JP7263292B2 - 基板処理装置及び基板処理方法 - Google Patents
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- H—ELECTRICITY
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67126—Apparatus for sealing, encapsulating, glassing, decapsulating or the like
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K9/00—Screening of apparatus or components against electric or magnetic fields
- H05K9/0067—Devices for protecting against damage from electrostatic discharge
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
- B05C11/02—Apparatus for spreading or distributing liquids or other fluent materials already applied to a surface ; Controlling means therefor; Control of the thickness of a coating by spreading or distributing liquids or other fluent materials already applied to the coated surface
- B05C11/08—Spreading liquid or other fluent material by manipulating the work, e.g. tilting
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/162—Coating on a rotating support, e.g. using a whirler or a spinner
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68728—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of separate clamping members, e.g. clamping fingers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/6875—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of individual support members, e.g. support posts or protrusions
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Description
2 処理容器
3 基板支持ユニット
4 昇降駆動ユニット
5 回転駆動ユニット
6 液供給ユニット
7 導電性部材
Claims (14)
- 基板を支持する基板支持ユニットと、
前記基板支持ユニットによって支持された前記基板の上に処理液を供給する液供給ユニットと、
前記基板支持ユニットを囲む壁体を備え、前記基板支持ユニットを収容し、前記液供給ユニットから前記基板上に供給された前記処理液を回収する処理容器と、
前記処理容器に備えられ、電気抵抗が前記処理容器の材質に比べて小さい材質で提供された導電性部材と、を備え、
前記壁体は、内壁面または外壁面に導電性部材を収容する収容溝が形成された壁本体と、収容溝の入口を遮蔽する溝カバーと、を備え、
導電性部材は、前記収容溝の入口を通じて前記内壁面または前記外壁面の側から前記壁体の内部に挿入されることを特徴とする、基板処理装置。 - 前記壁本体は、下壁と、前記下壁の上端から内側方向に傾斜するように延びる上壁とを備え、前記導電性部材は、前記上壁に対応する部分と前記下壁に対応する部分とを有し、前記収容溝は、前記壁体の内部に挿入された前記導電性部材が前記上壁と前記下壁とに跨るように収容する形状に形成されていることを特徴とする、請求項1に記載の基板処理装置。
- 前記導電性部材は前記壁体の周方向に沿って全体的に提供されたことを特徴とする、請求項2に記載の基板処理装置。
- 前記導電性部材は複数個が前記壁体の周方向に沿って間隔を置いて提供されたことを特徴とする、請求項2に記載の基板処理装置。
- 前記収容溝は、前記導電性部材と一緒に溝カバーを収容するように形成され、
前記溝カバーは、前記収容溝に収容され、前記収容溝の入口を遮蔽したときに前記収容溝の入口の周囲と面一になるように形成されたことを特徴とする、請求項1に記載の基板処理装置。 - 前記壁本体と前記溝カバーとの間は密封されたことを特徴とする、請求項1に記載の基板処理装置。
- 前記導電性部材は電気的に接地されたことを特徴とする、請求項1に記載の基板処理装置。
- 前記処理容器は絶縁性材質で提供されたことを特徴とする、請求項1に記載の基板処理装置。
- 前記絶縁性材質はフッ素樹脂を含むことを特徴とする、請求項8に記載の基板処理装置。
- 前記導電性部材は、金属材質で形成されたメッシュであることを特徴とする、請求項1に記載の基板処理装置。
- 前記導電性部材は、金属材質で形成されたプレートであることを特徴とする、請求項1に記載の基板処理装置。
- 基板を下側から支持する支持ピン、及び前記支持ピンによって支持された前記基板を周囲から支持するチャックピンを含み、上下方向の軸を中心に回転可能な基板支持ユニットと、
前記基板支持ユニットによって支持された前記基板の上に処理液を供給する液供給ユニットと、
前記基板支持ユニットを収容し、前記液供給ユニットから前記基板上に供給されて前記基板上で飛散する前記処理液を回収し、絶縁性材質で提供され、前記処理液との摩擦によって負(-)に帯電する処理容器と、
