JP7172029B2 - 軸出し装置 - Google Patents

軸出し装置 Download PDF

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Publication number
JP7172029B2
JP7172029B2 JP2017233835A JP2017233835A JP7172029B2 JP 7172029 B2 JP7172029 B2 JP 7172029B2 JP 2017233835 A JP2017233835 A JP 2017233835A JP 2017233835 A JP2017233835 A JP 2017233835A JP 7172029 B2 JP7172029 B2 JP 7172029B2
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lens
image data
edge
spectacle lens
edge information
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Japanese (ja)
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JP2019100928A5 (enrdf_load_stackoverflow
JP2019100928A (ja
Inventor
隆真 作田
教児 武市
通浩 滝井
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Nidek Co Ltd
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Nidek Co Ltd
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  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Eyeglasses (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
JP2017233835A 2017-12-05 2017-12-05 軸出し装置 Active JP7172029B2 (ja)

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JP2017233835A JP7172029B2 (ja) 2017-12-05 2017-12-05 軸出し装置

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JP2017233835A JP7172029B2 (ja) 2017-12-05 2017-12-05 軸出し装置

Publications (3)

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JP2019100928A JP2019100928A (ja) 2019-06-24
JP2019100928A5 JP2019100928A5 (enrdf_load_stackoverflow) 2020-12-17
JP7172029B2 true JP7172029B2 (ja) 2022-11-16

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JP2017233835A Active JP7172029B2 (ja) 2017-12-05 2017-12-05 軸出し装置

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102812685B1 (ko) 2019-10-03 2025-05-27 가부시키가이샤 니데크 안경 렌즈 주연 가공 시스템 및 기록 매체
WO2025069929A1 (ja) * 2023-09-29 2025-04-03 株式会社ニデック 軸出し装置および軸出しプログラム

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001356007A (ja) 2000-04-10 2001-12-26 Seiko Epson Corp 画像認識方法、画像認識装置及び位置決め装置
JP2012173391A (ja) 2011-02-18 2012-09-10 Canon Inc 画像生成装置、及び、画像生成方法
JP2014233788A (ja) 2013-05-31 2014-12-15 株式会社ニデック 眼鏡レンズ加工用装置、眼鏡レンズの上下検知プログラム

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2770540B2 (ja) * 1990-03-09 1998-07-02 株式会社ニコン レンズ形状測定装置及びこれを有する研削装置
JP2768857B2 (ja) * 1991-10-29 1998-06-25 シャープ株式会社 液晶表示基板の分断方法
US6975410B1 (en) * 2002-04-15 2005-12-13 Sturgill Dennis T Measuring device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001356007A (ja) 2000-04-10 2001-12-26 Seiko Epson Corp 画像認識方法、画像認識装置及び位置決め装置
JP2012173391A (ja) 2011-02-18 2012-09-10 Canon Inc 画像生成装置、及び、画像生成方法
JP2014233788A (ja) 2013-05-31 2014-12-15 株式会社ニデック 眼鏡レンズ加工用装置、眼鏡レンズの上下検知プログラム

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