JP7094983B2 - 向上したスループット及びプロセス柔軟性を備えたcmp機械 - Google Patents

向上したスループット及びプロセス柔軟性を備えたcmp機械 Download PDF

Info

Publication number
JP7094983B2
JP7094983B2 JP2019558761A JP2019558761A JP7094983B2 JP 7094983 B2 JP7094983 B2 JP 7094983B2 JP 2019558761 A JP2019558761 A JP 2019558761A JP 2019558761 A JP2019558761 A JP 2019558761A JP 7094983 B2 JP7094983 B2 JP 7094983B2
Authority
JP
Japan
Prior art keywords
carrier head
substrate
platen
rotation
support
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2019558761A
Other languages
English (en)
Japanese (ja)
Other versions
JP2020518475A (ja
Inventor
ダニエル レイ トロヤン
Original Assignee
アクス テクノロジー エルエルシー
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by アクス テクノロジー エルエルシー filed Critical アクス テクノロジー エルエルシー
Publication of JP2020518475A publication Critical patent/JP2020518475A/ja
Priority to JP2022099826A priority Critical patent/JP7408726B2/ja
Application granted granted Critical
Publication of JP7094983B2 publication Critical patent/JP7094983B2/ja
Priority to JP2023215247A priority patent/JP2024026436A/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/34Accessories
    • B24B37/345Feeding, loading or unloading work specially adapted to lapping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • B24B37/32Retaining rings
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B27/00Other grinding machines or devices
    • B24B27/0023Other grinding machines or devices grinding machines with a plurality of working posts
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/07Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
    • B24B37/10Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
    • B24B37/105Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement
    • B24B37/107Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement in a rotary movement only, about an axis being stationary during lapping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B51/00Arrangements for automatic control of a series of individual steps in grinding a workpiece

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
JP2019558761A 2017-04-26 2018-04-06 向上したスループット及びプロセス柔軟性を備えたcmp機械 Active JP7094983B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2022099826A JP7408726B2 (ja) 2017-04-26 2022-06-21 向上したスループット及びプロセス柔軟性を備えたcmp機械
JP2023215247A JP2024026436A (ja) 2017-04-26 2023-12-20 向上したスループット及びプロセス柔軟性を備えたcmp機械

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201762602538P 2017-04-26 2017-04-26
US62/602,538 2017-04-26
PCT/US2018/026590 WO2018200165A1 (en) 2017-04-26 2018-04-06 Cmp machine with improved throughput and process flexibility

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2022099826A Division JP7408726B2 (ja) 2017-04-26 2022-06-21 向上したスループット及びプロセス柔軟性を備えたcmp機械

Publications (2)

Publication Number Publication Date
JP2020518475A JP2020518475A (ja) 2020-06-25
JP7094983B2 true JP7094983B2 (ja) 2022-07-04

Family

ID=63915835

Family Applications (3)

Application Number Title Priority Date Filing Date
JP2019558761A Active JP7094983B2 (ja) 2017-04-26 2018-04-06 向上したスループット及びプロセス柔軟性を備えたcmp機械
JP2022099826A Active JP7408726B2 (ja) 2017-04-26 2022-06-21 向上したスループット及びプロセス柔軟性を備えたcmp機械
JP2023215247A Pending JP2024026436A (ja) 2017-04-26 2023-12-20 向上したスループット及びプロセス柔軟性を備えたcmp機械

Family Applications After (2)

Application Number Title Priority Date Filing Date
JP2022099826A Active JP7408726B2 (ja) 2017-04-26 2022-06-21 向上したスループット及びプロセス柔軟性を備えたcmp機械
JP2023215247A Pending JP2024026436A (ja) 2017-04-26 2023-12-20 向上したスループット及びプロセス柔軟性を備えたcmp機械

Country Status (5)

Country Link
US (2) US20180311784A1 (ko)
EP (1) EP3616237A4 (ko)
JP (3) JP7094983B2 (ko)
CN (1) CN110709980A (ko)
WO (1) WO2018200165A1 (ko)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113382825A (zh) * 2019-02-14 2021-09-10 崇硕科技公司 基板载具头和加工系统
KR20220042189A (ko) * 2019-08-02 2022-04-04 액서스 테크놀로지, 엘엘씨 가공대상물 연마 중 웨이퍼 슬립 검출의 인시츄 조절을 위한 방법 및 장치
US11705354B2 (en) 2020-07-10 2023-07-18 Applied Materials, Inc. Substrate handling systems

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000061821A (ja) 1998-08-19 2000-02-29 Speedfam-Ipec Co Ltd ポリッシング装置における外気連通機構
JP2001144057A (ja) 1999-08-30 2001-05-25 Mitsubishi Materials Corp 研磨装置及び被研磨材の研磨方法
JP2001315058A (ja) 2000-05-02 2001-11-13 Fujikoshi Mach Corp ウェーハの研磨装置
US20010044266A1 (en) 2000-05-16 2001-11-22 Seiji Katsuoka Polishing apparatus
JP2005131772A (ja) 2003-10-31 2005-05-26 Ebara Corp ポリッシング装置
US20070141954A1 (en) 2005-12-16 2007-06-21 Applied Materials, Inc. Paired pivot arm
US20080038993A1 (en) 2006-08-08 2008-02-14 Jeong In-Kwon Apparatus and method for polishing semiconductor wafers