前記処理容器に備えられ、電気抵抗が前記処理容器の材質に比べて小さい材質で提供され、前記処理容器の電位増大を抑制する導電性部材と、を含み、
前記処理容器は、前記基板支持ユニットを取り囲む壁体と、前記壁体が立ち上げられた底部と、を含み、
前記壁体は、内壁面または外壁面に導電性部材を収容する収容溝が形成された壁本体と、収容溝の入口を遮蔽する溝カバーとを備え、
前記導電性部材は、前記収容溝の入口を通じて前記内壁面または前記外壁面の側から前記壁体の内部に挿入される
ことを特徴とする、基板処理装置。 - 前記壁本体は、下壁と、前記下壁の上端から内側方向に傾斜するように延びる上壁とを備え、前記導電性部材は、前記上壁に対応する部分と前記下壁に対応する部分とを有し、前記収容溝は、前記壁体の内部に挿入された前記導電性部材が前記上壁と前記下壁とに跨るように収容する形状に形成されていることを特徴とする、請求項12に記載の基板処理装置。
- 請求項1又は請求項12に記載の前記基板支持ユニット、前記液供給ユニット、前記処理容器、及び前記導電性部材を含む基板処理装置を準備した後、
前記基板支持ユニットによって基板を支持し、支持された前記基板上に前記液供給ユニットによって処理液を供給し、前記液供給ユニットから前記基板上に供給された前記処理液を前記処理容器によって回収しながら前記基板を処理し、
前記基板を処理する過程で前記処理容器の電位増大を前記導電性部材によって抑制することを特徴とする、基板処理方法。
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KR1020190082284A KR102338417B1 (ko) | 2019-07-08 | 2019-07-08 | 기판 처리 장치 |
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US (1) | US11804371B2 (ja) |
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CN (1) | CN112201589B (ja) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2005183941A (ja) | 2003-11-28 | 2005-07-07 | Dowa Mining Co Ltd | 複合導体、超電導機器システム、および複合導体の製造方法 |
JP2008098594A (ja) | 2006-09-15 | 2008-04-24 | Dainippon Screen Mfg Co Ltd | 基板処理装置および基板処理方法 |
JP2011054785A (ja) | 2009-09-02 | 2011-03-17 | Nippon Valqua Ind Ltd | ウエハ洗浄乾燥装置のスピンカップ |
WO2019017489A1 (ja) | 2017-07-21 | 2019-01-24 | 東邦化成株式会社 | 半導体素子の製造装置および半導体素子の製造方法 |
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JP2007234882A (ja) * | 2006-03-01 | 2007-09-13 | Dainippon Screen Mfg Co Ltd | 基板処理装置および基板取り扱い方法 |
KR100900628B1 (ko) * | 2006-09-15 | 2009-06-02 | 다이닛뽕스크린 세이조오 가부시키가이샤 | 기판처리장치 및 기판처리방법 |
KR101147656B1 (ko) | 2010-12-27 | 2012-05-24 | 세메스 주식회사 | 기판 처리 장치 |
KR101910796B1 (ko) | 2016-06-02 | 2018-10-25 | 세메스 주식회사 | 기판 처리 장치 및 방법 |
KR101856608B1 (ko) * | 2016-07-29 | 2018-05-15 | 세메스 주식회사 | 기판 처리 설비 |
KR102052536B1 (ko) * | 2017-11-24 | 2019-12-05 | (주)신우에이엔티 | 대전 방지용 바울 |
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2005183941A (ja) | 2003-11-28 | 2005-07-07 | Dowa Mining Co Ltd | 複合導体、超電導機器システム、および複合導体の製造方法 |
JP2008098594A (ja) | 2006-09-15 | 2008-04-24 | Dainippon Screen Mfg Co Ltd | 基板処理装置および基板処理方法 |
JP2011054785A (ja) | 2009-09-02 | 2011-03-17 | Nippon Valqua Ind Ltd | ウエハ洗浄乾燥装置のスピンカップ |
WO2019017489A1 (ja) | 2017-07-21 | 2019-01-24 | 東邦化成株式会社 | 半導体素子の製造装置および半導体素子の製造方法 |
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JP2021013019A (ja) | 2021-02-04 |
KR102338417B1 (ko) | 2021-12-10 |
KR20210006569A (ko) | 2021-01-19 |
US20210013029A1 (en) | 2021-01-14 |
CN112201589A (zh) | 2021-01-08 |
CN112201589B (zh) | 2024-04-05 |
US11804371B2 (en) | 2023-10-31 |
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