JP7222721B2 - cleaning mechanism - Google Patents

cleaning mechanism Download PDF

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JP7222721B2
JP7222721B2 JP2019005888A JP2019005888A JP7222721B2 JP 7222721 B2 JP7222721 B2 JP 7222721B2 JP 2019005888 A JP2019005888 A JP 2019005888A JP 2019005888 A JP2019005888 A JP 2019005888A JP 7222721 B2 JP7222721 B2 JP 7222721B2
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Prior art keywords
plate
brush
work
tub
cleaning
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JP2020115496A (en
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二郎 現王園
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Disco Corp
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Disco Corp
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Priority to JP2019005888A priority Critical patent/JP7222721B2/en
Priority to CN202010030608.4A priority patent/CN111438085B/en
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    • B08B1/12
    • B08B1/20
    • B08B1/50
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/02Cleaning by the force of jets or sprays
    • B08B3/022Cleaning travelling work
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B7/00Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
    • B24B7/04Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor involving a rotary work-table
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B7/00Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
    • B24B7/20Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
    • B24B7/22Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
    • B24B7/228Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting

Description

本発明は、板状ワークの下面を洗浄する洗浄機構に関する。 The present invention relates to a cleaning mechanism for cleaning the lower surface of a plate-like work.

チャックテーブルに保持された半導体ウェーハ等の板状ワークを研削砥石で研削する研削装置は、棚状に板状ワークを収容したカセットから板状ワークを搬出させ、吸引パッド等からなる搬送手段によって板状ワークをチャックテーブルまで搬送させている。ここで、チャックテーブルに保持される板状ワークの下面にゴミが付着していると、板状ワークの下面とチャックテーブルの保持面との間にゴミが介在し均一な厚みに板状ワークを研削する事ができないという問題がある。 A grinding apparatus that grinds a plate-shaped work such as a semiconductor wafer held on a chuck table with a grinding wheel removes the plate-shaped work from a cassette that stores the plate-shaped work on a shelf, and removes the plate-shaped work from a conveying means such as a suction pad. The workpiece is conveyed to the chuck table. Here, if dust adheres to the lower surface of the plate-like work held by the chuck table, the dust will be interposed between the lower surface of the plate-like work and the holding surface of the chuck table, and the plate-like work will be spread to a uniform thickness. There is a problem that it cannot be ground.

そのため、特許文献1に開示されているように、板状ワークの下面に洗浄水を噴射させ、かつ、ブラシを接触させて該下面を洗浄する洗浄機構を備える研削装置がある。 Therefore, as disclosed in Japanese Unexamined Patent Application Publication No. 2002-100001, there is a grinding apparatus equipped with a cleaning mechanism that jets cleaning water onto the lower surface of a plate-like workpiece and brings a brush into contact with the lower surface to clean the lower surface.

特開2011-18802号公報Japanese Unexamined Patent Application Publication No. 2011-18802

しかし、洗浄機構のブラシに洗浄した板状ワークのゴミが付着して、そのブラシに付着したゴミが、次に新たに洗浄した板状ワークに付着するという問題がある。
よって、板状ワークの下面を洗浄する洗浄機構においては、ゴミの付着したブラシで板状ワークの下面を洗浄しないようにするという課題がある。
However, there is a problem that the dust of the cleaned plate-like work adheres to the brush of the cleaning mechanism, and the dust adhering to the brush adheres to the newly washed plate-like work next time.
Therefore, in the cleaning mechanism for cleaning the lower surface of the plate-like work, there is a problem of not cleaning the lower surface of the plate-like work with a dust-attached brush.

上記課題を解決するための本発明は、保持手段に保持された板状ワークの下面を洗浄する洗浄機構であって、底板と側板とで凹形状に形成された桶と、該底板の中央に形成され該桶内に水を供給する供給口と、該底板の中心と中心を一致させ該桶内に配設するブラシと、を備え、該ブラシの毛先となる上面は、該側板の上端面より所定距離だけ高位置にあり、該桶内に溜められた水の表面張力で該側板の上端面よりも盛り上がる水面が該ブラシを覆い、水没した該ブラシの上面を水が流れて該ブラシの毛先を洗浄する洗浄機構である。 The present invention for solving the above-mentioned problems is a cleaning mechanism for cleaning the lower surface of a plate-shaped work held by holding means, comprising a tub formed in a concave shape by a bottom plate and a side plate, and a bucket in the center of the bottom plate. A supply port formed to supply water into the tub, and a brush arranged in the tub by aligning the center of the bottom plate with the center of the bottom plate. The brush is covered with a surface of water which is located at a predetermined distance higher than the end surface and rises above the upper surface of the side plate due to the surface tension of the water stored in the tub. It is a cleaning mechanism that cleans the ends of the hair.

本発明に係る洗浄機構は、底板と側板とで凹形状に形成された桶と、底板の中央に形成され桶内に水を供給する供給口と、底板の中心と中心を一致させ桶内に配設するブラシと、を備え、ブラシの毛先となる上面は、側板の上端面より所定距離だけ高位置にあるため、板状ワークの洗浄が終わった後、桶内に溜められた水の表面張力で側板の上端面よりも盛り上がった洗浄水がブラシの中央から外周側に向かってブラシの毛先の上を流れるので、ブラシの毛先に付着したゴミを洗い流す事ができる。したがって、その後の新たな板状ワークの下面の洗浄において、ゴミの付着したブラシで板状ワークの下面を洗浄してしまうといった事態を生じさせないようにすることが可能となる。また、板状ワークの洗浄中においても、ブラシと板状ワークの下面との境をブラシの中心から外周側に向かって洗浄水が流れるので、板状ワークとブラシとにゴミが付着することを防ぐことが可能となる。 The cleaning mechanism according to the present invention includes a tub formed in a concave shape by a bottom plate and a side plate, a supply port formed in the center of the bottom plate for supplying water into the tub, and a center of the bottom plate aligned with the center of the tub. The upper surface of the brush, which is the tip of the brush, is located at a position higher than the upper end surface of the side plate by a predetermined distance. The cleaning water raised above the upper end surface of the side plate due to surface tension flows over the tips of the brushes from the center of the brush toward the outer periphery, so that the dust adhering to the tips of the brushes can be washed away. Therefore, in subsequent cleaning of the lower surface of a new plate-shaped work, it is possible to prevent the situation from washing the lower surface of the plate-shaped work with a dust-attached brush. In addition, even during cleaning of the plate-like work, since the cleaning water flows from the center of the brush toward the outer peripheral side along the boundary between the brush and the lower surface of the plate-like work, it is possible to prevent dust from adhering to the plate-like work and the brush. can be prevented.

