JP7267865B2 - 分析装置及び分析方法 - Google Patents

分析装置及び分析方法 Download PDF

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Publication number
JP7267865B2
JP7267865B2 JP2019133863A JP2019133863A JP7267865B2 JP 7267865 B2 JP7267865 B2 JP 7267865B2 JP 2019133863 A JP2019133863 A JP 2019133863A JP 2019133863 A JP2019133863 A JP 2019133863A JP 7267865 B2 JP7267865 B2 JP 7267865B2
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abnormality
analysis
analyzer
unit
potential
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Japanese (ja)
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JP2021018141A5 (enExample
JP2021018141A (ja
Inventor
祐福 松下
淳史 岸岡
遇哲 山本
雅文 三宅
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Hitachi High Tech Corp
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Hitachi High Tech Corp
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Priority to JP2019133863A priority Critical patent/JP7267865B2/ja
Priority to EP20842677.5A priority patent/EP4001910A4/en
Priority to US17/627,910 priority patent/US12474295B2/en
Priority to PCT/JP2020/015773 priority patent/WO2021014695A1/ja
Priority to CN202080049766.2A priority patent/CN114127549B/zh
Publication of JP2021018141A publication Critical patent/JP2021018141A/ja
Publication of JP2021018141A5 publication Critical patent/JP2021018141A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416—Systems
    • G01N27/4163—Systems checking the operation of, or calibrating, the measuring apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/28—Electrolytic cell components
    • G01N27/30—Electrodes, e.g. test electrodes; Half-cells
    • G01N27/333—Ion-selective electrodes or membranes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/38—Diluting, dispersing or mixing samples
    • G01N2001/386—Other diluting or mixing processes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
    • G01N33/483—Physical analysis of biological material
    • G01N33/487—Physical analysis of biological material of liquid biological material
    • G01N33/49—Blood
    • G01N33/492—Determining multiple analytes

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  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Molecular Biology (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2019133863A 2019-07-19 2019-07-19 分析装置及び分析方法 Active JP7267865B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2019133863A JP7267865B2 (ja) 2019-07-19 2019-07-19 分析装置及び分析方法
EP20842677.5A EP4001910A4 (en) 2019-07-19 2020-04-08 ANALYTICAL DEVICE AND ANALYTICAL METHOD
US17/627,910 US12474295B2 (en) 2019-07-19 2020-04-08 Analysis device and analysis method
PCT/JP2020/015773 WO2021014695A1 (ja) 2019-07-19 2020-04-08 分析装置及び分析方法
CN202080049766.2A CN114127549B (zh) 2019-07-19 2020-04-08 分析装置以及分析方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019133863A JP7267865B2 (ja) 2019-07-19 2019-07-19 分析装置及び分析方法

Publications (3)

Publication Number Publication Date
JP2021018141A JP2021018141A (ja) 2021-02-15
JP2021018141A5 JP2021018141A5 (enExample) 2022-01-06
JP7267865B2 true JP7267865B2 (ja) 2023-05-02

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JP2019133863A Active JP7267865B2 (ja) 2019-07-19 2019-07-19 分析装置及び分析方法

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US (1) US12474295B2 (enExample)
EP (1) EP4001910A4 (enExample)
JP (1) JP7267865B2 (enExample)
CN (1) CN114127549B (enExample)
WO (1) WO2021014695A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2022196713A1 (enExample) * 2021-03-19 2022-09-22
US20250146972A1 (en) * 2022-02-18 2025-05-08 Hitachi High-Tech Corporation Electrolyte concentration measuring device and method for obtaining selectivity coefficient
JP2023120955A (ja) * 2022-02-18 2023-08-30 オムロンヘルスケア株式会社 電解液分析装置および電解液分析方法
JP7439853B2 (ja) * 2022-03-28 2024-02-28 横河電機株式会社 制御装置、濁度計、判定方法、及び学習方法
JP2023166170A (ja) * 2022-05-09 2023-11-21 株式会社日立ハイテク 分析装置および状態検知方法
WO2024154466A1 (ja) * 2023-01-16 2024-07-25 株式会社堀場アドバンスドテクノ イオン濃度測定装置、イオン濃度測定プログラム、イオン濃度測定方法、測定装置、及び、測定方法
WO2025018126A1 (ja) * 2023-07-19 2025-01-23 株式会社日立ハイテク 分析装置および異常の有無を判定する方法
WO2025084072A1 (ja) * 2023-10-16 2025-04-24 株式会社島津製作所 分析異常診断システム及び分析異常診断方法

Citations (4)

