JP7301662B2 - 基板処理方法および基板処理装置 - Google Patents
基板処理方法および基板処理装置 Download PDFInfo
- Publication number
- JP7301662B2 JP7301662B2 JP2019138966A JP2019138966A JP7301662B2 JP 7301662 B2 JP7301662 B2 JP 7301662B2 JP 2019138966 A JP2019138966 A JP 2019138966A JP 2019138966 A JP2019138966 A JP 2019138966A JP 7301662 B2 JP7301662 B2 JP 7301662B2
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- JP
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- Prior art keywords
- liquid
- substrate
- liquid film
- film
- nozzle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
- B05C11/02—Apparatus for spreading or distributing liquids or other fluent materials already applied to a surface ; Controlling means therefor; Control of the thickness of a coating by spreading or distributing liquids or other fluent materials already applied to the coated surface
- B05C11/06—Apparatus for spreading or distributing liquids or other fluent materials already applied to a surface ; Controlling means therefor; Control of the thickness of a coating by spreading or distributing liquids or other fluent materials already applied to the coated surface with a blast of gas or vapour
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0408—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/20—Cleaning during device manufacture
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/007—After-treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D7/00—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials
- B05D7/50—Multilayers
- B05D7/56—Three layers or more
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B5/00—Drying solid materials or objects by processes not involving the application of heat
- F26B5/08—Drying solid materials or objects by processes not involving the application of heat by centrifugal treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0414—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
Landscapes
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Wood Science & Technology (AREA)
- Health & Medical Sciences (AREA)
- Molecular Biology (AREA)
- Mechanical Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019138966A JP7301662B2 (ja) | 2019-07-29 | 2019-07-29 | 基板処理方法および基板処理装置 |
| US16/935,204 US11524314B2 (en) | 2019-07-29 | 2020-07-22 | Substrate processing method and substrate processing device |
| CN202010708287.9A CN112309903B (zh) | 2019-07-29 | 2020-07-22 | 基板处理方法及基板处理装置 |
| KR1020200091383A KR102412306B1 (ko) | 2019-07-29 | 2020-07-23 | 기판 처리방법 및 기판 처리장치 |
| TW109125222A TWI728881B (zh) | 2019-07-29 | 2020-07-27 | 基板處理方法及基板處理裝置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019138966A JP7301662B2 (ja) | 2019-07-29 | 2019-07-29 | 基板処理方法および基板処理装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2021022671A JP2021022671A (ja) | 2021-02-18 |
| JP2021022671A5 JP2021022671A5 (cg-RX-API-DMAC10.html) | 2021-05-13 |
| JP7301662B2 true JP7301662B2 (ja) | 2023-07-03 |
Family
ID=74258530
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019138966A Active JP7301662B2 (ja) | 2019-07-29 | 2019-07-29 | 基板処理方法および基板処理装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US11524314B2 (cg-RX-API-DMAC10.html) |
| JP (1) | JP7301662B2 (cg-RX-API-DMAC10.html) |
| KR (1) | KR102412306B1 (cg-RX-API-DMAC10.html) |
| CN (1) | CN112309903B (cg-RX-API-DMAC10.html) |
| TW (1) | TWI728881B (cg-RX-API-DMAC10.html) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102905150B1 (ko) * | 2021-10-14 | 2025-12-30 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
