JP7243836B2 - サンプリング回路 - Google Patents

サンプリング回路 Download PDF

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Publication number
JP7243836B2
JP7243836B2 JP2021538558A JP2021538558A JP7243836B2 JP 7243836 B2 JP7243836 B2 JP 7243836B2 JP 2021538558 A JP2021538558 A JP 2021538558A JP 2021538558 A JP2021538558 A JP 2021538558A JP 7243836 B2 JP7243836 B2 JP 7243836B2
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JP
Japan
Prior art keywords
transmission line
input
sample
sampling circuit
line
Prior art date
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Application number
JP2021538558A
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English (en)
Japanese (ja)
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JPWO2021024343A1 (https=
Inventor
直樹 寺尾
宗彦 長谷
秀之 野坂
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
NTT Inc USA
Original Assignee
Nippon Telegraph and Telephone Corp
NTT Inc USA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp, NTT Inc USA filed Critical Nippon Telegraph and Telephone Corp
Publication of JPWO2021024343A1 publication Critical patent/JPWO2021024343A1/ja
Application granted granted Critical
Publication of JP7243836B2 publication Critical patent/JP7243836B2/ja
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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/1205—Multiplexed conversion systems
    • H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813—Checking the presence, location, orientation or value, e.g. resistance, of components or conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/05—Digital input using the sampling of an analogue quantity at regular intervals of time, input from a/d converter or output to d/a converter
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • G11C27/024—Sample-and-hold arrangements using a capacitive memory element
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245—Details of sampling arrangements or methods
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245—Details of sampling arrangements or methods
    • H03M1/126—Multi-rate systems, i.e. adaptive to different fixed sampling rates
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L25/00—Baseband systems
    • H04L25/02—Details ; arrangements for supplying electrical power along data transmission lines
    • H04L25/0264—Arrangements for coupling to transmission lines
    • H04L25/0272—Arrangements for coupling to multiple lines, e.g. for differential transmission

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Analogue/Digital Conversion (AREA)
JP2021538558A 2019-08-05 2019-08-05 サンプリング回路 Active JP7243836B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/030672 WO2021024343A1 (ja) 2019-08-05 2019-08-05 サンプリング回路

Publications (2)

Publication Number Publication Date
JPWO2021024343A1 JPWO2021024343A1 (https=) 2021-02-11
JP7243836B2 true JP7243836B2 (ja) 2023-03-22

Family

ID=74502554

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021538558A Active JP7243836B2 (ja) 2019-08-05 2019-08-05 サンプリング回路

Country Status (3)

Country Link
US (1) US12119962B2 (https=)
JP (1) JP7243836B2 (https=)
WO (1) WO2021024343A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7602902B2 (ja) * 2020-12-03 2024-12-19 株式会社日立製作所 制御装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5471162A (en) 1992-09-08 1995-11-28 The Regents Of The University Of California High speed transient sampler
JP2008244576A (ja) 2007-03-26 2008-10-09 Handotai Rikougaku Kenkyu Center:Kk アナログ・デジタル（ａｄ）変換器及びアナログ・デジタル変換方法
JP2009544242A (ja) 2006-07-14 2009-12-10 ディー・エフ・ティー・マイクロシステムズ・インコーポレーテッド 主にデジタルな時間基準発生器を使用する信号完全性測定のシステム及び方法
JP2010035186A (ja) 2009-09-15 2010-02-12 Fujitsu Ltd 信号処理回路
EP3113367A1 (en) 2015-07-03 2017-01-04 Rohde & Schwarz GmbH & Co. KG Delay line system, high frequency sampler, analog-to-digital converter and oscilloscope
US20190253286A1 (en) 2018-02-14 2019-08-15 Analog Devices Global Unlimited Company Continuous-time sampler circuits

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS631119A (ja) * 1986-06-19 1988-01-06 General Bijinesu Mach Kk アナログ／デジタル変換システム
JP2008147922A (ja) * 2006-12-08 2008-06-26 Anritsu Corp Ａ／ｄ変換装置
CN105027219B (zh) * 2013-03-28 2018-09-11 株式会社日立制作所 延迟电路、使用延迟电路的电子电路以及超声波拍摄装置
US10468073B2 (en) * 2017-12-29 2019-11-05 Sandisk Technologies Llc Transmission line optimization for multi-die systems
JP2019153909A (ja) * 2018-03-02 2019-09-12 株式会社リコー 半導体集積回路およびクロック供給方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5471162A (en) 1992-09-08 1995-11-28 The Regents Of The University Of California High speed transient sampler
JP2009544242A (ja) 2006-07-14 2009-12-10 ディー・エフ・ティー・マイクロシステムズ・インコーポレーテッド 主にデジタルな時間基準発生器を使用する信号完全性測定のシステム及び方法
JP2008244576A (ja) 2007-03-26 2008-10-09 Handotai Rikougaku Kenkyu Center:Kk アナログ・デジタル（ａｄ）変換器及びアナログ・デジタル変換方法
JP2010035186A (ja) 2009-09-15 2010-02-12 Fujitsu Ltd 信号処理回路
EP3113367A1 (en) 2015-07-03 2017-01-04 Rohde & Schwarz GmbH & Co. KG Delay line system, high frequency sampler, analog-to-digital converter and oscilloscope
US20190253286A1 (en) 2018-02-14 2019-08-15 Analog Devices Global Unlimited Company Continuous-time sampler circuits

Also Published As

Publication number Publication date
WO2021024343A1 (ja) 2021-02-11
US12119962B2 (en) 2024-10-15
US20220294671A1 (en) 2022-09-15
JPWO2021024343A1 (https=) 2021-02-11

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