JP7251937B2 - 半導体レーザーダイオード - Google Patents
半導体レーザーダイオード Download PDFInfo
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- 239000004065 semiconductor Substances 0.000 title claims description 246
- 239000000463 material Substances 0.000 claims description 95
- 230000007704 transition Effects 0.000 claims description 6
- 229910002704 AlGaN Inorganic materials 0.000 claims description 5
- 230000003247 decreasing effect Effects 0.000 claims description 3
- 230000000737 periodic effect Effects 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 202
- 239000000758 substrate Substances 0.000 description 29
- 238000010586 diagram Methods 0.000 description 12
- 230000007480 spreading Effects 0.000 description 12
- 238000003892 spreading Methods 0.000 description 12
- 150000001875 compounds Chemical class 0.000 description 10
- 238000005253 cladding Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 238000002161 passivation Methods 0.000 description 6
- 150000004767 nitrides Chemical class 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 230000004888 barrier function Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 230000018109 developmental process Effects 0.000 description 3
- 230000005670 electromagnetic radiation Effects 0.000 description 3
- 238000000407 epitaxy Methods 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 239000002800 charge carrier Substances 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 239000002019 doping agent Substances 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 229910052749 magnesium Inorganic materials 0.000 description 2
- 239000011241 protective layer Substances 0.000 description 2
- 238000005086 pumping Methods 0.000 description 2
- 229910052703 rhodium Inorganic materials 0.000 description 2
- 239000010948 rhodium Substances 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 229910052684 Cerium Inorganic materials 0.000 description 1
- 229910002601 GaN Inorganic materials 0.000 description 1
- 229910005540 GaP Inorganic materials 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 229910003363 ZnMgO Inorganic materials 0.000 description 1
- 229910007709 ZnTe Inorganic materials 0.000 description 1
- 230000006978 adaptation Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- 229910052790 beryllium Inorganic materials 0.000 description 1
- 229910052980 cadmium sulfide Inorganic materials 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 230000005525 hole transport Effects 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 239000002346 layers by function Substances 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 229910003465 moissanite Inorganic materials 0.000 description 1
- 238000001451 molecular beam epitaxy Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 239000010955 niobium Substances 0.000 description 1
- 229910000484 niobium oxide Inorganic materials 0.000 description 1
- URLJKFSTXLNXLG-UHFFFAOYSA-N niobium(5+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Nb+5].[Nb+5] URLJKFSTXLNXLG-UHFFFAOYSA-N 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- SJLOMQIUPFZJAN-UHFFFAOYSA-N oxorhodium Chemical compound [Rh]=O SJLOMQIUPFZJAN-UHFFFAOYSA-N 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 230000008092 positive effect Effects 0.000 description 1
- 239000002096 quantum dot Substances 0.000 description 1
- 229910003450 rhodium oxide Inorganic materials 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 229910052712 strontium Inorganic materials 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- 229910001936 tantalum oxide Inorganic materials 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 239000004408 titanium dioxide Substances 0.000 description 1
- 238000000927 vapour-phase epitaxy Methods 0.000 description 1
- 238000012800 visualization Methods 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- XLOMVQKBTHCTTD-UHFFFAOYSA-N zinc oxide Inorganic materials [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
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- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