本発明に係る洗浄機構を備える研削装置の一例を示す斜視図である。BRIEF DESCRIPTION OF THE DRAWINGS It is a perspective view which shows an example of the grinding apparatus provided with the washing|cleaning mechanism which concerns on this invention. 洗浄機構の桶とブラシとの一例を示す斜視図である。It is a perspective view which shows an example of the tub and brush of a washing|cleaning mechanism. ブラシの別例を示す斜視図である。It is a perspective view which shows another example of a brush. 板状ワークの下面の洗浄を開始する状態を説明する断面図である。FIG. 4 is a cross-sectional view for explaining a state in which cleaning of the lower surface of the plate-like work is started; 板状ワークの下面を洗浄している状態を説明する断面図である。FIG. 4 is a cross-sectional view for explaining a state in which the lower surface of a plate-like work is being washed; 仮置き領域からチャックテーブルへ板状ワークを搬送する動作に並行して、板状ワークの下面の洗浄を開始する状態を説明する断面図である。FIG. 10 is a cross-sectional view for explaining a state in which cleaning of the lower surface of the plate-like work is started in parallel with the operation of conveying the plate-like work from the temporary placement area to the chuck table; 仮置き領域からチャックテーブルへ板状ワークを搬送する動作に並行して、板状ワークの下面の洗浄を実施している状態を説明する断面図である。FIG. 10 is a cross-sectional view for explaining a state in which the lower surface of the plate-like work is being cleaned in parallel with the operation of conveying the plate-like work from the temporary placement area to the chuck table;

図1に示す研削装置1は、本発明に係る洗浄機構8を備えており、研削手段4によってチャックテーブル30に保持された板状ワークWを研削する装置である。研削装置1のベース10上の前方(-X方向側)は、チャックテーブル30に対して板状ワークWの搬入出が行われる領域である搬入出領域Aとなっており、ベース10上の後方(+X方向側)は、研削手段4によってチャックテーブル30上に保持された板状ワークWの研削加工が行われる領域である加工領域Bとなっている。
なお、本発明に係る洗浄機構8が配設される研削装置は、研削手段として粗研削手段と仕上げ研削手段との2軸備え、回転するターンテーブルでチャックテーブル30を各研削手段の下方に位置付ける構成となっていてもよい。また、洗浄機構8は研削装置以外にも、切削装置、研磨装置、又はレーザ加工装置等に配設されていてもよい。
A grinding apparatus 1 shown in FIG. 1 is equipped with a cleaning mechanism 8 according to the present invention, and is an apparatus for grinding a plate-like workpiece W held on a chuck table 30 by grinding means 4 . The front side (−X direction side) of the base 10 of the grinding apparatus 1 is a loading/unloading area A in which the plate-like workpiece W is loaded/unloaded to/from the chuck table 30 , and the rear side of the base 10 is a loading/unloading area A. (+X direction side) is a processing region B in which the plate-like workpiece W held on the chuck table 30 by the grinding means 4 is ground.
The grinding apparatus in which the cleaning mechanism 8 according to the present invention is arranged has two shafts, rough grinding means and finish grinding means, as grinding means, and a chuck table 30 is positioned below each grinding means by a rotating turntable. It may be configured. Also, the cleaning mechanism 8 may be arranged in a cutting device, a polishing device, a laser processing device, or the like, in addition to the grinding device.

図1に示す板状ワークWは、例えば円形の半導体ウェーハであり、その下面Waには、複数の図示しないデバイスが形成されている。板状ワークWの下面Waには、例えば図示しない保護テープが貼着されており、下面Waは保護テープによって保護されている。そして、板状ワークWの上面Wbは、研削加工が施される被研削面となり、板状ワークWは上面Wbを上側にした状態でチャックテーブル30に保持される。 A plate-shaped workpiece W shown in FIG. 1 is, for example, a circular semiconductor wafer, and a plurality of devices (not shown) are formed on the lower surface Wa thereof. For example, a protective tape (not shown) is adhered to the lower surface Wa of the plate-shaped work W, and the lower surface Wa is protected by the protective tape. The upper surface Wb of the plate-like work W is a surface to be ground, and the plate-like work W is held on the chuck table 30 with the upper surface Wb facing upward.

ベース10の-X方向側の正面には、例えば、第1のカセット載置部150及び第2のカセット載置部151が設けられており、第1のカセット載置部150には加工前の板状ワークWが収容される第1のカセット150aが載置され、第2のカセット載置部151には加工後の板状ワークWを収容する第2のカセット151aが載置される。 For example, a first cassette mounting portion 150 and a second cassette mounting portion 151 are provided on the front surface of the base 10 on the -X direction side. A first cassette 150a containing plate-like works W is mounted, and a second cassette 151a containing plate-like works W after processing is mounted on a second cassette mounting portion 151. FIG.

第1のカセット150aの後方には、第1のカセット150aから加工前の板状ワークWを搬出するとともに加工後の板状ワークWを第2のカセット151aに搬入するロボット155が配設されている。ロボット155に隣接する位置には、仮置き領域152が設けられており、仮置き領域152には位置合わせ手段153が配設されている。位置合わせ手段153は、第1のカセット150aから搬出され仮置き領域152に載置された板状ワークWを縮径する複数のピンで所定の位置に位置合わせ(センタリング)する。 A robot 155 is disposed behind the first cassette 150a for unloading the plate-shaped work W before processing from the first cassette 150a and loading the processed plate-shaped work W into the second cassette 151a. there is A temporary placement area 152 is provided at a position adjacent to the robot 155 , and an alignment means 153 is provided in the temporary placement area 152 . The alignment means 153 aligns (centers) the plate-shaped work W carried out from the first cassette 150a and placed on the temporary placement area 152 at a predetermined position by means of a plurality of diameter-reducing pins.

