WO2021024343A1 - サンプリング回路 - Google Patents

サンプリング回路 Download PDF

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Publication number
WO2021024343A1
WO2021024343A1 PCT/JP2019/030672 JP2019030672W WO2021024343A1 WO 2021024343 A1 WO2021024343 A1 WO 2021024343A1 JP 2019030672 W JP2019030672 W JP 2019030672W WO 2021024343 A1 WO2021024343 A1 WO 2021024343A1
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Prior art keywords
transmission line
input
sample hold
sampling circuit
line
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Ceased
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PCT/JP2019/030672
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English (en)
French (fr)
Japanese (ja)
Inventor
直樹 寺尾
宗彦 長谷
秀之 野坂
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NTT Inc
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Nippon Telegraph and Telephone Corp
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Priority to JP2021538558A priority Critical patent/JP7243836B2/ja
Priority to US17/630,375 priority patent/US12119962B2/en
Priority to PCT/JP2019/030672 priority patent/WO2021024343A1/ja
Publication of WO2021024343A1 publication Critical patent/WO2021024343A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/1205—Multiplexed conversion systems
    • H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813—Checking the presence, location, orientation or value, e.g. resistance, of components or conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/05—Digital input using the sampling of an analogue quantity at regular intervals of time, input from a/d converter or output to d/a converter
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • G11C27/024—Sample-and-hold arrangements using a capacitive memory element
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245—Details of sampling arrangements or methods
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245—Details of sampling arrangements or methods
    • H03M1/126—Multi-rate systems, i.e. adaptive to different fixed sampling rates
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L25/00—Baseband systems
    • H04L25/02—Details ; arrangements for supplying electrical power along data transmission lines
    • H04L25/0264—Arrangements for coupling to transmission lines
    • H04L25/0272—Arrangements for coupling to multiple lines, e.g. for differential transmission

Definitions

  • the present invention relates to a sampling circuit technique for sampling a high frequency input signal using a time interleaved configuration.
  • the sampling circuit is a circuit that acquires (sampling) continuous input values in the time direction at a clock cycle and holds them for a certain period of time.
  • the number of times of sampling per unit time is called a sampling rate.
  • sampling circuit having a higher sampling rate is indispensable.
  • the moment when the input value is held occurs once per clock cycle, so that the sampling rate is equal to the clock frequency as shown in the following equation.
  • (Sampling rate) (Clock frequency)
  • Increasing the clock frequency can improve the resolution in the time direction, but there is a problem that the required level in analog circuit design for the clock generation circuit, the clock buffer, or the sampling circuit itself becomes strict.
  • FIG. 8 is a circuit diagram showing a configuration example of a conventional sampling circuit.
  • a plurality of sample hold circuits SH are used in parallel as a time interleaving configuration. This number is called the interleave number, and here n (n is an integer of 2 or more).
  • the input signal din and the clock signal ck are commonly supplied to the individual sample hold circuits SH via the first transmission line W51 and the second transmission line W52, respectively.
  • the clock signal ck is used for turning on / off the switch SW of the sample hold circuit SH, that is, controlling the timing of sampling.
  • the input signal din is held by the capacitance element Cs of the sample hold circuit SH at the timing when the switch SW is turned on by the clock signal ck, and the holding voltage thereof is output as the sampling voltage Vs (i).
  • ⁇ T in the middle of the second transmission line W52 represents a time delay.
  • this time delay is realized in a delay circuit DL such as a buffer connected in multiple stages.
  • each sample hold circuit SH is actually composed of a transistor element, that is, an input transistor. Therefore, if the input transistor is a bipolar transistor, the input voltage of the input signal din is applied to the base electrode, and if the input transistor is a MOSFET, the input voltage of the input signal din is applied to the gate electrode.
  • a bipolar transistor will be described as an example, but the present invention is not limited to this, and the same discussion applies to other transistors such as MOSFETs.
