CN110178007B - 硒化铅平板探测器组件上的集成的温度传感器 - Google Patents
硒化铅平板探测器组件上的集成的温度传感器 Download PDFInfo
- Publication number
- CN110178007B CN110178007B CN201880006611.3A CN201880006611A CN110178007B CN 110178007 B CN110178007 B CN 110178007B CN 201880006611 A CN201880006611 A CN 201880006611A CN 110178007 B CN110178007 B CN 110178007B
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- temperature
- detector
- infrared radiation
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- electrical
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
- G01J5/061—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/04—Casings
- G01J5/046—Materials; Selection of thermal materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/70—Passive compensation of pyrometer measurements, e.g. using ambient temperature sensing or sensing of temperature within housing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
- G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
- G01N33/0036—General constructional details of gas analysers, e.g. portable test equipment concerning the detector specially adapted to detect a particular component
- G01N33/004—CO or CO2
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
- G01J5/061—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats
- G01J2005/063—Heating; Thermostating
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Combustion & Propulsion (AREA)
- Medicinal Chemistry (AREA)
- Food Science & Technology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Light Receiving Elements (AREA)
- Radiation Pyrometers (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201762444847P | 2017-01-11 | 2017-01-11 | |
| US62/444,847 | 2017-01-11 | ||
| US201762511485P | 2017-05-26 | 2017-05-26 | |
| US62/511,485 | 2017-05-26 | ||
| PCT/EP2018/050101 WO2018130436A1 (en) | 2017-01-11 | 2018-01-03 | Integrated temperature sensor on lead selenide plate detector assembly |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110178007A CN110178007A (zh) | 2019-08-27 |
| CN110178007B true CN110178007B (zh) | 2021-06-22 |
Family
ID=61054340
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201880006611.3A Active CN110178007B (zh) | 2017-01-11 | 2018-01-03 | 硒化铅平板探测器组件上的集成的温度传感器 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10935430B2 (https=) |
| EP (1) | EP3568679B1 (https=) |
| JP (1) | JP6849811B2 (https=) |
| CN (1) | CN110178007B (https=) |
| WO (1) | WO2018130436A1 (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113013283B (zh) * | 2019-12-20 | 2023-07-04 | 中国电子科技集团公司第四十八研究所 | PbSe光敏薄膜红外光电探测芯片及其制备方法、红外光电探测器 |
| CN113013282B (zh) * | 2019-12-20 | 2023-03-21 | 中国电子科技集团公司第四十八研究所 | 高响应PbSe/C60异质结光敏薄膜红外探测芯片及其制备方法、红外探测器 |
| CN112651498B (zh) * | 2020-09-22 | 2021-08-31 | 杭州杭越传感科技有限公司 | 一种自学习式电流传感器的温度稳定性提高方法和装置 |
| CN113140652A (zh) * | 2021-04-14 | 2021-07-20 | 中国科学院长春光学精密机械与物理研究所 | 一种探测芯片及其制备方法 |
| CN113206184B (zh) * | 2021-04-30 | 2023-04-07 | 河北大学 | 一种基于硒化铅薄膜的自驱动紫外光探测器 |
| WO2024201074A1 (en) * | 2023-03-31 | 2024-10-03 | Servomex Group Limited | Method and apparatus for use in optical gas absorption measurements |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1121999A (zh) * | 1994-02-07 | 1996-05-08 | 松下电器产业株式会社 | 薄膜传感元件及其制造方法 |
| WO2010033142A1 (en) * | 2008-05-30 | 2010-03-25 | Regents Of The University Of Minnesota | Detection beyond the standard radiation noise limit using spectrally selective absorption |
| CN102192792A (zh) * | 2010-03-17 | 2011-09-21 | 三菱综合材料株式会社 | 薄膜热敏电阻传感器 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4142198A (en) * | 1976-07-06 | 1979-02-27 | Hughes Aircraft Company | Monolithic extrinsic silicon infrared detectors with an improved charge collection structure |
| US5464982A (en) | 1994-03-21 | 1995-11-07 | Andros Incorporated | Respiratory gas analyzer |
| JPH09329499A (ja) * | 1996-06-12 | 1997-12-22 | Ishizuka Denshi Kk | 赤外線センサ及び赤外線検出器 |
| DE19942214A1 (de) * | 1999-09-03 | 2001-03-08 | Braun Gmbh | Beheizbarer Infrarot-Sensor und Infrarot-Thermometer mit einem derartigen Sensor |
| US6960769B2 (en) | 2002-10-03 | 2005-11-01 | Abb Inc. | Infrared measuring apparatus and method for on-line application in manufacturing processes |
| DE102004007316A1 (de) * | 2004-02-14 | 2005-08-25 | Robert Bosch Gmbh | Infrarot-Ortungsgerät mit Merhfachsensorik |
| JP2006105651A (ja) * | 2004-10-01 | 2006-04-20 | Ishizuka Electronics Corp | サーモパイル素子及びそれを用いた赤外線センサ |
| FR2879819B1 (fr) * | 2004-12-21 | 2007-02-23 | Ulis Soc Par Actions Simplifie | Composant de detection de rayonnements electromagnetiques notamment infrarouges |
| ES2318491T3 (es) | 2005-04-29 | 2009-05-01 | Ministerio De Defensa | Procedimiento para tratamiento de detectores de infrarrojo de seleniuro de plomo no refrigerados y espectralmente selectivos. |
| US8320728B2 (en) * | 2005-09-08 | 2012-11-27 | Georgia Tech Research Corporation | Film thin waveguides, methods of fabrication thereof, and detection systems |
| JP2010043930A (ja) * | 2008-08-12 | 2010-02-25 | Tateyama Kagaku Kogyo Kk | 非接触温度センサ |
| US20110175145A1 (en) * | 2008-09-25 | 2011-07-21 | Koji Tsuji | Infrared Sensor |
| JP5440343B2 (ja) * | 2010-04-14 | 2014-03-12 | 株式会社村田製作所 | 熱センサ |
| CN103458783B (zh) * | 2011-01-25 | 2015-11-25 | 皇家飞利浦有限公司 | 用于执行无加热器的基于硒化铅的二氧化碳测定和/或二氧化碳描记的系统和方法 |
| US9097578B2 (en) * | 2011-05-13 | 2015-08-04 | The Regents Of The University Of Michigan | Infrared sensing using pyro/piezo-electric resonators |
| DE102011056610A1 (de) * | 2011-12-19 | 2013-06-20 | Pyreos Ltd. | Infrarotlichtsensorchip mit hoher Messgenauigkeit und Verfahren zum Herstellen des Infrarotlichtsensorchips |
| EP3064913B1 (en) * | 2013-10-31 | 2021-07-14 | Hamamatsu Photonics K.K. | Light-detecting device |
| JP6248211B2 (ja) | 2014-04-14 | 2017-12-13 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | ガスセンサの温度補償 |
| CN104828771B (zh) * | 2015-03-16 | 2016-05-11 | 中国科学院电子学研究所 | 一种集成过滤结构的微型热导检测器及制备方法 |
-
2018
- 2018-01-03 JP JP2019537247A patent/JP6849811B2/ja active Active
- 2018-01-03 CN CN201880006611.3A patent/CN110178007B/zh active Active
- 2018-01-03 EP EP18701668.8A patent/EP3568679B1/en active Active
- 2018-01-03 US US16/475,768 patent/US10935430B2/en active Active
- 2018-01-03 WO PCT/EP2018/050101 patent/WO2018130436A1/en not_active Ceased
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1121999A (zh) * | 1994-02-07 | 1996-05-08 | 松下电器产业株式会社 | 薄膜传感元件及其制造方法 |
| WO2010033142A1 (en) * | 2008-05-30 | 2010-03-25 | Regents Of The University Of Minnesota | Detection beyond the standard radiation noise limit using spectrally selective absorption |
| CN102192792A (zh) * | 2010-03-17 | 2011-09-21 | 三菱综合材料株式会社 | 薄膜热敏电阻传感器 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP6849811B2 (ja) | 2021-03-31 |
| JP2020505587A (ja) | 2020-02-20 |
| CN110178007A (zh) | 2019-08-27 |
| EP3568679A1 (en) | 2019-11-20 |
| US20190346309A1 (en) | 2019-11-14 |
| WO2018130436A1 (en) | 2018-07-19 |
| EP3568679B1 (en) | 2021-03-10 |
| US10935430B2 (en) | 2021-03-02 |
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