位置合わせ手段153と隣接する位置には、加工前の板状ワークWの上面Wbを保持しチャックテーブル30に搬入する保持手段14が配設されている。保持手段14は、水平に延在するアーム部140と、アーム部140の一端の下面側に固定された吸引パッド141とを備えている。アーム部140には回転軸等からなる旋回移動手段143及びシリンダー機構等からなる昇降手段144が接続されており、旋回移動手段143は、アーム部140を水平面(X軸Y軸平面)上において旋回移動可能にし、昇降手段144はアーム部140を鉛直方向(Z軸方向)に昇降可能にしている。 At a position adjacent to the positioning means 153 , a holding means 14 is provided for holding the upper surface Wb of the plate-like work W before processing and carrying it into the chuck table 30 . The holding means 14 includes a horizontally extending arm portion 140 and a suction pad 141 fixed to the lower surface side of one end of the arm portion 140 . The arm portion 140 is connected to a turning movement means 143 consisting of a rotating shaft or the like and an elevating means 144 consisting of a cylinder mechanism or the like. The arm part 140 can be moved up and down in the vertical direction (Z-axis direction) by the elevating means 144 .

吸引パッド141(図4参照)は、例えば、その外形が円形状であり、ポーラス部材等からなり板状ワークWを吸着する吸着部141aと、吸着部141aを支持する枠体141bとを備える。吸着部141aは真空発生装置等の図示しない吸引源に連通し、吸引源が吸引することで生み出された吸引力が、吸着部141aの露出面である平坦な吸着面141cに伝達されることで、吸引パッド141は吸着面141cで板状ワークWを吸引保持する。 The suction pad 141 (see FIG. 4) has, for example, a circular outer shape, and includes a suction portion 141a made of a porous member or the like for sucking the plate-like work W, and a frame 141b supporting the suction portion 141a. The suction portion 141a communicates with a suction source (not shown) such as a vacuum generator, and a suction force generated by suction by the suction source is transmitted to a flat suction surface 141c, which is an exposed surface of the suction portion 141a. , the suction pad 141 sucks and holds the plate-like work W on the suction surface 141c.

図1に示すように、保持手段14の隣には、加工後の板状ワークWを吸引保持でき旋回移動可能な搬出手段16が設けられている。なお、保持手段14及び搬出手段16は、板状ワークWの外周を把持するエッジクランプ機構であってもよい。
搬出手段16と近接する位置には、搬出手段16によりチャックテーブル30から搬送された加工後の板状ワークWを洗浄する枚葉式のスピンナー洗浄手段156が配置されている。スピンナー洗浄手段156により洗浄された板状ワークWは、ロボット155により第2のカセット151aに搬入される。
As shown in FIG. 1, next to the holding means 14, there is provided a carry-out means 16 capable of sucking and holding the plate-shaped work W after processing and capable of turning. Note that the holding means 14 and the carry-out means 16 may be an edge clamping mechanism that grips the outer periphery of the plate-like work W. As shown in FIG.
At a position adjacent to the carry-out means 16, a single-wafer type spinner cleaning means 156 for cleaning the processed plate-shaped work W carried from the chuck table 30 by the carry-out means 16 is arranged. The plate-like work W cleaned by the spinner cleaning means 156 is carried into the second cassette 151a by the robot 155. As shown in FIG.

研削装置1のベース10上に配設され板状ワークWを保持するチャックテーブル30は、例えば、その外形が円形状であり、図示しない吸引源に連通しポーラス部材等からなり板状ワークWを吸引保持する保持面30aを備えている。また、チャックテーブル30は、カバー39によって周囲から囲まれており、カバー39及びカバー39に連結された蛇腹カバー39aの下に配設された図示しないX軸方向送り手段によって、ベース10上をX軸方向に往復移動可能となっている。また、チャックテーブル30は、Z軸方向の軸心周りに回転可能となっている。 The chuck table 30, which is arranged on the base 10 of the grinding apparatus 1 and holds the plate-like work W, has, for example, a circular outer shape and is made of a porous member or the like that communicates with a suction source (not shown). It has a holding surface 30a for suction holding. The chuck table 30 is surrounded by a cover 39, and X-axis feeding means (not shown) provided under the cover 39 and a bellows cover 39a connected to the cover 39 moves the base 10 in an X direction. It is reciprocatingly movable in the axial direction. Also, the chuck table 30 is rotatable around an axis in the Z-axis direction.

加工領域Bの後方(+X方向側)には、コラム12が立設されており、コラム12の-X方向側の前面には研削手段4をチャックテーブル30に対して離間又は接近するZ軸方向に研削送りする研削送り手段2が配設されている。研削送り手段2は、Z軸方向(鉛直方向)の軸心を有するボールネジ20と、ボールネジ20と平行に配設された一対のガイドレール21と、ボールネジ20の上端に連結しボールネジ20を回動させるモータ22と、内部のナットがボールネジ20に螺合し側部がガイドレール21に摺接する昇降板23と、昇降板23に連結され研削手段4を保持するホルダ24とを備えており、モータ22がボールネジ20を回動させると、これに伴い昇降板23がガイドレール21にガイドされてZ軸方向に往復移動し、ホルダ24に保持された研削手段4がZ軸方向に研削送りされる。 A column 12 is erected on the rear side (+X direction side) of the processing region B, and the front surface of the column 12 on the -X direction side is the Z-axis direction for separating or approaching the grinding means 4 to the chuck table 30. Grinding feeding means 2 for feeding to grinding is arranged. The grinding feed means 2 includes a ball screw 20 having an axis in the Z-axis direction (vertical direction), a pair of guide rails 21 arranged parallel to the ball screw 20, and connected to the upper end of the ball screw 20 to rotate the ball screw 20. an elevating plate 23 whose inner nut is screwed onto the ball screw 20 and whose side portion is in sliding contact with the guide rail 21; and a holder 24 connected to the elevating plate 23 and holding the grinding means 4. When the ball screw 20 is rotated by the ball screw 20, the elevating plate 23 is guided by the guide rail 21 and reciprocates in the Z-axis direction, and the grinding means 4 held by the holder 24 is fed for grinding in the Z-axis direction. .

チャックテーブル30に保持された板状ワークWを研削加工する研削手段4は、軸方向がZ軸方向である回転軸40と、回転軸40を回転可能に支持するハウジング41と、回転軸40を回転駆動するモータ42と、回転軸40の下端に接続された円環状のマウント43と、マウント43の下面に着脱可能に接続された研削ホイール44とを備える。 The grinding means 4 for grinding the plate-like workpiece W held on the chuck table 30 includes a rotary shaft 40 whose axial direction is the Z-axis direction, a housing 41 that rotatably supports the rotary shaft 40, and the rotary shaft 40. It comprises a motor 42 that drives to rotate, an annular mount 43 connected to the lower end of the rotating shaft 40, and a grinding wheel 44 that is detachably connected to the lower surface of the mount 43.

研削ホイール44は、ホイール基台441と、ホイール基台441の底面に環状に配設された略直方体形状の複数の研削砥石440とを備える。研削砥石440は、例えば、レジンボンド、ビトリボンド、メタルボンド等でダイヤモンド砥粒等が固着されて成形されている。なお、研削砥石440の形状は、環状に一体に形成されているものでもよい。 The grinding wheel 44 includes a wheel base 441 and a plurality of substantially rectangular parallelepiped grinding wheels 440 annularly arranged on the bottom surface of the wheel base 441 . The grinding wheel 440 is formed by bonding diamond grains or the like with resin bond, vitribond, metal bond, or the like, for example. The shape of the grinding wheel 440 may be formed integrally in an annular shape.

回転軸40の内部には、研削水の通り道となる図示しない流路が回転軸40の軸方向(Z軸方向)に貫通して形成されている。この流路はマウント43を通り、ホイール基台441の底面において研削砥石440に向かって研削水を噴出できるように開口している。 Inside the rotating shaft 40 , a flow path (not shown) is formed to pass through the rotating shaft 40 in the axial direction (Z-axis direction). This flow path passes through the mount 43 and is open at the bottom surface of the wheel base 441 so that grinding water can be jetted toward the grinding wheel 440 .

本発明に係る洗浄機構8は、図1に示すように、例えばベース10上における保持手段14の吸引パッド141の移動経路下に配設されている。
保持手段14に保持された板状ワークWの下面Waを洗浄する図1、2に示す洗浄機構8は、図示の例では平面視円形の底板800と、底板800の外周から一体的に+Z方向に立ち上がる側板801とからなる桶80を備えている。
The cleaning mechanism 8 according to the present invention, as shown in FIG.
The cleaning mechanism 8 shown in FIGS. 1 and 2 for cleaning the lower surface Wa of the plate-like workpiece W held by the holding means 14 includes a circular bottom plate 800 in the illustrated example, and a bottom plate 800 integrally moving from the outer periphery of the bottom plate 800 in the +Z direction. It has a tub 80 consisting of a side plate 801 rising from the bottom.

底板800の中央には、桶80内に水を供給する供給口81が例えば1つ貫通形成されている。供給口81は、桶80を図1に示すベース10上で支持する支持柱85内に形成された供給路850(図4参照)と連通しており、供給路850には例えば支持柱85の側面に取り付けられた継手851を介して金属配管又は可撓性を有する樹脂チューブ等の供給管893の一端が連通している。そして、供給管893の他端側は、ポンプ等からなり洗浄水(例えば、純水)を供給可能な水供給源89に開閉バルブ890を介して連通している。 For example, one supply port 81 for supplying water into the tub 80 is formed through the center of the bottom plate 800 . The supply port 81 communicates with a supply channel 850 (see FIG. 4) formed in a support column 85 that supports the tub 80 on the base 10 shown in FIG. One end of a supply pipe 893 such as a metal pipe or a flexible resin tube communicates via a joint 851 attached to the side surface. The other end of the supply pipe 893 communicates via an open/close valve 890 with a water supply source 89 which is composed of a pump or the like and capable of supplying cleaning water (for example, pure water).

洗浄機構8は、底板800の中心と中心を一致させ桶80内に配設するブラシ83を備えている。ブラシ83は、例えば、弾力性を備える樹脂繊維(例えば、ナイロン)を直毛状に形成し密集させたものであり、樹脂繊維の毛先となる上面83aが+Z方向へ向くようにして円環平板状のブラシ用プレート831の上面に植設されている。ブラシ用プレート831の下面は、桶80の底板800上に接着又はねじ止めされており、ブラシ83の中央の円形の開口830は、供給口81からブラシ83に供給された洗浄水が溢れ出る。 The cleaning mechanism 8 includes a brush 83 arranged in the tub 80 so that the center of the bottom plate 800 and the center of the brush 83 are aligned with each other. The brush 83 is made of, for example, elastic resin fibers (for example, nylon) that are formed into straight hairs and densely packed. It is planted on the upper surface of the flat brush plate 831 . The lower surface of the brush plate 831 is adhered or screwed onto the bottom plate 800 of the tub 80 , and the cleaning water supplied to the brush 83 from the supply port 81 overflows from the central circular opening 830 of the brush 83 .

例えば、ブラシ83の樹脂繊維の太さは0.1mmであり、ブラシ83の高さ(樹脂繊維の長さ)は10mmとなっている。そして、図4に示すように、桶80に取り付けられたブラシ83の毛先となる上面83aは、桶80の側板801の上端面801aより所定距離Hだけ高位置にある。なお、ブラシ83の樹脂繊維は、毛先に向かって漸次縮径して先端が先鋭化されたテーパード状であってもよい。また、所定の距離Hは、例えば2mmに設定されるが、この数値に限定されるものではなく、桶80内に溜められた水(洗浄水)の表面張力で側板801の上端面801aよりも盛り上がる水面がブラシ83の毛先となる上面83aを覆うことができる値に、桶80の直径等も考慮して設定される。
ブラシ83の直径は、本実施形態のように板状ワークWの直径よりも大きく設定されていると好ましい。
For example, the thickness of the resin fibers of the brush 83 is 0.1 mm, and the height of the brush 83 (the length of the resin fibers) is 10 mm. As shown in FIG. 4, the upper surface 83a, which is the tip of the brush 83 attached to the tub 80, is positioned higher than the upper end surface 801a of the side plate 801 of the tub 80 by a predetermined distance H. As shown in FIG. The resin fibers of the brush 83 may have a tapered shape in which the diameter is gradually reduced toward the ends of the bristles and the ends are sharpened. The predetermined distance H is set to 2 mm, for example, but is not limited to this value. The diameter of the tub 80 is also taken into consideration when setting the value so that the rising water surface can cover the top surface 83a of the brush 83, which is the bristle tip.
It is preferable that the diameter of the brush 83 is set larger than the diameter of the plate-like workpiece W as in this embodiment.

