A5 (https=
JPWO2021229870A1 (https=
Inventor
哲也 邊見
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of JPWO2021229870A1 publication Critical patent/JPWO2021229870A1/ja
Publication of JPWO2021229870A5 publication Critical patent/JPWO2021229870A5/ja
Application granted granted Critical
Publication of JP7332043B2 publication Critical patent/JP7332043B2/ja
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Classifications

    • E—FIXED CONSTRUCTIONS
    • E06—DOORS, WINDOWS, SHUTTERS, OR ROLLER BLINDS IN GENERAL; LADDERS
    • E06B—FIXED OR MOVABLE CLOSURES FOR OPENINGS IN BUILDINGS, VEHICLES, FENCES OR LIKE ENCLOSURES IN GENERAL, e.g. DOORS, WINDOWS, BLINDS, GATES
    • E06B5/00—Doors, windows, or like closures for special purposes; Border constructions therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • E—FIXED CONSTRUCTIONS
    • E06—DOORS, WINDOWS, SHUTTERS, OR ROLLER BLINDS IN GENERAL; LADDERS
    • E06B—FIXED OR MOVABLE CLOSURES FOR OPENINGS IN BUILDINGS, VEHICLES, FENCES OR LIKE ENCLOSURES IN GENERAL, e.g. DOORS, WINDOWS, BLINDS, GATES
    • E06B7/00—Special arrangements or measures in connection with doors or windows
    • E06B7/16—Sealing arrangements on wings or parts co-operating with the wings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7206—Mass spectrometers interfaced to gas chromatograph
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Civil Engineering (AREA)
  • Structural Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2022522515A 2020-05-14 2021-02-04 質量分析装置 Active JP7332043B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020085214 2020-05-14
JP2020085214 2020-05-14
PCT/JP2021/004092 WO2021229870A1 (ja) 2020-05-14 2021-02-04 質量分析装置

Publications (3)

Publication Number Publication Date
JPWO2021229870A1 JPWO2021229870A1 (https=) 2021-11-18
JPWO2021229870A5 JPWO2021229870A5 (https=) 2022-10-14
JP7332043B2 true JP7332043B2 (ja) 2023-08-23

Family

ID=78525776

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022522515A Active JP7332043B2 (ja) 2020-05-14 2021-02-04 質量分析装置

Country Status (4)

Country Link
US (1) US12460471B2 (https=)
JP (1) JP7332043B2 (https=)
CN (1) CN115280466B (https=)
WO (1) WO2021229870A1 (https=)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002250470A (ja) 2001-01-11 2002-09-06 Vat Holding Ag 真空バルブの弁プレート取付け装置
JP2008518214A (ja) 2004-10-28 2008-05-29 リザーランド，アルバート，エドワード 同重体干渉物を分離する方法および機器
JP2018091385A (ja) 2016-12-01 2018-06-14 株式会社島津製作所 バルブ

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0115980Y2 (https=) * 1984-08-31 1989-05-11
JPH10239225A (ja) * 1997-02-25 1998-09-11 Chiyoda Manufacturing Co Ltd 自動染色機のドア装置
JP2000349031A (ja) * 1999-05-27 2000-12-15 Applied Materials Inc 半導体製造装置
US6263542B1 (en) * 1999-06-22 2001-07-24 Lam Research Corporation Tolerance resistant and vacuum compliant door hinge with open-assist feature
JP3726777B2 (ja) 2002-05-29 2005-12-14 株式会社島津製作所 質量分析装置
EP2214025B1 (en) * 2007-10-29 2018-12-26 PHC Holdings Corporation Analysis device and analysis apparatus and method using the same
JP5359926B2 (ja) * 2010-02-23 2013-12-04 株式会社島津製作所 質量分析装置
JP6263407B2 (ja) * 2014-02-10 2018-01-17 光洋サーモシステム株式会社 熱処理装置
JP3208331U (ja) * 2016-10-25 2017-01-05 株式会社島津製作所 密閉室及びそれを備える質量分析装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002250470A (ja) 2001-01-11 2002-09-06 Vat Holding Ag 真空バルブの弁プレート取付け装置
JP2008518214A (ja) 2004-10-28 2008-05-29 リザーランド，アルバート，エドワード 同重体干渉物を分離する方法および機器
JP2018091385A (ja) 2016-12-01 2018-06-14 株式会社島津製作所 バルブ

Also Published As

Publication number Publication date
US12460471B2 (en) 2025-11-04
US20230147319A1 (en) 2023-05-11
JPWO2021229870A1 (https=) 2021-11-18
CN115280466A (zh) 2022-11-01
CN115280466B (zh) 2025-08-26
WO2021229870A1 (ja) 2021-11-18

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