  • the base electrode of a bipolar transistor has a ground capacitance component as an input capacitance. This is mainly due to the junction capacitance parasitic on the pn junction between the base-emitter electrode and the base-collector electrode.
  • the individual sample hold circuits SH are connected in parallel with each other. Therefore, the input capacitance of the first transmission line W51 and the second transmission line W52 as a whole is the sum of the input capacitances of the individual sample hold circuits SH. Therefore, there is a problem that the total input capacity increases and the input band narrows as the number of interleaves increases.
  • the cutoff frequency f cutoff for the input signal din of the entire sampling circuit 50 is calculated by the following equation (1). Given in.
  • the present invention has been made in view of this problem, and an object of the present invention is to provide a sampling circuit technique capable of realizing a wide band input characteristic by avoiding narrowing of the input band due to an increase in the number of interleaves.
  • the sampling circuit transmits a first transmission line that transmits an input signal input from one end to the other end and a clock signal input from one end to the other end.
  • the second transmission line is connected to the first and second transmission lines at a constant line distance, and at the timing specified by the clock signal supplied from the second transmission line.
  • the first transmission line includes a plurality of sample hold circuits that sample and hold and output the input signal supplied from the first transmission line, and the first transmission line has a first propagation time for each line distance of the input signal.
  • the second transmission line transmits the clock signal for each line distance at a second propagation time consisting of the sum of a preset sampling interval and the first propagation time. It was done.
  • the present invention when speeding up a sampling circuit using time interleaving, it is possible to avoid an increase in input capacitance due to an increase in the number of interleaving, and it is possible to maintain wideband input characteristics.
  • FIG. 1 is a circuit diagram showing a configuration of a sampling circuit according to the first embodiment.
  • FIG. 2 is an explanatory diagram showing a distributed constant circuit of a transmission line.
  • FIG. 3 is a block diagram showing a propagation time difference generation example (line width).
  • FIG. 4 is a block diagram showing a propagation time difference generation example (line length).
  • FIG. 5 is a block diagram showing a propagation time difference generation example (branch connection).
  • FIG. 6 is a circuit diagram showing a configuration of a sampling circuit according to the second embodiment.
  • FIG. 7 is a circuit diagram showing a configuration of a sampling circuit according to a third embodiment.
  • FIG. 8 is a circuit diagram showing a configuration example of a conventional sampling circuit.
  • FIG. 1 is a circuit diagram showing a configuration of a sampling circuit according to the first embodiment.
  • the sample hold circuit SH is connected in parallel to the first transmission line W1 and the second transmission line W2 with a constant line distance x.
  • the sample hold circuits SH all have the same circuit configuration, and the switch SW that operates on and off according to the clock signal ck and the input signal din input from the first transmission line W1 at the timing when the switch SW is turned on are input. It includes a capacitive element Cs that samples and holds the voltage and outputs the holding voltage as the sampling voltage Vs (i).
  • the first transmission line W1 is composed of a transmission line having a first line constant that propagates the input signal din at the first propagation time Tx1 for each line distance x, and the input signal din is the first for each line distance x.
  • the input signal din is supplied to each of the sample hold circuits SH by transmitting at a propagation time Tx1.
  • a signal source S1 of an input signal din having an output resistor Ro1 is connected between one end (input port) P11 of the first transmission line W1 and the ground potential GND.
  • a terminating resistor RL1 for impedance matching is connected between the other end (output port) P12 of the first transmission line W1 and the ground potential GND.
  • the second transmission line W2 is composed of a transmission line having a second line constant that propagates the clock signal ck for each line distance x with a second propagation time Tx2, and the clock signal ck is preset for each line distance x.
  • the clock signal ck is supplied to each of the sample hold circuits SH by transmitting at the second propagation time Tx2 which is the sum of the obtained sampling interval ⁇ T and the first propagation time Tx1.