洗浄機構8は、図1、2に示すブラシ83に代えて、図3に示すブラシ87を備えていてもよい。ブラシ87は、例えば、弾力性を備える樹脂繊維(例えば、ナイロン)を直毛状に形成し密集させたものであり、樹脂繊維の毛先となる上面87aが+Z方向へ向くようにして円形板状のブラシ用プレート871の上面に植設されている。ブラシ用プレート871の下面は、図2に示す桶80の底板800上に接着又はねじ止めされている。ブラシ用プレート871の中央には、毛と毛との隙間となる箇所に1又は複数の水噴出口874が形成されており、水噴出口874は図2に示す桶80の底板800の供給口81からブラシ87に供給された洗浄水が溢れ出る。桶80に取り付けられたブラシ87の毛先となる上面87aは、桶80の側板801の上端面801aより所定距離(例えば、2mm)だけ高位置にある。 The cleaning mechanism 8 may include a brush 87 shown in FIG. 3 instead of the brush 83 shown in FIGS. The brush 87 is made of, for example, elastic resin fibers (for example, nylon) that are formed into straight hairs and densely packed. It is planted on the upper surface of the shaped brush plate 871 . The lower surface of the brush plate 871 is glued or screwed onto the bottom plate 800 of the tub 80 shown in FIG. At the center of the brush plate 871, one or a plurality of water jets 874 are formed in the gaps between the bristles. The washing water supplied to the brush 87 from 81 overflows. An upper surface 87a, which is the bristle tip of the brush 87 attached to the tub 80, is located higher than the upper end surface 801a of the side plate 801 of the tub 80 by a predetermined distance (for example, 2 mm).

以下に、上記図1に示す研削装置1を用いて板状ワークWの上面Wbを研削する場合の、研削装置1の動作及び洗浄機構8の動作について説明する。 The operation of the grinding device 1 and the cleaning mechanism 8 when grinding the upper surface Wb of the plate-like workpiece W using the grinding device 1 shown in FIG. 1 will be described below.

板状ワークWの上面Wbを研削するには、まず、ロボット155が第1のカセット150aから一枚の板状ワークWを引き出し、板状ワークWを仮置き領域152に移動させる。次いで、旋回移動手段143が、吸引パッド141を水平方向に旋回移動させて、仮置き領域152上の板状ワークWの上面Wbと吸引パッド141の図4に示す吸着面141cとが対向し、かつ、板状ワークWの上面Wbの中心と吸引パッド141の中心とが略合致するように、吸引パッド141を板状ワークWの上方に位置付ける。 To grind the upper surface Wb of the plate-like work W, the robot 155 first pulls out one plate-like work W from the first cassette 150 a and moves the plate-like work W to the temporary placement area 152 . Next, the turning means 143 turns the suction pad 141 in the horizontal direction so that the upper surface Wb of the plate-like work W on the temporary placement area 152 faces the suction surface 141c of the suction pad 141 shown in FIG. In addition, the suction pad 141 is positioned above the plate-like work W so that the center of the upper surface Wb of the plate-like work W and the center of the suction pad 141 substantially coincide with each other.

次いで、昇降手段144が吸引パッド141を降下させて、吸着面141cを板状ワークWの上面Wbに接触させる。この状態で、図示しない吸引源が吸引力を生み出し、吸引力が伝達された吸引パッド141が吸着面141cで板状ワークWを吸引保持する。次いで、昇降手段144によって板状ワークWの上面Wbを保持した吸引パッド141が上昇して、仮置き領域152から板状ワークWが保持手段14によって搬出される。 Next, the lifting means 144 lowers the suction pad 141 to bring the suction surface 141c into contact with the upper surface Wb of the plate-shaped work W. As shown in FIG. In this state, a suction source (not shown) generates a suction force, and the suction pad 141 to which the suction force is transmitted suction-holds the plate-like work W on the suction surface 141c. Next, the lifting means 144 raises the suction pad 141 holding the upper surface Wb of the plate-like work W, and the holding means 14 carries out the plate-like work W from the temporary placement area 152 .

旋回移動手段143が、板状ワークWを保持した吸引パッド141を水平方向に旋回移動させて、図4に示すように洗浄機構8の上方に板状ワークWを位置付ける。該位置づけは、例えば、ブラシ83の中心と板状ワークWの中心とが凡そ重なるように行われる。 The turning means 143 horizontally turns the suction pad 141 holding the plate-like work W to position the plate-like work W above the cleaning mechanism 8 as shown in FIG. The positioning is performed, for example, so that the center of the brush 83 and the center of the plate-like work W are approximately overlapped.

一方、図4に示す洗浄機構8においては、開閉バルブ890が供給管893を水供給源89に連通させる。水供給源89から洗浄水(例えば、純水)が供給管893に供給され、洗浄水が支持柱85内を通り、桶80の供給口81からブラシ用プレート831上へ流出する。そして、桶80内に洗浄水が溜まっていき、桶80内において洗浄水の水面が側板801の上端面801aを超えると表面張力によって側板801の上端面801aよりも水面が盛り上がった状態になり、かつ、水面にブラシ83の開口830中心から外周側に向かう洗浄水の流れができ、洗浄水が桶80内から溢れ出ていく。
また、側板801の上端面801aより所定距離Hだけ高位置にあるブラシ83の毛先となる上面83aは、表面張力で盛り上がった状態の洗浄水で覆われる。
On the other hand, in the cleaning mechanism 8 shown in FIG. Washing water (for example, pure water) is supplied to the supply pipe 893 from the water supply source 89 , passes through the support column 85 , and flows out from the supply port 81 of the tub 80 onto the brush plate 831 . Then, the cleaning water accumulates in the tub 80, and when the surface of the cleaning water in the tub 80 exceeds the upper end surface 801a of the side plate 801, the water surface rises above the upper end surface 801a of the side plate 801 due to surface tension. In addition, the washing water flows from the center of the opening 830 of the brush 83 toward the outer peripheral side on the water surface, and the washing water overflows from the tub 80 .
The top surface 83a of the brush 83 located at a position higher than the top end surface 801a of the side plate 801 by a predetermined distance H is covered with the washing water in a raised state due to surface tension.

