CN112309903B - 基板处理方法及基板处理装置 - Google Patents
基板处理方法及基板处理装置 Download PDFInfo
- Publication number
- CN112309903B CN112309903B CN202010708287.9A CN202010708287A CN112309903B CN 112309903 B CN112309903 B CN 112309903B CN 202010708287 A CN202010708287 A CN 202010708287A CN 112309903 B CN112309903 B CN 112309903B
- Authority
- CN
- China
- Prior art keywords
- liquid
- substrate
- liquid film
- film
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
- B05C11/02—Apparatus for spreading or distributing liquids or other fluent materials already applied to a surface ; Controlling means therefor; Control of the thickness of a coating by spreading or distributing liquids or other fluent materials already applied to the coated surface
- B05C11/06—Apparatus for spreading or distributing liquids or other fluent materials already applied to a surface ; Controlling means therefor; Control of the thickness of a coating by spreading or distributing liquids or other fluent materials already applied to the coated surface with a blast of gas or vapour
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0408—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/20—Cleaning during device manufacture
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/007—After-treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D7/00—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials
- B05D7/50—Multilayers
- B05D7/56—Three layers or more
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B5/00—Drying solid materials or objects by processes not involving the application of heat
- F26B5/08—Drying solid materials or objects by processes not involving the application of heat by centrifugal treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0414—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
Landscapes
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Wood Science & Technology (AREA)
- Health & Medical Sciences (AREA)
- Molecular Biology (AREA)
- Mechanical Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019138966A JP7301662B2 (ja) | 2019-07-29 | 2019-07-29 | 基板処理方法および基板処理装置 |
| JP2019-138966 | 2019-07-29 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112309903A CN112309903A (zh) | 2021-02-02 |
| CN112309903B true CN112309903B (zh) | 2024-09-06 |
Family
ID=74258530
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010708287.9A Active CN112309903B (zh) | 2019-07-29 | 2020-07-22 | 基板处理方法及基板处理装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US11524314B2 (cg-RX-API-DMAC10.html) |
| JP (1) | JP7301662B2 (cg-RX-API-DMAC10.html) |
| KR (1) | KR102412306B1 (cg-RX-API-DMAC10.html) |
| CN (1) | CN112309903B (cg-RX-API-DMAC10.html) |
| TW (1) | TWI728881B (cg-RX-API-DMAC10.html) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102905150B1 (ko) * | 2021-10-14 | 2025-12-30 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
| KR102889410B1 (ko) | 2021-10-14 | 2025-11-24 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
| JP2025006094A (ja) * | 2023-06-29 | 2025-01-17 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
| JP2025030911A (ja) * | 2023-08-24 | 2025-03-07 | 株式会社Screenホールディングス | 基板処理装置および基板処理方法 |
| JP2025033160A (ja) * | 2023-08-29 | 2025-03-13 | 株式会社Screenホールディングス | 基板処理方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105826219A (zh) * | 2015-01-23 | 2016-08-03 | 株式会社思可林集团 | 基板处理方法、基板处理装置和流体喷嘴 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008034553A (ja) | 2006-07-27 | 2008-02-14 | Dainippon Screen Mfg Co Ltd | 基板保持装置 |
| JP2008091364A (ja) * | 2006-09-29 | 2008-04-17 | Dainippon Screen Mfg Co Ltd | 基板処理方法および基板処理装置 |
| JP4960075B2 (ja) | 2006-12-18 | 2012-06-27 | 大日本スクリーン製造株式会社 | 基板処理方法および基板処理装置 |
| JP2010050143A (ja) | 2008-08-19 | 2010-03-04 | Dainippon Screen Mfg Co Ltd | 基板処理方法および基板処理装置 |
| JP4927158B2 (ja) | 2009-12-25 | 2012-05-09 | 東京エレクトロン株式会社 | 基板処理方法、その基板処理方法を実行させるためのプログラムを記録した記録媒体及び基板処理装置 |
| JP6223839B2 (ja) * | 2013-03-15 | 2017-11-01 | 東京エレクトロン株式会社 | 基板液処理方法、基板液処理装置および記憶媒体 |
| JP6376554B2 (ja) * | 2014-03-26 | 2018-08-22 | 株式会社Screenホールディングス | 基板処理装置 |
| JP6453688B2 (ja) | 2015-03-27 | 2019-01-16 | 株式会社Screenホールディングス | 基板処理装置および基板処理方法 |
| JP6592303B2 (ja) | 2015-08-14 | 2019-10-16 | 株式会社Screenホールディングス | 基板洗浄方法および基板洗浄装置 |
| JP6642868B2 (ja) | 2015-08-18 | 2020-02-12 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
| US20180204743A1 (en) | 2015-08-18 | 2018-07-19 | SCREEN Holdings Co., Ltd. | Substrate treatment method and substrate treatment device |
| JP6613181B2 (ja) * | 2016-03-17 | 2019-11-27 | 株式会社Screenホールディングス | 基板処理装置および基板処理方法 |
| JP6671217B2 (ja) | 2016-03-31 | 2020-03-25 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
| KR102336394B1 (ko) | 2017-03-17 | 2021-12-08 | 현대자동차주식회사 | 연료전지 공기 공급 제어방법 및 시스템 |
| JP6953255B2 (ja) | 2017-09-21 | 2021-10-27 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
| JP7008489B2 (ja) | 2017-12-05 | 2022-01-25 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
| JP7208091B2 (ja) | 2019-04-18 | 2023-01-18 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
-
2019
- 2019-07-29 JP JP2019138966A patent/JP7301662B2/ja active Active
-
2020
- 2020-07-22 US US16/935,204 patent/US11524314B2/en active Active
- 2020-07-22 CN CN202010708287.9A patent/CN112309903B/zh active Active
- 2020-07-23 KR KR1020200091383A patent/KR102412306B1/ko active Active
- 2020-07-27 TW TW109125222A patent/TWI728881B/zh active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105826219A (zh) * | 2015-01-23 | 2016-08-03 | 株式会社思可林集团 | 基板处理方法、基板处理装置和流体喷嘴 |
Also Published As
| Publication number | Publication date |
|---|---|
| US11524314B2 (en) | 2022-12-13 |
| KR20210014077A (ko) | 2021-02-08 |
| US20210031228A1 (en) | 2021-02-04 |
| TW202105572A (zh) | 2021-02-01 |
| JP2021022671A (ja) | 2021-02-18 |
| TWI728881B (zh) | 2021-05-21 |
| JP7301662B2 (ja) | 2023-07-03 |
| CN112309903A (zh) | 2021-02-02 |
| KR102412306B1 (ko) | 2022-06-22 |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |