JP6849811B2 - セレン化鉛プレート検出器アセンブリ上に一体化された温度センサ - Google Patents

セレン化鉛プレート検出器アセンブリ上に一体化された温度センサ Download PDF

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JP6849811B2
JP6849811B2 JP2019537247A JP2019537247A JP6849811B2 JP 6849811 B2 JP6849811 B2 JP 6849811B2 JP 2019537247 A JP2019537247 A JP 2019537247A JP 2019537247 A JP2019537247 A JP 2019537247A JP 6849811 B2 JP6849811 B2 JP 6849811B2
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temperature
detector
signal
infrared
conductive
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JP2020505587A (ja
JP2020505587A5 (https=
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チェ ヤンドー，ジルヴェスター
チェ ヤンドー，ジルヴェスター
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Koninklijke Philips NV
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J5/061—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/04—Casings
    • G01J5/046—Materials; Selection of thermal materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/70—Passive compensation of pyrometer measurements, e.g. using ambient temperature sensing or sensing of temperature within housing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
    • G01N33/0036—General constructional details of gas analysers, e.g. portable test equipment concerning the detector specially adapted to detect a particular component
    • G01N33/004—CO or CO2
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J5/061—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats
    • G01J2005/063—Heating; Thermostating

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Combustion & Propulsion (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Light Receiving Elements (AREA)
  • Radiation Pyrometers (AREA)
JP2019537247A 2017-01-11 2018-01-03 セレン化鉛プレート検出器アセンブリ上に一体化された温度センサ Active JP6849811B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201762444847P 2017-01-11 2017-01-11
US62/444,847 2017-01-11
US201762511485P 2017-05-26 2017-05-26
US62/511,485 2017-05-26
PCT/EP2018/050101 WO2018130436A1 (en) 2017-01-11 2018-01-03 Integrated temperature sensor on lead selenide plate detector assembly

Publications (3)

Publication Number Publication Date
JP2020505587A JP2020505587A (ja) 2020-02-20
JP2020505587A5 JP2020505587A5 (https=) 2020-12-10
JP6849811B2 true JP6849811B2 (ja) 2021-03-31

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JP2019537247A Active JP6849811B2 (ja) 2017-01-11 2018-01-03 セレン化鉛プレート検出器アセンブリ上に一体化された温度センサ

Country Status (5)

Country Link
US (1) US10935430B2 (https=)
EP (1) EP3568679B1 (https=)
JP (1) JP6849811B2 (https=)
CN (1) CN110178007B (https=)
WO (1) WO2018130436A1 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113013283B (zh) * 2019-12-20 2023-07-04 中国电子科技集团公司第四十八研究所 PbSe光敏薄膜红外光电探测芯片及其制备方法、红外光电探测器
CN113013282B (zh) * 2019-12-20 2023-03-21 中国电子科技集团公司第四十八研究所 高响应PbSe/C60异质结光敏薄膜红外探测芯片及其制备方法、红外探测器
CN112651498B (zh) * 2020-09-22 2021-08-31 杭州杭越传感科技有限公司 一种自学习式电流传感器的温度稳定性提高方法和装置
CN113140652A (zh) * 2021-04-14 2021-07-20 中国科学院长春光学精密机械与物理研究所 一种探测芯片及其制备方法
CN113206184B (zh) * 2021-04-30 2023-04-07 河北大学 一种基于硒化铅薄膜的自驱动紫外光探测器
WO2024201074A1 (en) * 2023-03-31 2024-10-03 Servomex Group Limited Method and apparatus for use in optical gas absorption measurements

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US4142198A (en) * 1976-07-06 1979-02-27 Hughes Aircraft Company Monolithic extrinsic silicon infrared detectors with an improved charge collection structure
US5612536A (en) * 1994-02-07 1997-03-18 Matsushita Electric Industrial Co., Ltd. Thin film sensor element and method of manufacturing the same
US5464982A (en) 1994-03-21 1995-11-07 Andros Incorporated Respiratory gas analyzer
JPH09329499A (ja) * 1996-06-12 1997-12-22 Ishizuka Denshi Kk 赤外線センサ及び赤外線検出器
DE19942214A1 (de) * 1999-09-03 2001-03-08 Braun Gmbh Beheizbarer Infrarot-Sensor und Infrarot-Thermometer mit einem derartigen Sensor
US6960769B2 (en) 2002-10-03 2005-11-01 Abb Inc. Infrared measuring apparatus and method for on-line application in manufacturing processes
DE102004007316A1 (de) * 2004-02-14 2005-08-25 Robert Bosch Gmbh Infrarot-Ortungsgerät mit Merhfachsensorik
JP2006105651A (ja) * 2004-10-01 2006-04-20 Ishizuka Electronics Corp サーモパイル素子及びそれを用いた赤外線センサ
FR2879819B1 (fr) * 2004-12-21 2007-02-23 Ulis Soc Par Actions Simplifie Composant de detection de rayonnements electromagnetiques notamment infrarouges
ES2318491T3 (es) 2005-04-29 2009-05-01 Ministerio De Defensa Procedimiento para tratamiento de detectores de infrarrojo de seleniuro de plomo no refrigerados y espectralmente selectivos.
US8320728B2 (en) * 2005-09-08 2012-11-27 Georgia Tech Research Corporation Film thin waveguides, methods of fabrication thereof, and detection systems
WO2010033142A1 (en) * 2008-05-30 2010-03-25 Regents Of The University Of Minnesota Detection beyond the standard radiation noise limit using spectrally selective absorption
JP2010043930A (ja) * 2008-08-12 2010-02-25 Tateyama Kagaku Kogyo Kk 非接触温度センサ
US20110175145A1 (en) * 2008-09-25 2011-07-21 Koji Tsuji Infrared Sensor
JP5316959B2 (ja) * 2010-03-17 2013-10-16 三菱マテリアル株式会社 薄膜サーミスタセンサ
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CN104828771B (zh) * 2015-03-16 2016-05-11 中国科学院电子学研究所 一种集成过滤结构的微型热导检测器及制备方法

Also Published As

Publication number Publication date
JP2020505587A (ja) 2020-02-20
CN110178007A (zh) 2019-08-27
EP3568679A1 (en) 2019-11-20
US20190346309A1 (en) 2019-11-14
WO2018130436A1 (en) 2018-07-19
EP3568679B1 (en) 2021-03-10
CN110178007B (zh) 2021-06-22
US10935430B2 (en) 2021-03-02

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