ブラシ83の代わりに図3に示すブラシ87が桶80内に配設されている場合も同様に、水噴出口874から噴出する洗浄水が桶80内に溜まっていき、側板801の上端面801aより所定距離だけ高位置にあるブラシ87の毛先となる上面87aは、表面張力で盛り上がった状態の洗浄水で覆われる。 When the brush 87 shown in FIG. 3 is arranged in the tub 80 instead of the brush 83, similarly, the washing water ejected from the water ejection port 874 accumulates in the tub 80, and the upper end surface 801a of the side plate 801 The upper surface 87a, which is the bristle tip of the brush 87 located at a higher position than the brush 87 by a predetermined distance, is covered with the washing water in a raised state due to surface tension.

ブラシ83の毛先となる上面83aが表面張力で盛り上がった洗浄水で覆われた状態で、図5に示すように、昇降手段144が板状ワークWを保持する吸引パッド141を降下させて、板状ワークWの下面Waをブラシ83の上面83aに接触させる。さらに、旋回移動手段143が吸引パッド141を水平方向に所定の角度で往復移動させることで、ブラシ83によって板状ワークWの下面Waに付着していたゴミが擦り落とされていく。そして、板状ワークWの洗浄中においても、ブラシ83の上面83aと板状ワークWの下面Waとの境をブラシ83の中心から外周側に向かって洗浄水が流れるので、板状ワークWとブラシ83とにゴミが付着することが防がれる。なお、板状ワークWの下面Waに対して、ブラシ83の中央の開口830が水平方向に相対的に移動するため、板状ワークWの下面Wa全面にブラシ83の毛先は移動しつつ当接するため、板状ワークWの下面Wa全面が万遍なく洗浄される。 With the upper surface 83a of the brush 83, which is the tip of the brush 83, covered with the washing water raised by surface tension, as shown in FIG. The lower surface Wa of the plate-like work W is brought into contact with the upper surface 83a of the brush 83. As shown in FIG. Further, the revolving movement means 143 reciprocates the suction pad 141 in the horizontal direction at a predetermined angle, so that the brush 83 scrapes off dust adhering to the lower surface Wa of the plate-like workpiece W. Even during cleaning of the plate-like work W, the cleaning water flows from the center of the brush 83 toward the outer periphery along the boundary between the upper surface 83a of the brush 83 and the lower surface Wa of the plate-like work W. Dust is prevented from adhering to the brush 83.例文帳に追加Since the opening 830 in the center of the brush 83 moves horizontally relative to the lower surface Wa of the plate-like work W, the bristles of the brush 83 move and hit the entire lower surface Wa of the plate-like work W. Because of the contact, the entire lower surface Wa of the plate-shaped work W is evenly cleaned.

なお、図4に示すように洗浄機構8の上方への板状ワークWの位置づけは、互いの中心を重ねなくても良い。即ち、図6に示すように、ブラシ83の中心と板状ワークWの中心とがずれた位置で、洗浄機構8の上方に板状ワークWを位置づけ、ブラシ83の毛先となる上面83aに板状ワークWの下面Waを接触させる位置に吸引パッド141を下降させ、図7に示すように、下面Waを上面83aに接触させたまま板状ワークWを水平方向に移動させ続け、その後、上面83aから板状ワークWを上方に離間させることで洗浄を完了させるようにしてもよい。つまり、上記の様に水平方向に所定の角度で吸引パッド141を往復移動させないで、吸引パッド141の一方向の水平移動で板状ワークWの下面Waの洗浄をしてもよい。即ち、図1に示す仮置き領域152から吸引パッド141で吸引保持された板状ワークWを旋回移動手段143でチャックテーブル30上まで移動させるまでの動作中に、板状ワークWの下面Waの洗浄が並行して行われることで、板状ワークWの下面Waの洗浄による加工時間の増加が無いようにしてもよい。 In addition, as shown in FIG. 4, the positioning of the plate-like works W above the cleaning mechanism 8 does not have to overlap each other's centers. That is, as shown in FIG. 6, the plate-like work W is positioned above the cleaning mechanism 8 at a position where the center of the brush 83 and the center of the plate-like work W are displaced, and the upper surface 83a serving as the bristle tip of the brush 83 is positioned. The suction pad 141 is lowered to a position where the lower surface Wa of the plate-like work W is brought into contact, and as shown in FIG. Cleaning may be completed by separating the plate-like workpiece W upward from the upper surface 83a. That is, instead of reciprocating the suction pad 141 at a predetermined angle in the horizontal direction as described above, the lower surface Wa of the plate-like workpiece W may be cleaned by horizontally moving the suction pad 141 in one direction. That is, during the movement of the plate-like work W sucked and held by the suction pad 141 from the temporary placement area 152 shown in FIG. The cleaning may be performed in parallel so that the processing time is not increased due to the cleaning of the lower surface Wa of the plate-like workpiece W.

なお、洗浄機構8のブラシ83と保持手段14の吸引パッド141との少なくとも一方が、回転機構によってZ軸方向の軸心周りに回転可能な構成とすることで、ブラシ83と板状ワークWを吸引保持する吸引パッド141との少なくとも一方を回転させて下面Waを洗浄してもよい。
また、搬出手段16が保持する研削後の板状ワークWの下面Waを洗浄機構8によって洗浄してもよい。
なお、該板状ワークWの下面Waに付着しているゴミの洗浄除去は、図3に示すブラシ87を用いた場合でも略同様に行われていく。
At least one of the brush 83 of the cleaning mechanism 8 and the suction pad 141 of the holding means 14 is configured to be rotatable about the axis in the Z-axis direction by means of a rotation mechanism. The lower surface Wa may be washed by rotating at least one of the suction pad 141 that is held by suction.
Further, the lower surface Wa of the ground plate-like workpiece W held by the carry-out means 16 may be cleaned by the cleaning mechanism 8 .
It should be noted that cleaning and removal of dust adhering to the lower surface Wa of the plate-like work W is carried out in substantially the same manner even when the brush 87 shown in FIG. 3 is used.

所定時間ブラシ83による板状ワークWの下面Waの洗浄が行われると、昇降手段144によって板状ワークWが+Z方向に引き上げられて、図4に示すように、ブラシ83が板状ワークWから離間した状態になる。その結果、板状ワークWの下面Waの洗浄によって、ブラシ83の毛先となる上面83aにゴミが付着してしまった場合でも、桶80の水面におけるブラシ83の開口830中心から外周側に向かう洗浄水の流れによって、表面張力で盛り上がった状態の洗浄水が桶80内から溢れ出ていくと共に、ブラシ83の上面83aのゴミが洗い落とされていく。したがって、その後の新たな板状ワークWの下面Waの洗浄において、ゴミの付着したブラシ83で板状ワークWの下面Waを洗浄してしまうことが防がれる。
なお、図3に示すブラシ87を用いた場合においても、桶80の水面におけるブラシ87の中心から外周側に向かう洗浄水の流れによって、表面張力で盛り上がった状態の洗浄水が桶80内から溢れ出ていくと共に、ブラシ87の上面87aに付着しているゴミが洗い落とされていく。
After cleaning the lower surface Wa of the plate-like work W by the brush 83 for a predetermined time, the plate-like work W is lifted in the +Z direction by the elevating means 144, and as shown in FIG. become separated. As a result, even if dust adheres to the upper surface 83a, which is the bristle tip of the brush 83, due to the cleaning of the lower surface Wa of the plate-like workpiece W, the dust will be removed from the center of the opening 830 of the brush 83 on the water surface of the tub 80 toward the outer peripheral side. Due to the flow of the cleaning water, the cleaning water, which has been raised due to surface tension, overflows from the tub 80, and the dust on the upper surface 83a of the brush 83 is washed off. Therefore, when cleaning the lower surface Wa of the new plate-like work W thereafter, it is possible to prevent the lower surface Wa of the plate-like work W from being washed with the dust-attached brush 83 .
Note that even when the brush 87 shown in FIG. 3 is used, the wash water that is swollen due to surface tension overflows from the tub 80 due to the flow of the wash water from the center of the brush 87 toward the outer periphery on the water surface of the tub 80 . As it goes out, the dust adhering to the upper surface 87a of the brush 87 is washed off.

図1に示す保持手段14が、下面Waが洗浄された板状ワークWをチャックテーブル30上に移動させ、保持面30aによって板状ワークWが上面Wbが上側を向いた状態で吸引保持される。次いで、板状ワークWを保持したチャックテーブル30が、研削手段4の下まで+X方向へ移動する。研削手段4が研削送り手段2により-Z方向へと送られ、回転軸40の回転に伴って回転する研削砥石440が板状ワークWの上面Wbに当接することで研削が行われる。研削中は、チャックテーブル30が回転するのに伴って、保持面30a上に保持された板状ワークWも回転するので、研削砥石440が板状ワークWの上面Wbの全面の研削加工を行う。また、研削水が研削砥石440と板状ワークWとの接触部位に対して供給され、接触部位が冷却・洗浄される。板状ワークWの下面Waは、洗浄機構8によって洗浄されゴミが付着していない状態になっているため、板状ワークWの下面Waとチャックテーブル30の保持面30aとの間にゴミが介在せず、均一な所望の厚みに板状ワークWを研削することができる。 The holding means 14 shown in FIG. 1 moves the plate-like work W whose lower surface Wa has been cleaned onto the chuck table 30, and the holding surface 30a sucks and holds the plate-like work W with the upper surface Wb facing upward. . Next, the chuck table 30 holding the plate-like work W moves in the +X direction to below the grinding means 4 . The grinding means 4 is fed in the -Z direction by the grinding feed means 2, and the grinding wheel 440, which rotates with the rotation of the rotary shaft 40, contacts the upper surface Wb of the plate-like workpiece W, thereby performing grinding. During grinding, as the chuck table 30 rotates, the plate-like work W held on the holding surface 30a also rotates, so the grinding wheel 440 grinds the entire upper surface Wb of the plate-like work W. . In addition, grinding water is supplied to the contact portion between the grinding wheel 440 and the plate-like work W to cool and wash the contact portion. Since the lower surface Wa of the plate-like work W is cleaned by the cleaning mechanism 8 and is free of dust, dust is interposed between the lower surface Wa of the plate-like work W and the holding surface 30a of the chuck table 30. The plate-like workpiece W can be ground to a desired uniform thickness without cutting.

板状ワークWを所望の厚みになるまで研削した後、研削送り手段2により研削手段4を上昇させて板状ワークWから離間させ、さらにチャックテーブル30を-X方向に移動させて搬出手段16の近傍に位置づける。次いで、搬出手段16によって板状ワークWがスピンナー洗浄手段156に搬送される。スピンナー洗浄手段156で板状ワークWの上面Wbの洗浄が行われる。上面Wbの洗浄が行われた板状ワークWは、ロボット155により第2のカセット151a内に収容される。 After grinding the plate-like work W to a desired thickness, the grinding means 4 is lifted by the grinding feeding means 2 to separate from the plate-like work W, and the chuck table 30 is moved in the -X direction to carry out means 16. positioned in the vicinity of Next, the plate-like work W is transported to the spinner cleaning means 156 by the unloading means 16 . The upper surface Wb of the plate-shaped work W is cleaned by the spinner cleaning means 156 . The plate-like workpiece W whose upper surface Wb has been cleaned is accommodated in the second cassette 151a by the robot 155. As shown in FIG.