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JP2006258800A (ja) 2005-02-16 2006-09-28 Ngk Spark Plug Co Ltd ガス濃度検出ユニットの異常診断方法及びガス濃度検出ユニットの異常診断装置
JP2009121817A (ja) 2007-11-09 2009-06-04 Olympus Corp 分析装置
JP2014514093A (ja) 2011-04-15 2014-06-19 デックスコム・インコーポレーテッド 先進的な検体センサの較正及びエラー検出
JP2017500942A (ja) 2013-12-16 2017-01-12 メドトロニック・ミニメッド・インコーポレーテッド 直交冗長センサの信頼性を改善する方法およびシステム

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DE3115404A1 (de) * 1981-04-16 1982-11-11 Robert Bosch Gmbh, 7000 Stuttgart Verfahren und vorrichtung zur ueberwachung und kalibrierung von grenzstromsonden
EP0074198A1 (en) * 1981-08-21 1983-03-16 EASTMAN KODAK COMPANY (a New Jersey corporation) Hydrogen ion-selective membranes and electrodes containing same
JPH0376161U (enExample) * 1989-11-29 1991-07-30
US5284568A (en) * 1992-07-17 1994-02-08 E. I. Du Pont De Nemours And Company Disposable cartridge for ion selective electrode sensors
JP4552423B2 (ja) * 2003-11-21 2010-09-29 パナソニック株式会社 細胞外電位測定デバイスおよびこれを用いた細胞外電位の測定方法
CA3171720C (en) * 2002-12-26 2024-01-09 Meso Scale Technologies, Llc. Methods for conducting electrochemiluminescence measurements
US20060096860A1 (en) * 2004-11-10 2006-05-11 Stein Israel M Analyte recognition system
EP1906178A1 (en) * 2006-09-26 2008-04-02 F.Hoffmann-La Roche Ag Method for detecting erroneous measurement results obtained with ion-selective electrodes
JP4918846B2 (ja) * 2006-11-22 2012-04-18 株式会社日立製作所 質量分析装置及び質量分析方法
GB0711780D0 (en) * 2007-06-18 2007-07-25 Oxford Biosensors Ltd Electrochemical data rejection methodology
JP5297951B2 (ja) * 2009-09-04 2013-09-25 株式会社日立製作所 防食データ解析システム
JP5099264B2 (ja) * 2009-09-18 2012-12-19 日立化成工業株式会社 自動分析装置
JP5331669B2 (ja) 2009-12-08 2013-10-30 株式会社日立ハイテクノロジーズ 電解質分析装置
JP2012202948A (ja) * 2011-03-28 2012-10-22 Dkk Toa Corp 自動測定装置
JP5845154B2 (ja) * 2012-08-08 2016-01-20 国立研究開発法人農業・食品産業技術総合研究機構 生体数モデル生成装置、生体数モデル生成方法、サイトメーター、および、プログラム
JP5965248B2 (ja) * 2012-08-22 2016-08-03 株式会社日立ハイテクノロジーズ 電解質分析装置
JP2016114391A (ja) * 2014-12-11 2016-06-23 凸版印刷株式会社 電気銅めっき液分析装置、及び電気銅めっき液分析方法
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JP6896684B2 (ja) 2018-09-13 2021-06-30 株式会社日立ハイテク 電解質濃度測定装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006258800A (ja) 2005-02-16 2006-09-28 Ngk Spark Plug Co Ltd ガス濃度検出ユニットの異常診断方法及びガス濃度検出ユニットの異常診断装置
JP2009121817A (ja) 2007-11-09 2009-06-04 Olympus Corp 分析装置
JP2014514093A (ja) 2011-04-15 2014-06-19 デックスコム・インコーポレーテッド 先進的な検体センサの較正及びエラー検出
JP2017500942A (ja) 2013-12-16 2017-01-12 メドトロニック・ミニメッド・インコーポレーテッド 直交冗長センサの信頼性を改善する方法およびシステム

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Title
TLV，ポータブル振動計（ハイエンド）ビブエキスパートII，カタログ，2019年06月20日，Rev. 2019/6/20，第1,3頁，[オンライン], 2019.6.20 [検索日 2020.06.18], インターネット:<URL: https://www.tlv.com/wp_tlv_handleWithCare/wp-content/themes/tlv/tlv_assets/product_v2/catalog/pdf/maintenance_apparatus_list.pdf >，第1,3頁

Also Published As

Publication number Publication date
US20220404310A1 (en) 2022-12-22
EP4001910A1 (en) 2022-05-25
JP2021018141A (ja) 2021-02-15
EP4001910A4 (en) 2023-08-02
CN114127549B (zh) 2024-08-16
CN114127549A (zh) 2022-03-01
US12474295B2 (en) 2025-11-18
WO2021014695A1 (ja) 2021-01-28

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