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5562524A (en) * 1994-05-04 1996-10-08 Gill, Jr.; Gerald L. Polishing apparatus
US6354926B1 (en) * 1997-03-12 2002-03-12 Lam Research Corporation Parallel alignment method and apparatus for chemical mechanical polishing
JP3797822B2 (ja) * 1999-06-30 2006-07-19 株式会社荏原製作所 ポリッシング装置
US6189680B1 (en) * 1999-07-27 2001-02-20 Fujikoshi Kikai Kogyo Kabushiki Kaisha Rotary conveyor
US6602121B1 (en) * 1999-10-28 2003-08-05 Strasbaugh Pad support apparatus for chemical mechanical planarization
US6923711B2 (en) * 2000-10-17 2005-08-02 Speedfam-Ipec Corporation Multizone carrier with process monitoring system for chemical-mechanical planarization tool
US6439981B1 (en) * 2000-12-28 2002-08-27 Lsi Logic Corporation Arrangement and method for polishing a surface of a semiconductor wafer
US6561881B2 (en) * 2001-03-15 2003-05-13 Oriol Inc. System and method for chemical mechanical polishing using multiple small polishing pads
KR100488376B1 (ko) * 2001-04-27 2005-05-11 가부시키가이샤 고베 세이코쇼 기판 처리 방법 및 기판 처리 설비
US6817923B2 (en) * 2001-05-24 2004-11-16 Applied Materials, Inc. Chemical mechanical processing system with mobile load cup
US6575818B2 (en) * 2001-06-27 2003-06-10 Oriol Inc. Apparatus and method for polishing multiple semiconductor wafers in parallel
US20060234508A1 (en) * 2002-05-17 2006-10-19 Mitsuhiko Shirakashi Substrate processing apparatus and substrate processing method
KR20070058445A (ko) * 2004-07-02 2007-06-08 스트라스바흐, 인코포레이티드 웨이퍼 처리 방법 및 시스템
JP5542818B2 (ja) * 2008-08-14 2014-07-09 アプライド マテリアルズ インコーポレイテッド 可動スラリーディスペンサーを有する化学的機械的研磨機および方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000061821A (ja) 1998-08-19 2000-02-29 Speedfam-Ipec Co Ltd ポリッシング装置における外気連通機構
JP2001144057A (ja) 1999-08-30 2001-05-25 Mitsubishi Materials Corp 研磨装置及び被研磨材の研磨方法
JP2001315058A (ja) 2000-05-02 2001-11-13 Fujikoshi Mach Corp ウェーハの研磨装置
US20010044266A1 (en) 2000-05-16 2001-11-22 Seiji Katsuoka Polishing apparatus
JP2001326201A (ja) 2000-05-16 2001-11-22 Ebara Corp ポリッシング装置
JP2005131772A (ja) 2003-10-31 2005-05-26 Ebara Corp ポリッシング装置
US20070141954A1 (en) 2005-12-16 2007-06-21 Applied Materials, Inc. Paired pivot arm
US20080038993A1 (en) 2006-08-08 2008-02-14 Jeong In-Kwon Apparatus and method for polishing semiconductor wafers

Also Published As

Publication number Publication date
JP7408726B2 (ja) 2024-01-05
JP2024026436A (ja) 2024-02-28
CN110709980A (zh) 2020-01-17
WO2018200165A1 (en) 2018-11-01
JP2020518475A (ja) 2020-06-25
KR20200002928A (ko) 2020-01-08
JP2022141653A (ja) 2022-09-29
US20220088744A1 (en) 2022-03-24
US20180311784A1 (en) 2018-11-01
EP3616237A1 (en) 2020-03-04
EP3616237A4 (en) 2020-12-16

Similar Documents

Publication Publication Date Title
JP7408726B2 (ja) 向上したスループット及びプロセス柔軟性を備えたcmp機械
JP6979030B2 (ja) 化学機械研磨のためのテクスチャード加工された小型パッド
JP2020092276A (ja) 化学機械研磨のための方法、システム、及び研磨パッド
JP6914078B2 (ja) 真空吸着パッドおよび基板保持装置
JP4726752B2 (ja) 基板洗浄装置
US9873179B2 (en) Carrier for small pad for chemical mechanical polishing
CN101277787A (zh) 具有直接装载台板的抛光设备和方法
KR20160013461A (ko) 캐리어 헤드 및 화학적 기계식 연마 장치
WO2016010865A1 (en) Modifying substrate thickness profiles
KR20150132842A (ko) Cmp 폴리싱 헤드용 기판 세차 메커니즘
EP3948939B1 (en) Semiconductor flipper
JP2006524588A (ja) 微細形状ワークピースを機械的及び/又は化学機械的に研磨するためのシステム及び方法
KR102680584B1 (ko) 향상된 처리량과 공정 유연성을 가진 cmp 기계
US20040123951A1 (en) Retaining ring having reduced wear and contamination rate for a polishing head of a CMP tool
JP2018074120A (ja) ウエハの搬送保持装置
US11685012B2 (en) Planarized membrane and methods for substrate processing systems
CN108655946B (zh) 研磨头及研磨半导体晶片的背侧的方法
JP6635840B2 (ja) 剥離装置、平面研磨装置および剥離方法
US20200101576A1 (en) Platen assembly and method of assembling a platen assembly
KR20210126097A (ko) 기판 캐리어 헤드 및 프로세싱 시스템
JPH1129219A (ja) ロータリー搬送装置

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20210323

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20220228

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20220301

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20220427

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20220524

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20220622

R150 Certificate of patent or registration of utility model

Ref document number: 7094983

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150