JPWO2021229870A1 - - Google Patents

Info

Publication number
JPWO2021229870A1
JPWO2021229870A1 JP2022522515A JP2022522515A JPWO2021229870A1 JP WO2021229870 A1 JPWO2021229870 A1 JP WO2021229870A1 JP 2022522515 A JP2022522515 A JP 2022522515A JP 2022522515 A JP2022522515 A JP 2022522515A JP WO2021229870 A1 JPWO2021229870 A1 JP WO2021229870A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022522515A
Other languages
Japanese (ja)
Other versions
JP7332043B2 (ja
JPWO2021229870A5 (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021229870A1 publication Critical patent/JPWO2021229870A1/ja
Publication of JPWO2021229870A5 publication Critical patent/JPWO2021229870A5/ja
Application granted granted Critical
Publication of JP7332043B2 publication Critical patent/JP7332043B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • E—FIXED CONSTRUCTIONS
    • E06—DOORS, WINDOWS, SHUTTERS, OR ROLLER BLINDS IN GENERAL; LADDERS
    • E06B—FIXED OR MOVABLE CLOSURES FOR OPENINGS IN BUILDINGS, VEHICLES, FENCES OR LIKE ENCLOSURES IN GENERAL, e.g. DOORS, WINDOWS, BLINDS, GATES
    • E06B5/00—Doors, windows, or like closures for special purposes; Border constructions therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • E—FIXED CONSTRUCTIONS
    • E06—DOORS, WINDOWS, SHUTTERS, OR ROLLER BLINDS IN GENERAL; LADDERS
    • E06B—FIXED OR MOVABLE CLOSURES FOR OPENINGS IN BUILDINGS, VEHICLES, FENCES OR LIKE ENCLOSURES IN GENERAL, e.g. DOORS, WINDOWS, BLINDS, GATES
    • E06B7/00—Special arrangements or measures in connection with doors or windows
    • E06B7/16—Sealing arrangements on wings or parts co-operating with the wings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7206—Mass spectrometers interfaced to gas chromatograph
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Civil Engineering (AREA)
  • Structural Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2022522515A 2020-05-14 2021-02-04 質量分析装置 Active JP7332043B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020085214 2020-05-14
JP2020085214 2020-05-14
PCT/JP2021/004092 WO2021229870A1 (ja) 2020-05-14 2021-02-04 質量分析装置

Publications (3)

Publication Number Publication Date
JPWO2021229870A1 true JPWO2021229870A1 (https=) 2021-11-18
JPWO2021229870A5 JPWO2021229870A5 (https=) 2022-10-14
JP7332043B2 JP7332043B2 (ja) 2023-08-23

Family

ID=78525776

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022522515A Active JP7332043B2 (ja) 2020-05-14 2021-02-04 質量分析装置

Country Status (4)

Country Link
US (1) US12460471B2 (https=)
JP (1) JP7332043B2 (https=)
CN (1) CN115280466B (https=)
WO (1) WO2021229870A1 (https=)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002250470A (ja) * 2001-01-11 2002-09-06 Vat Holding Ag 真空バルブの弁プレート取付け装置
JP2008518214A (ja) * 2004-10-28 2008-05-29 リザーランド，アルバート，エドワード 同重体干渉物を分離する方法および機器
JP2018091385A (ja) * 2016-12-01 2018-06-14 株式会社島津製作所 バルブ

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0115980Y2 (https=) * 1984-08-31 1989-05-11
JPH10239225A (ja) * 1997-02-25 1998-09-11 Chiyoda Manufacturing Co Ltd 自動染色機のドア装置
JP2000349031A (ja) * 1999-05-27 2000-12-15 Applied Materials Inc 半導体製造装置
US6263542B1 (en) * 1999-06-22 2001-07-24 Lam Research Corporation Tolerance resistant and vacuum compliant door hinge with open-assist feature
JP3726777B2 (ja) 2002-05-29 2005-12-14 株式会社島津製作所 質量分析装置
EP2214025B1 (en) * 2007-10-29 2018-12-26 PHC Holdings Corporation Analysis device and analysis apparatus and method using the same
JP5359926B2 (ja) * 2010-02-23 2013-12-04 株式会社島津製作所 質量分析装置
JP6263407B2 (ja) * 2014-02-10 2018-01-17 光洋サーモシステム株式会社 熱処理装置
JP3208331U (ja) * 2016-10-25 2017-01-05 株式会社島津製作所 密閉室及びそれを備える質量分析装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002250470A (ja) * 2001-01-11 2002-09-06 Vat Holding Ag 真空バルブの弁プレート取付け装置
JP2008518214A (ja) * 2004-10-28 2008-05-29 リザーランド，アルバート，エドワード 同重体干渉物を分離する方法および機器
JP2018091385A (ja) * 2016-12-01 2018-06-14 株式会社島津製作所 バルブ

Also Published As

Publication number Publication date
US12460471B2 (en) 2025-11-04
JP7332043B2 (ja) 2023-08-23
US20230147319A1 (en) 2023-05-11
CN115280466A (zh) 2022-11-01
CN115280466B (zh) 2025-08-26
WO2021229870A1 (ja) 2021-11-18

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