JP6861351B2 - 分光解析装置及び分光解析方法 - Google Patents

分光解析装置及び分光解析方法 Download PDF

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JP6861351B2
JP6861351B2 JP2017222322A JP2017222322A JP6861351B2 JP 6861351 B2 JP6861351 B2 JP 6861351B2 JP 2017222322 A JP2017222322 A JP 2017222322A JP 2017222322 A JP2017222322 A JP 2017222322A JP 6861351 B2 JP6861351 B2 JP 6861351B2
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spectrum
support
thin film
plane
light
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JP2019095220A5 (cg-RX-API-DMAC10.html
JP2019095220A (ja
Inventor
長谷川　健
健 長谷川
暢貴 塩谷
暢貴 塩谷
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Kyoto University
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Kyoto University
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Priority to JP2017222322A priority Critical patent/JP6861351B2/ja
Priority to US16/763,424 priority patent/US11215507B2/en
Priority to EP18879443.2A priority patent/EP3712578B1/en
Priority to PCT/JP2018/038601 priority patent/WO2019097939A1/ja
Publication of JP2019095220A publication Critical patent/JP2019095220A/ja
Publication of JP2019095220A5 publication Critical patent/JP2019095220A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/447—Polarisation spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/129—Using chemometrical methods

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Mathematical Physics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
JP2017222322A 2017-11-17 2017-11-17 分光解析装置及び分光解析方法 Active JP6861351B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2017222322A JP6861351B2 (ja) 2017-11-17 2017-11-17 分光解析装置及び分光解析方法
US16/763,424 US11215507B2 (en) 2017-11-17 2018-10-17 Spectral analysis device and spectral analysis method
EP18879443.2A EP3712578B1 (en) 2017-11-17 2018-10-17 Spectral analysis device and spectral analysis method
PCT/JP2018/038601 WO2019097939A1 (ja) 2017-11-17 2018-10-17 分光解析装置及び分光解析方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017222322A JP6861351B2 (ja) 2017-11-17 2017-11-17 分光解析装置及び分光解析方法

Publications (3)

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JP2019095220A JP2019095220A (ja) 2019-06-20
JP2019095220A5 JP2019095220A5 (cg-RX-API-DMAC10.html) 2020-10-01
JP6861351B2 true JP6861351B2 (ja) 2021-04-21

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US (1) US11215507B2 (cg-RX-API-DMAC10.html)
EP (1) EP3712578B1 (cg-RX-API-DMAC10.html)
JP (1) JP6861351B2 (cg-RX-API-DMAC10.html)
WO (1) WO2019097939A1 (cg-RX-API-DMAC10.html)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102873097B1 (ko) * 2021-10-26 2025-10-16 주식회사 엘지화학 배향성을 가진 유기막의 열 안정성을 평가하는 방법 및 시스템
US12469243B2 (en) 2023-02-07 2025-11-11 The Regents Of The University Of California Polarimetric camera

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1000329A1 (en) * 1997-07-29 2000-05-17 William Bradshaw Amos Optical apparatus for an imaging fourier spectrometer and method of operating it
JP2000081371A (ja) * 1998-09-07 2000-03-21 Nec Corp 薄膜分子配向評価方法、評価装置及び記録媒体
JP4831388B2 (ja) * 2001-09-20 2011-12-07 公益財団法人新産業創造研究機構 非偏光電磁波を用いた薄膜の面内・面外モードスペクトルの測定方法
US7920704B2 (en) * 2004-10-09 2011-04-05 The United States Of America As Represented By The Secretary Of The Army Systems and methods for obtaining information on a key in BB84 protocol of quantum key distribution
JP4635252B2 (ja) * 2005-02-02 2011-02-23 独立行政法人産業技術総合研究所 ラングミュア・ブロジェット膜の膜厚と誘電率分散の同時決定方法および装置
JP2006243311A (ja) * 2005-03-03 2006-09-14 Fuji Photo Film Co Ltd 光学媒体の光学特性の解析方法、解析装置及製造監視方法
US8094308B2 (en) 2007-02-16 2012-01-10 Tokyo Institute Of Technology Spectrometric analyzing device and spectrometric analyzing method
WO2011104714A1 (en) * 2010-02-25 2011-09-01 Shlomo Vorovitchik Light filter with varying polarization angles and processing algorithm
WO2012056697A1 (ja) * 2010-10-29 2012-05-03 三井化学株式会社 ポリイミドフィルムの検査方法、これを用いたポリイミドフィルムの製造方法、及びポリイミドフィルム製造装置
US9683930B2 (en) * 2013-05-23 2017-06-20 Hinds Instruments, Inc. Polarization properties imaging systems
US9651426B2 (en) * 2015-06-30 2017-05-16 Agilent Technologies, Inc. Light source with controllable linear polarization
JP6061052B1 (ja) * 2015-08-21 2017-01-18 ダイキン工業株式会社 赤外分光法による含フッ素重合体の分析

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Publication number Publication date
JP2019095220A (ja) 2019-06-20
EP3712578B1 (en) 2023-12-20
EP3712578A4 (en) 2021-08-11
WO2019097939A1 (ja) 2019-05-23
US11215507B2 (en) 2022-01-04
US20200300703A1 (en) 2020-09-24
EP3712578A1 (en) 2020-09-23

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