JP7328454B2 - 測定装置 - Google Patents

測定装置 Download PDF

Info

Publication number
JP7328454B2
JP7328454B2 JP2022532257A JP2022532257A JP7328454B2 JP 7328454 B2 JP7328454 B2 JP 7328454B2 JP 2022532257 A JP2022532257 A JP 2022532257A JP 2022532257 A JP2022532257 A JP 2022532257A JP 7328454 B2 JP7328454 B2 JP 7328454B2
Authority
JP
Japan
Prior art keywords
distance
taper gauge
measurement
measured
digital
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2022532257A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2021255969A1 (https=
Inventor
隆幸 田村
健生 山▲崎▼
友貴 ▲高▼谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Docomo Inc
Original Assignee
NTT Docomo Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NTT Docomo Inc filed Critical NTT Docomo Inc
Publication of JPWO2021255969A1 publication Critical patent/JPWO2021255969A1/ja
Application granted granted Critical
Publication of JP7328454B2 publication Critical patent/JP7328454B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/30Measuring arrangements characterised by the use of electric or magnetic techniques for measuring angles or tapers; for testing the alignment of axes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2022532257A 2020-06-17 2021-01-06 測定装置 Active JP7328454B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020104491 2020-06-17
JP2020104491 2020-06-17
PCT/JP2021/000247 WO2021255969A1 (ja) 2020-06-17 2021-01-06 測定装置

Publications (2)

Publication Number Publication Date
JPWO2021255969A1 JPWO2021255969A1 (https=) 2021-12-23
JP7328454B2 true JP7328454B2 (ja) 2023-08-16

Family

ID=79267732

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022532257A Active JP7328454B2 (ja) 2020-06-17 2021-01-06 測定装置

Country Status (2)

Country Link
JP (1) JP7328454B2 (https=)
WO (1) WO2021255969A1 (https=)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101806571A (zh) 2010-03-31 2010-08-18 欧俊 安全钳间隙测量尺

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0447608U (https=) * 1990-08-27 1992-04-22
JPH08178609A (ja) * 1994-12-20 1996-07-12 Chubu Plant Service:Kk 首振り式間隙測定装置
JPH10332305A (ja) * 1997-05-27 1998-12-18 Toshiba Corp タービン間隙自動計測装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101806571A (zh) 2010-03-31 2010-08-18 欧俊 安全钳间隙测量尺

Also Published As

Publication number Publication date
JPWO2021255969A1 (https=) 2021-12-23
WO2021255969A1 (ja) 2021-12-23

Similar Documents

Publication Publication Date Title
CN108415024B (zh) 接近传感器校准方法、装置、移动终端及计算机可读介质
CN107943345B (zh) 接近传感器的校准方法、装置、存储介质和电子设备
AU2018262947B2 (en) Optical fingerprint verification method and mobile terminal
CN106323353B (zh) 一种接近传感器的校准方法、装置和终端
TWI462619B (zh) 在動態傳輸功率控制存取點處之基於接收信號強度指示之室內定位
WO2018210145A1 (zh) 一种息屏控制方法、装置、存储介质和电子设备
CN108279408B (zh) 接近传感器校准方法、装置、移动终端及计算机可读介质
CN107942306B (zh) 接近传感器的校准方法、装置、存储介质和电子设备
CN106598358B (zh) 接近检测方法、装置及终端
US8358268B2 (en) Multi-touch detection
US10514458B2 (en) Detection system, detection device, and detection method
JP2015087356A (ja) 位置情報取得システム、端末及びその方法
CN106487984B (zh) 一种调整音量的方法和装置
CN109391307B (zh) 一种天线波束侦测系统、方法及移动终端
WO2021238452A1 (zh) 一种确定密切接触者的方法、终端设备及服务器
US20130281025A1 (en) Facilitating the initiation of a wireless communication session
JP7328454B2 (ja) 測定装置
US20200015190A1 (en) Positioning Cycle Adjustment Method and Apparatus
CN113516870B (zh) 待泊车位确定方法、装置、自动泊车设备和存储介质
CN115529529A (zh) 音响设备位置确定方法和系统、装置及存储介质
CN113826066B (zh) 显示器属性的无线配置
CN112445289A (zh) 可折叠式电子设备和折叠角度检测方法
CN113347710B (zh) 一种定位方法和相关装置
JP2019164015A (ja) 閾値決定方法、電波送受信システムおよびプログラム
JP2020148543A (ja) 位置特定装置、位置特定システム、およびプログラム

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20221019

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20230725

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20230803

R150 Certificate of patent or registration of utility model

Ref document number: 7328454

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150