  • a signal source S2 of a clock signal ck having an output resistor Ro2 is connected between one end (input port) P21 of the second transmission line W2 and the ground potential GND. Further, a terminating resistor RL2 for impedance matching is connected between the other end (output port) P22 of the second transmission line W2 and the ground potential GND.
  • a transmission line having a length of about several hundred ⁇ m or more may be used inside an electronic circuit, for example, for data transmission between different circuit blocks on the same chip.
  • the wavelength is shortened to several hundreds of ⁇ m in propagation in a metal wiring surrounded by a dielectric. Therefore, it is not possible to assume an ideal transmission line that is handled by a lumped multiplier circuit for low-frequency signals, that is, a transmission line that transmits signals with zero time difference and has no inductive or capacitive components. It is necessary to discuss the characteristics of the above.
  • the capacitance with respect to the ground potential GND cannot be ignored, so it can be interpreted that the capacitance component is distributed over the entire transmission line.
  • the inductive component and the capacitive component in the entire transmission line There is a trade-off relationship between the inductive component and the capacitive component in the entire transmission line. This is because if the area surrounded by the wiring loop is reduced in order to make the inductive component as small as possible, the wirings are close to each other and the capacitance component becomes large.
  • FIG. 2 is an explanatory diagram showing a distributed constant circuit of a transmission line.
  • the transmission line is represented by a model using a distributed constant circuit as shown in FIG. That is, the transmission line W can be considered as an infinite number of modeled circuits, that is, distributed constant circuits M.
  • the distribution constant circuit M per unit length with respect to the transmission line W is formed between the resistance component R and the induction component L generated in series with the transmission line W, and the transmission line W and the ground potential GND. It is represented by the resulting conductance component G and volume component C. Therefore, the electric signal propagating on the transmission line W is obtained as a solution of the telegrapher's equation established based on such a model. This way of thinking makes it possible to more accurately describe the actual behavior at high frequencies.
  • the transmission line W is designed based on this idea.
  • a design method is used in which the loss is as small as possible, the propagation characteristics are uniform over the entire transmission line W, and the propagation characteristics are easy to control.
  • microstrip lines, strip lines, coplanar lines, etc. are the main physical design methods. The above is the basic idea of the transmission line.
  • L and C be the induction component and the capacitance component per unit length of the transmission line W (W1, W2) ignoring the sample hold circuit SH, respectively.
  • the sample hold circuit SH is connected to the transmission line W at a constant line distance x
  • the sample hold circuit SH is connected to the transmission line W at a line distance x having the same input capacitance of the sample hold circuit SH in the middle of the transmission line W. It will be done.
  • the input stage of the sample hold circuit SH is composed of a transistor element
  • the input load of the sample hold circuit SH seen from the transmission line W side has a capacitance component, and this capacitance component is Cq (Cq1, Cq2).
  • a new transmission line in consideration of the input capacitance Cq of the sample hold circuit SH is called a pseudo transmission line, and each of the first and second transmission lines W1 and W2 is composed of the pseudo transmission line. It is considered to have been.
  • the induction component L1 per unit length and the capacitance component C1 relating to the first transmission line W1 are referred to as the first line constants, and the induction component L2 per unit length relating to the second transmission line W2.
  • the capacitance component C2 is called a second line constant.
  • phase velocity v and the cutoff frequency f cutoff of the signal propagating on the pseudo transmission line are directly related to the input characteristics of the sampling circuit 10, they are used for calculating the phase velocity v and the cutoff frequency f cutoff .
  • the induction component L and the capacitance component C per unit length are called line constants, but are not limited thereto.
  • the resistance component R and the conductance component G per unit length shown in FIG. 2 may be included in the line constant.
  • the characteristic impedance Z 0 and the phase velocity v of the pseudo transmission line are calculated by using the above equation (2) as follows. It is calculated by the formula (3) respectively.
  • the input signal din input from the signal source S1 having the output resistor Ro1 to one end P11 of the first transmission line W1 has a constant phase velocity determined by the characteristics of the first transmission line W1 from the above-mentioned pseudo transmission line. It propagates through the first transmission line W1 and reaches the terminating resistor RL1 connected to the other end P12 of the first transmission line W1. At this time, since the impedances of the first transmission line W1 and the terminating resistor RL1 are matched, including the input capacitance Cq1 of each sample hold circuit SH, the input signal din is not reflected by the other end P12. , It is absorbed by the terminating resistor RL1 as it is.
  • the input signal din is a constant line on the first transmission line W1.
  • the first propagation time Tx1 required to propagate between adjacent sample hold circuits SH at a distance x1 is expressed by the following equation (4).
  • the clock signal ck input from the signal source S2 having the output resistor Ro2 to one end P21 of the second transmission line W2 also has a constant phase determined by the characteristics of the second transmission line W2, like the input signal din. At a speed, it propagates through the second transmission line W2 composed of the pseudo transmission line described above, and reaches the terminating resistor RL2 connected to the other end P22 of the second transmission line W2. At this time, since the impedances of the second transmission line W2 and the terminating resistor RL2 are matched, including the input capacitance Cq2 of each sample hold circuit SH, the clock signal ck is not reflected by the other end P12. , It is absorbed by the terminating resistor RL2 as it is.
  • the sampling interval is ⁇ T
  • the clock period of the clock signal ck is Tck, the clock.
  • the second propagation time Tx2 required for the signal ck to propagate between adjacent sample hold circuits SH at a constant line distance x2 on the second transmission line W2 is determined by using the first propagation time Tx1. It is expressed by the following equation (5).
  • the second propagation time Tx2 is adjusted to the input capacitance Cq2 connected to the second transmission line W2 and the second propagation time Tx2 so that the second propagation time Tx2 is equal to the sum of the first propagation time Tx1 and the sampling interval ⁇ T. Therefore, if the values of the induction component L2 and the capacitance component C2, which are the second line constants, are designed, the input signal din and the clock signal ck input to the individual sample hold circuits SH will be synchronized. As a result, although the clock frequency is Tck, sampling can be performed accurately with a period ⁇ T of 1 / n thereof.
  • FIG. 3 is a block diagram showing a propagation time difference generation example (line width).
  • FIG. 4 is a block diagram showing a propagation time difference generation example (line length).
  • FIG. 5 is a block diagram showing a propagation time difference generation example (branch connection).
  • the line constant that is, the capacitance component
  • the line constant is obtained by adjusting one or both of the line width and the distance from the ground potential GND with respect to the first and second transmission lines W1 and W2.
  • This is a method of generating a propagation time difference by changing C1 and C2 and induction components L1 and L2 to determine their respective phase velocities v.
  • both the first and second transmission lines W1 and W2 are formed in a linear shape, and the line width of the first transmission line W1 is increased as compared with the second transmission line W2.
  • the propagation time difference generation method of FIG. 3 since the induction component L2 is larger than that of the induction component L1, the phase velocity v of the second transmission line W2 is smaller than that of the first transmission line W1. A propagation time difference occurs, and as a result, the propagation of the clock signal ck is delayed as compared with the input signal din.
  • the configuration example of FIG. 3 is merely an example, and the present invention is not limited to this, and arrangements may be added as appropriate.
  • one or both of the first and second transmission lines W1 and W2 may meander in combination with FIG. 4 described later.
  • the line constants that is, the capacitance components C1 and C2 and the induction component L1 are adjusted by adjusting the line lengths of the first and second transmission lines W1 and W2 connecting the adjacent sample hold circuits SH. , L2 are changed to determine the respective phase velocities v, thereby generating a propagation time difference.
  • the first transmission line W1 is formed in a straight line
  • the second transmission line W2 is meandered in a zigzag shape (square wave shape, meander shape, sine wave shape) to form the first transmission line.
  • a configuration example is shown in which the line distance x2 of the second transmission line W2 is longer (x1 ⁇ x2) than the line distance x1 of the W1.
  • the second transmission line W2 is larger than the first transmission line W1.
  • the phase velocity v becomes smaller, a propagation time difference occurs, and as a result, the propagation of the clock signal ck is delayed as compared with the input signal din.
  • the configuration example of FIG. 3 is merely an example, and the present invention is not limited to this, and arrangements may be added as appropriate.
  • both the first and second transmission lines W1 and W2 may meander, and the meandering width of the second transmission line W2 may be larger than that of the first transmission line W1.
  • the line distance x2 can be made longer than the line distance x1.
  • a plurality of branch buffer BUFs connected in series are used to branch the second transmission line W2 for each sample hold circuit SH, according to the delay time in the branch buffer BUF.
  • This is a method of generating a propagation time difference.
  • the configuration example of FIG. 5 is merely an example, and the present invention is not limited to this, and arrangements may be added as appropriate. For example, it may be carried out in any combination with the propagation time difference generation method of FIGS. 3 and 4 described above.
  • first and second transmission lines W1 and W2 are composed of a single-ended transmission line
  • the present invention is not limited to this, and one or both of them may be used.
  • It may be composed of a differential transmission line.
  • a differential transmission line is a transmission line composed of two pairs of lines, and two signals having opposite phases to each other, that is, differential signals are transmitted by these two lines. As a result, in-phase noise can be canceled and even-order nonlinear distortion can be suppressed.
  • the first transmission line W1 for transmitting the input signal din input from one end P11 to the other end P12 and the clock signal ck input from one end P12 are transmitted to the other end P22.
  • the first transmission line W1 includes a second transmission line W2 and a plurality of sample hold circuits SH connected to the first and second transmission lines W1 and W2 at a constant line distance x.
  • the input signal din is transmitted for each line distance x at the first propagation time Tx1, and the second transmission line W2 transmits the clock signal ck for each line distance x with a preset sampling interval ⁇ T and a first propagation time.
  • the transmission is performed at the second propagation time Tx2, which is the sum of Tx1.
  • the first transmission line W1 propagates the input signal din for each line distance x with the first propagation time Tx1, that is, the induction component L1 and the capacitance component C1 per unit length.
  • the second transmission line W2 has a second line constant for propagating the clock signal ck for each line distance x with a second propagation time Tx2, that is, an induction component L2 and a capacitance component C2 per unit length. doing.
  • the input capacitances Cq1 and Cq2 of the individual sample hold circuits SH can be regarded as a part of the capacitance components C1 and C2 of the first and second transmission lines W1 and W2, respectively. That is, the input capacitances Cq1 and Cq2 are absorbed by the capacitance components C1 and C2. Therefore, it is possible to suppress an increase in the input capacitances Cq1 and Cq2 due to an increase in the number of interleaves n in the conventional configuration described above, and it is possible to realize a wide band of the input band in the sampling circuit 10.
  • the cutoff frequency f cutoff of the transmission lines W (W1, W2) in this circuit configuration will be described.
  • the input capacitances Cq (Cq1, Cq2) are arranged in a lumped constant in the middle of the transmission line W as in this circuit configuration, the line distance x between the input capacitances Cq cannot be ignored with respect to the wavelength.
  • a second-order low-pass filter effect consisting of L (L1, L2) and C (C1, C2) appears for a high-frequency signal (din, ck), and the waveform of the signal propagating on the transmission line W is attenuated. To do.
  • the cutoff frequency f cutoff at this time is calculated by the following equation (6).
  • the signal propagating on the transmission line W has a frequency sufficiently lower than the cutoff frequency f cutoff, it can be regarded as a transmission line including the input capacitance Cq, but when the frequency becomes high to the vicinity of the cutoff frequency f cutoff , Cq becomes It looks like a concentrated constant. Therefore, the characteristics of the L and C secondary low-pass filters appear, the signal propagating on the transmission line W is attenuated, and the input band of the entire sampling circuit 10 becomes the band up to the cutoff frequency f cutoff .
  • the interleave number n is not included in the denominator in the equation (6), as in the cutoff frequency f cutoff of the conventional configuration described in the above equation (1). Therefore, even if the number of interleaves n is increased, the cutoff frequency f cutoff does not decrease.
  • FIG. 6 is a circuit diagram showing a configuration of a sampling circuit according to the second embodiment.
  • the input capacitance Cq of the sample hold circuit SH is caused by the junction capacitance parasitic on the pn junction of the input transistor.
  • the input transistor is a bipolar polar transistor, it consists of a junction capacitance that parasitizes the Pn junction between the base-emitter electrode and the base-collector electrode.
  • This input capacitance Cq has a dependency on the bias voltage applied across both ends of the pn junction.
  • the value of the input capacitance Cq is variably controlled by adjusting the bias voltage of the input signal din and the clock signal ck supplied to the input transistor.
  • a first bias supply wiring Wb1 and a second bias supply wiring Wb2 are added to the sampling circuit 11 according to the present embodiment as compared with FIG.
  • the first bias supply wiring Wb1 is a wiring that supplies the first bias voltage Vb1 to the first input transistor Q1 to which the input signal din is input in each sample hold circuit SH.
  • the second bias supply wiring Wb2 is a wiring that supplies the second bias voltage Vb2 to the second input transistor Q2 to which the clock signal ck is input in each sample hold circuit SH.
  • FIG. 6 shows a case where both the first bias supply wiring Wb1 and the second bias supply wiring Wb2 are provided, but the present invention is not limited to this, and the first bias supply wiring Wb1 and the first bias supply wiring Wb1 are provided. Only one of the bias supply wirings Wb2 of 2 may be provided.
  • the first bias voltage Vb1 is input from one end (input port) Pb1 of the first bias supply wiring Wb1 and is input to the first input transistor Q1 of each sample hold circuit SH via the first bias supply wiring Wb1. Be supplied.
  • the first input transistor Q1 when the first bias voltage Vb1 becomes high (low), the input capacitance Cq1 becomes small (large), so that the first propagation time Tx1 with respect to the first transmission line W1 is small (large). )can do.
  • the voltage value of the first bias voltage Vb1 as a result, the first propagation time Tx1 with respect to the first transmission line W1 can be controlled.
  • the second bias voltage Vb2 is input from one end (input port) Pb2 of the second bias supply wiring Wb2, and is passed through the second bias supply wiring Wb2 to the second input transistor of each sample hold circuit SH. It is supplied to Q2.
  • the second input transistor Q2 when the second bias voltage Vb2 becomes high (low), the input capacitance Cq2 becomes small (large), so that the propagation time Tx2 with respect to the second of the second transmission line W2 is small (large). )can do.
  • the second propagation time Tx2 with respect to the second transmission line W2 can be controlled.
  • FIG. 7 is a circuit diagram showing a configuration of a sampling circuit according to a third embodiment.
  • FIG. 6 a case where the input capacitance Cq of the first and second input transistors Q1 and Q2 of the sample hold circuit SH is adjusted has been described as an example.
  • the present embodiment describes a case where the input capacitances Cq of the first and second semiconductor elements U1 and U2 provided separately from the first and second input transistors Q1 and Q2 are adjusted.
  • the sampling circuit 11 has the first bias supply wiring Wb1 and the second bias supply wiring Wb2 added as shown in FIG. 7. Further, in parallel with the first and second input transistors Q1 and Q2 of each sample hold circuit SH, an input terminal is provided between the connection point of the first and second input transistors Q1 and Q2 and the ground potential GND. A first semiconductor element U1 connected to the first transmission line W1 and a second semiconductor element U2 whose input terminal is connected to the second transmission line W2 are added.