| KR102889410B1 (ko) | 2021-10-14 | 2025-11-24 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
| JP2025006094A (ja) * | 2023-06-29 | 2025-01-17 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
| JP2025030911A (ja) * | 2023-08-24 | 2025-03-07 | 株式会社Screenホールディングス | 基板処理装置および基板処理方法 |
| JP2025033160A (ja) * | 2023-08-29 | 2025-03-13 | 株式会社Screenホールディングス | 基板処理方法 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008091364A (ja) | 2006-09-29 | 2008-04-17 | Dainippon Screen Mfg Co Ltd | 基板処理方法および基板処理装置 |
| JP2008153452A (ja) | 2006-12-18 | 2008-07-03 | Dainippon Screen Mfg Co Ltd | 基板処理方法および基板処理装置 |
| JP2016186971A (ja) | 2015-03-27 | 2016-10-27 | 株式会社Screenホールディングス | 基板処理装置および基板処理方法 |
| JP2017183634A (ja) | 2016-03-31 | 2017-10-05 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
| JP2019057625A (ja) | 2017-09-21 | 2019-04-11 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
| JP2019102698A (ja) | 2017-12-05 | 2019-06-24 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008034553A (ja) | 2006-07-27 | 2008-02-14 | Dainippon Screen Mfg Co Ltd | 基板保持装置 |
| JP2010050143A (ja) | 2008-08-19 | 2010-03-04 | Dainippon Screen Mfg Co Ltd | 基板処理方法および基板処理装置 |
| JP4927158B2 (ja) | 2009-12-25 | 2012-05-09 | 東京エレクトロン株式会社 | 基板処理方法、その基板処理方法を実行させるためのプログラムを記録した記録媒体及び基板処理装置 |
| JP6223839B2 (ja) * | 2013-03-15 | 2017-11-01 | 東京エレクトロン株式会社 | 基板液処理方法、基板液処理装置および記憶媒体 |
| JP6376554B2 (ja) * | 2014-03-26 | 2018-08-22 | 株式会社Screenホールディングス | 基板処理装置 |
| US10249487B2 (en) * | 2015-01-23 | 2019-04-02 | SCREEN Holdings Co., Ltd. | Substrate processing method |
| JP6592303B2 (ja) | 2015-08-14 | 2019-10-16 | 株式会社Screenホールディングス | 基板洗浄方法および基板洗浄装置 |
| JP6642868B2 (ja) | 2015-08-18 | 2020-02-12 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
| US20180204743A1 (en) | 2015-08-18 | 2018-07-19 | SCREEN Holdings Co., Ltd. | Substrate treatment method and substrate treatment device |
| JP6613181B2 (ja) * | 2016-03-17 | 2019-11-27 | 株式会社Screenホールディングス | 基板処理装置および基板処理方法 |
| KR102336394B1 (ko) | 2017-03-17 | 2021-12-08 | 현대자동차주식회사 | 연료전지 공기 공급 제어방법 및 시스템 |
| JP7208091B2 (ja) | 2019-04-18 | 2023-01-18 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
-
2019
- 2019-07-29 JP JP2019138966A patent/JP7301662B2/ja active Active
-
2020
- 2020-07-22 US US16/935,204 patent/US11524314B2/en active Active
- 2020-07-22 CN CN202010708287.9A patent/CN112309903B/zh active Active
- 2020-07-23 KR KR1020200091383A patent/KR102412306B1/ko active Active
- 2020-07-27 TW TW109125222A patent/TWI728881B/zh active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008091364A (ja) | 2006-09-29 | 2008-04-17 | Dainippon Screen Mfg Co Ltd | 基板処理方法および基板処理装置 |
| JP2008153452A (ja) | 2006-12-18 | 2008-07-03 | Dainippon Screen Mfg Co Ltd | 基板処理方法および基板処理装置 |
| JP2016186971A (ja) | 2015-03-27 | 2016-10-27 | 株式会社Screenホールディングス | 基板処理装置および基板処理方法 |
| JP2017183634A (ja) | 2016-03-31 | 2017-10-05 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
| JP2019057625A (ja) | 2017-09-21 | 2019-04-11 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
| JP2019102698A (ja) | 2017-12-05 | 2019-06-24 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US11524314B2 (en) | 2022-12-13 |
| CN112309903B (zh) | 2024-09-06 |
| KR20210014077A (ko) | 2021-02-08 |
| US20210031228A1 (en) | 2021-02-04 |
| TW202105572A (zh) | 2021-02-01 |
| JP2021022671A (ja) | 2021-02-18 |
| TWI728881B (zh) | 2021-05-21 |
| CN112309903A (zh) | 2021-02-02 |
| KR102412306B1 (ko) | 2022-06-22 |
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