本発明に係る洗浄機構8は上記実施形態に限定されず、その技術的思想の範囲内において種々異なる形態にて実施されてよいことは言うまでもない。また、添付図面に図示されている研削装置1の構成についても、これに限定されず、本発明の効果を発揮できる範囲内で適宜変更可能である。 It goes without saying that the cleaning mechanism 8 according to the present invention is not limited to the above embodiment, and may be implemented in various forms within the scope of the technical idea. Moreover, the configuration of the grinding apparatus 1 illustrated in the accompanying drawings is not limited to this, and can be changed as appropriate within the range in which the effects of the present invention can be exhibited.

W:板状ワーク Wa:板状ワークの下面 Wb:板状ワークの上面
1:研削装置 10:ベース 12:コラム
150a:第1のカセット 151a:第2のカセット
155:ロボット 152:仮置き領域 153:位置合わせ手段 156:スピンナー洗浄手段
14:保持手段 140:アーム部 141:吸引パッド 141c:吸着面 143:旋回移動手段 144:昇降手段 16:搬出手段
30:チャックテーブル 30a:保持面
2:研削送り手段 20:ボールネジ 22:モータ
4:研削手段 40:回転軸 42:モータ 44:研削ホイール 440:研削砥石
8:洗浄機構 80:桶 800:底 801:側板 801a:側板の上端面 81:供給口
85:支持柱 850:供給路 851:継手
89:水供給源 890:開閉バルブ 893:供給管
83:ブラシ 83a:ブラシの毛先となる上面 831:ブラシ用プレート 830:開口
87:ブラシ 87a:ブラシの毛先となる上面 871:ブラシ用プレート
W: plate-shaped work Wa: lower surface of plate-shaped work Wb: upper surface of plate-shaped work 1: grinding device 10: base 12: column 150a: first cassette 151a: second cassette 155: robot 152: temporary placement area 153 : positioning means 156: spinner cleaning means 14: holding means 140: arm portion 141: suction pad 141c: suction surface 143: turning movement means 144: lifting means 16: carry-out means 30: chuck table 30a: holding surface 2: grinding feed Means 20: Ball screw 22: Motor 4: Grinding means 40: Rotating shaft 42: Motor 44: Grinding wheel 440: Grinding wheel 8: Cleaning mechanism 80: Tub 800: Bottom 801: Side plate 801a: Upper end surface of side plate 81: Supply port 85 : Support column 850: Supply path 851: Joint 89: Water supply source 890: Open/close valve 893: Supply pipe 83: Brush 83a: Upper surface that serves as the tip of the brush 831: Brush plate 830: Opening 87: Brush 87a: Brush Top surface to be bristles 871: Brush plate

Claims (1)

保持手段に保持された板状ワークの下面を洗浄する洗浄機構であって、
底板と側板とで凹形状に形成された桶と、該底板の中央に形成され該桶内に水を供給する供給口と、該底板の中心と中心を一致させ該桶内に配設するブラシと、を備え、
該ブラシの毛先となる上面は、該側板の上端面より所定距離だけ高位置にあり、
該桶内に溜められた水の表面張力で該側板の上端面よりも盛り上がる水面が該ブラシを覆い、水没した該ブラシの上面を水が流れて該ブラシの毛先を洗浄する洗浄機構。
A cleaning mechanism for cleaning the lower surface of the plate-shaped work held by the holding means,
A tub formed in a concave shape by a bottom plate and a side plate, a supply port formed in the center of the bottom plate for supplying water into the tub, and a brush arranged in the tub by aligning the center of the bottom plate with the center of the tub. and
The upper surface of the brush, which is the bristle tip, is located at a position higher than the upper end surface of the side plate by a predetermined distance,
A washing mechanism in which a surface of water raised from the upper end surface of the side plate by the surface tension of the water stored in the tub covers the brush, and water flows over the submerged upper surface of the brush to wash the bristles of the brush.
JP2019005888A 2019-01-17 2019-01-17 cleaning mechanism Active JP7222721B2 (en)

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Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6078680A (en) * 1983-10-07 1985-05-04 株式会社日立製作所 Washer
JPH08316614A (en) * 1995-05-24 1996-11-29 Hitachi Ltd Washing device
JP3632259B2 (en) * 1995-11-08 2005-03-23 富士通株式会社 Substrate cleaning apparatus and substrate cleaning method
JPH09321004A (en) * 1996-05-28 1997-12-12 Sony Corp Wafer cleaning method and wafer cleaning device
DE69732392T8 (en) * 1996-06-24 2006-04-27 Interuniversitair Microelectronica Centrum Vzw Apparatus and method for wet cleaning or for etching a flat substrate
JPH11254300A (en) * 1998-03-09 1999-09-21 Speedfam Co Ltd Washing device for carrier in surface polishing device
JP2000003899A (en) * 1998-06-16 2000-01-07 Sony Corp Method and device for processing substrate
US6273100B1 (en) * 1998-08-27 2001-08-14 Micron Technology, Inc. Surface cleaning apparatus and method
KR100562484B1 (en) * 1998-09-10 2006-06-23 삼성전자주식회사 CMP device for semiconductor device manufacturing and its driving method
JP3448630B2 (en) * 2001-05-28 2003-09-22 住友精密工業株式会社 Wafer carrier cleaning equipment
JP2006192372A (en) * 2005-01-13 2006-07-27 Shinka Jitsugyo Kk Washing object-holding tool, washing object-holding device using the same, washing device, and washing object-washing method
JP2007221072A (en) * 2006-02-20 2007-08-30 Tokyo Seimitsu Co Ltd Apparatus and method of cleaning and drying wafer
JP2008047696A (en) * 2006-08-16 2008-02-28 Disco Abrasive Syst Ltd Method for carrying wafer and grinding device
JP4983565B2 (en) * 2006-12-20 2012-07-25 東京エレクトロン株式会社 Substrate cleaning apparatus, substrate cleaning method, and storage medium
US20140196744A1 (en) * 2013-01-11 2014-07-17 Taiwan Semiconductor Manufacturing Company, Ltd. Method and device for cleaning a brush surface having a contamination
CN104416462B (en) * 2013-08-20 2017-02-15 上海华虹宏力半导体制造有限公司 Cleaning device of polishing pad finishing disc

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