  • the first and second semiconductor elements U1 and U2 are composed of active elements having a pn junction, such as a bipolar transistor, MOSFET, or diode. Therefore, similarly to the first and second input transistors Q1 and Q2 described above, the first and second semiconductor elements U1 and U2 have dependence on the bias voltage applied to both ends of the pn junction. It has two input capacities Cu1 and Cu2, respectively.
  • the bias voltage of the input signal din and the clock signal ck supplied to the first and second semiconductor elements U1 and U2 that is, the first and second bias voltages Vb1 and Vb2.
  • the values of the input capacitances Cu1 and Cu2 are variably controlled.
  • the first bias supply wiring Wb1 is a wiring that supplies the first bias voltage Vb1 to the first semiconductor element U1 in each sample hold circuit SH.
  • the second bias supply wiring Wb2 is a wiring that supplies the second bias voltage Vb2 to the second semiconductor element U2 in each sample hold circuit SH.
  • FIG. 7 shows a case where both the first bias supply wiring Wb1 and the second bias supply wiring Wb2 are provided, but the present invention is not limited to this, and the first bias supply wiring Wb1 and the first bias supply wiring Wb1 are provided. Only one of the bias supply wirings Wb2 of 2 may be provided.
  • the first bias voltage Vb1 is input from one end (input port) Pb1 of the first bias supply wiring Wb1 and is supplied to the semiconductor element U1 of each sample hold circuit SH via the first bias supply wiring Wb1. ..
  • the first semiconductor element U1 when the first bias voltage Vb1 is high (low), the input capacitance Cu1 is small (large), so that the first propagation time Tx1 with respect to the first transmission line W1 is small (large). )can do. Thereby, by adjusting the voltage value of the first bias voltage Vb1, as a result, the first propagation time Tx1 with respect to the first transmission line W1 can be controlled.
  • the second bias voltage Vb2 is input from one end (input port) Pb2 of the second bias supply wiring Wb2, and is passed through the second bias supply wiring Wb2 to the second semiconductor element of each sample hold circuit SH. It is supplied to U2.
  • the second semiconductor element U2 when the second bias voltage Vb2 is high (low), the input capacitance Cu2 is small (large), so that the propagation time Tx2 with respect to the second of the second transmission line W2 is small (large). )can do.
  • the second propagation time Tx2 with respect to the second transmission line W2 can be controlled.
  • the input capacitance in each sample hold circuit SH is used.
  • the adjustment range of can be easily increased. For example, the number of parallel connections of the first and second semiconductor elements U1 and U2 may be increased. Therefore, the control range of the first and second propagation times Tx1 and Tx2 can be expanded, and as a result, the sampling rate of the time interleave can be adjusted more flexibly.

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PCT/JP2019/030672 2019-08-05 2019-08-05 サンプリング回路 Ceased WO2021024343A1 (ja)

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JP2008147922A (ja) * 2006-12-08 2008-06-26 Anritsu Corp Ａ／ｄ変換装置
WO2014155635A1 (ja) * 2013-03-28 2014-10-02 株式会社日立製作所 遅延回路、それを用いた電子回路および超音波撮像装置
EP3113367A1 (en) * 2015-07-03 2017-01-04 Rohde & Schwarz GmbH & Co. KG Delay line system, high frequency sampler, analog-to-digital converter and oscilloscope

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JP2008147922A (ja) * 2006-12-08 2008-06-26 Anritsu Corp Ａ／ｄ変換装置
WO2014155635A1 (ja) * 2013-03-28 2014-10-02 株式会社日立製作所 遅延回路、それを用いた電子回路および超音波撮像装置
EP3113367A1 (en) * 2015-07-03 2017-01-04 Rohde & Schwarz GmbH & Co. KG Delay line system, high frequency sampler, analog-to-digital converter and oscilloscope

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