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- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
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- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
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- H01S5/2004—Confining in the direction perpendicular to the layer structure
- H01S5/2018—Optical confinement, e.g. absorbing-, reflecting- or waveguide-layers
- H01S5/2031—Optical confinement, e.g. absorbing-, reflecting- or waveguide-layers characterized by special waveguide layers, e.g. asymmetric waveguide layers or defined bandgap discontinuities
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- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
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- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
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- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34333—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on Ga(In)N or Ga(In)P, e.g. blue laser
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Description
ΔB=(Bmax,2-Bmax,1)/2
である。ここで、好ましくは
0.01%≦(ΔB/Bmax,1)≦20%、
特に好ましくは
0.02%≦(ΔB/Bmax,1)≦10%
が成り立つ。第1の幅の特に好ましい値は、1μm以上3μm以下、典型的には約2μmであってよい。さらに、ΔBは、好ましくは2nm以上または10nm以上または15nm以上であってよく、1μm以下または300nm以下または150nm以下であってよい。
ΔB=(Bmax,2-Bmax,1)/2
は、第2の領域920から第1の領域910へのセットバックの大きさとなる。上述した幅は、好ましくは
0.01%≦(ΔB/Bmax,1)≦20%、
または特に好ましくは
0.02%≦(ΔB/Bmax,1)≦10%
となるように選定するとよいことが判明した。この場合、第1の幅919の好ましい値は0.5μm以上100μm以下、特に好ましくは1μm以上50μm以下であってよい。また、2nm≦ΔB≦1000nmまたは好ましくは10nm≦ΔB≦300nmまたは特に好ましくは15nm≦ΔB≦150nmが成り立ちうる。
2 半導体積層体
3 活性層
4 電極層
5 活性領域
6 光出力面
7 背面
8 光
9 ウェブ導波構造
10 ウェブ上面
11 ウェブ側面
19 パッシベーション材料
21,911,912,921,922 半導体層
910 第1の領域
919 第1の幅
920 第2の領域
923 高さ
929 第2の幅
930 角度
90 ウェブ高さ
91 横方向
92 垂直方向
93 縦方向
100 半導体レーザーダイオード
990 レーザーモード
991 電流の流れ
Claims (19)
- 半導体レーザーダイオード(100)であって、
少なくとも1つの活性層(3)とウェブを有するウェブ導波構造(9)とを有する半導体積層体(2)を含み、前記ウェブは、縦方向(93)で光出力面(6)から背面(7)へ延在しており、かつ前記縦方向(93)に対して垂直な横方向(91)でウェブ側面(11)によって画定されており、
前記ウェブは、第1の領域(910)と、前記縦方向および前記横方向に対して垂直な垂直方向(92)で前記第1の領域に接する第2の領域(920)とを有し、
前記ウェブは、前記第1の領域(910)に第1の半導体材料を含み、前記第2の領域(920)に前記第1の半導体材料とは異なる少なくとも1つの第2の半導体材料を含み、
前記ウェブは、前記第1の領域(910)では第1の幅(919)を有し、
前記ウェブは、前記第2の領域(920)では前記第1の幅(919)より大きい第2の幅(929)を有し、
前記ウェブは、2つの第2の領域(920)を有し、
前記2つの領域(920)間に前記第1の領域(910)が設けられており、
前記2つの領域(920)は、それぞれ、前記第2の半導体材料と、前記第1の領域(910)より大きな幅とを有する、
半導体レーザーダイオード(100)。 - 前記第1の領域(910)から前記第2の領域(920)への移行部は段状である、
請求項1記載の半導体レーザーダイオード(100)。 - 前記ウェブは、前記第2の領域(920)において、前記活性層(3)へ向かう方向で増大する幅を有する、
請求項1または2記載の半導体レーザーダイオード(100)。 - 前記第2の領域(920)は、前記第1の領域(910)と前記活性層(3)との間に位置している、
請求項1から3までのいずれか1項記載の半導体レーザーダイオード(100)。 - 前記第2の領域(920)は、前記ウェブの基台領域を形成している、
請求項1から4までのいずれか1項記載の半導体レーザーダイオード(100)。 - 前記半導体積層体(2)は、前記活性層(3)と前記ウェブとの間に、前記第2の領域(920)に直接に接しかつ前記第2の領域(920)と同じ半導体材料を含む半導体層(21)を有する、
請求項1から5までのいずれか1項記載の半導体レーザーダイオード(100)。 - 前記ウェブは、前記第2の領域(920)において、前記活性層(3)へ向かう方向で減少する幅を有する、
請求項1または2記載の半導体レーザーダイオード(100)。 - 前記第1の領域(910)は、前記第2の領域(920)と前記活性層(3)との間に位置している、
請求項7記載の半導体レーザーダイオード(100)。 - 前記第2の領域(920)は前記ウェブの上面領域を形成している、
請求項7または8記載の半導体レーザーダイオード(100)。 - 前記ウェブは、前記第2の領域(920)に、少なくとも1つのヘテロ界面を有する、
請求項1から9までのいずれか1項記載の半導体レーザーダイオード(100)。 - 前記ウェブは、前記第2の領域(920)に、相異なる半導体材料を含む少なくとも2つの層(921,922)を有する、
請求項1から10までのいずれか1項記載の半導体レーザーダイオード(100)。 - 前記ウェブは、前記第2の領域(920)に、少なくとも2つの層(921,922)の周期的連続を有する、
請求項1から11までのいずれか1項記載の半導体レーザーダイオード(100)。 - 前記ウェブは、前記第1の領域(910)において、前記活性層(3)へ向かう方向で増大する幅を有する、
請求項1から12までのいずれか1項記載の半導体レーザーダイオード(100)。 - 前記ウェブは、前記第1の領域(910)において、前記活性層(3)へ向かう方向で減少する幅を有する、
請求項1から12までのいずれか1項記載の半導体レーザーダイオード(100)。 - 前記ウェブは、前記垂直方向(92)にウェブ高さ(90)を有し、
前記第2の領域(920)は、前記垂直方向(92)に、前記ウェブ高さの2%以上65%以下の高さ(923)を有する、
請求項1から14までのいずれか1項記載の半導体レーザーダイオード(100)。 - 前記ウェブは、前記第1の領域(910)に最大の第1の幅Bmax,1を有し、かつ前記第2の領域(920)に最大の第2の幅Bmax,2を有し、ここで、
ΔB=(Bmax,2-Bmax,1)/2
であって、
0.01%≦ΔB/Bmax,1≦20%
が成り立つ、
請求項1から15までのいずれか1項記載の半導体レーザーダイオード(100)。 - 2nm≦ΔB≦1000nm
が成り立つ、
請求項16記載の半導体レーザーダイオード(100)。 - 前記第2の領域(920)では、前記ウェブ側面(11)は、前記横方向(91)と前記縦方向(93)とに展開される平面に対して角度αだけ傾斜しており、ここで、
20°≦α≦100°
が成り立つ、
請求項1から17までのいずれか1項記載の半導体レーザーダイオード(100)。 - 前記第1の半導体材料はAlGaNを含み、前記第1の半導体材料とは異なる前記第2の半導体材料は、AlxInyGa1-x-yNを含む、
請求項1から18までのいずれか1項記載の半導体レーザーダイオード(100)。
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