JP6795388B2 - 電圧異常検出回路及び半導体装置 - Google Patents
電圧異常検出回路及び半導体装置 Download PDFInfo
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- JP6795388B2 JP6795388B2 JP2016243668A JP2016243668A JP6795388B2 JP 6795388 B2 JP6795388 B2 JP 6795388B2 JP 2016243668 A JP2016243668 A JP 2016243668A JP 2016243668 A JP2016243668 A JP 2016243668A JP 6795388 B2 JP6795388 B2 JP 6795388B2
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- 238000001514 detection method Methods 0.000 title claims description 89
- 230000005856 abnormality Effects 0.000 title claims description 54
- 239000004065 semiconductor Substances 0.000 title claims description 13
- 238000010586 diagram Methods 0.000 description 6
- 230000007257 malfunction Effects 0.000 description 1
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
- G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
- G05F1/565—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
- G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
- G05F1/565—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
- G05F1/569—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for protection
- G05F1/571—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for protection with overvoltage detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
- G01R17/02—Arrangements in which the value to be measured is automatically compared with a reference value
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
- G01R19/16552—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
- G01R31/42—AC power supplies
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
- G05F1/468—Regulating voltage or current wherein the variable actually regulated by the final control device is dc characterised by reference voltage circuitry, e.g. soft start, remote shutdown
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/625—Regulating voltage or current wherein it is irrelevant whether the variable actually regulated is ac or dc
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Radar, Positioning & Navigation (AREA)
- Automation & Control Theory (AREA)
- Power Engineering (AREA)
- Continuous-Control Power Sources That Use Transistors (AREA)
Description
ボルテージレギュレータは、基準電圧回路と出力トランジスタと分圧抵抗と差動増幅器を備えて、所望の内部電源電圧を安定して出力する。
図1は、本発明の電圧異常検出回路を備えた半導体装置を示すブロック図である。
本発明の半導体装置は、ボルテージレギュレータ110と、内部回路200と、電圧異常検出回路300を備えている。
内部回路200は、定電圧VREGで動作する。
本発明の半導体装置は、このような構成にしたので、ボルテージレギュレータ110が出力する定電圧VREGの異常を検出して検出電圧VDETを出力する。
図2は、第一の実施形態の電圧異常検出回路の回路図である。
第一の実施形態の電圧異常検出回路300aは、基準電圧回路310と、第1電圧検出回路321と、第2電圧検出回路322と、インバータ回路371と、OR回路372を備えている。基準電圧回路310は、所望の内部電源電圧よりも高い第1の基準電圧と、所望の内部電源電圧よりも低い第2の基準電圧を出力する。
第1電圧検出回路321は、定電流源341と、定電流源342と、NMOSトランジスタ351と、PMOSトランジスタ361と、スイッチ331を備えている。
図3は、第一の実施形態の電圧異常検出回路300aの動作を示すタイミングチャートである。第1電圧検出回路321の第1の入力端子の電圧をVi1、出力端子の電圧をVo1とし、第2電圧検出回路322の第1の入力端子の電圧をVi2、インバータ回路371の出力端子の電圧をVo2とする。
図4は、第二の実施形態の電圧異常検出回路の回路図である。第一の実施形態の電圧異常検出回路300aとの違いは、スイッチ401、402、403、403を備えたスイッチ回路が追加された点である。
また、スイッチ401、402、403、403を信号φ1と信号φ2で同時に切替えるように説明したが、片方ずつ切り替えるようにしてもよい。
310 基準電圧回路
321、322 電圧検出回路
341、342、343、344 定電流源
371 インバータ回路
372 OR回路
Claims (3)
- ボルテージレギュレータが内部回路へ供給する内部電源電圧の電圧異常を検出する電圧異常検出回路であって、
前記内部電源電圧よりも高い第1の基準電圧と前記内部電源電圧よりも低い第2の基準電圧を出力する基準電圧回路と、
前記第1の基準電圧が入力され、前記内部電源電圧が所望の電圧値よりも高くなったことを検出する第1電圧検出回路と、
前記第2の基準電圧が入力され、前記内部電源電圧が所望の電圧値よりも低くなったことを検出する第2電圧検出回路と、
を備え、
前記第1電圧検出回路は、
ゲートに前記第1の基準電圧が入力され、ソースとバルクに前記内部電源電圧が入力された第1のNMOSトランジスタと、
前記第1のNMOSトランジスタのドレインと電源端子間に接続された第1の定電流源と、
を備え、前記第1のNMOSトランジスタがオフしたときに、前記内部電源電圧が所望の電圧値よりも高くなったことを検出し、
前記第2電圧検出回路は、
ゲートに前記第2の基準電圧が入力され、ソースとバルクに前記内部電源電圧が入力された第2のNMOSトランジスタと、
前記第2のNMOSトランジスタのドレインと電源端子間に接続された第2の定電流源と、
を備え、前記第2のNMOSトランジスタがオンしたときに、前記内部電源電圧が所望の電圧値よりも低くなったことを検出する、
ことを特徴とする電圧異常検出回路。 - 前記電圧異常検出回路は、
前記基準電圧回路と前記第1電圧検出回路および前記第2電圧検出回路との間にスイッチ回路を備え、
前記スイッチ回路を制御することにより、前記第1電圧検出回路に前記第2の基準電圧が入力され、前記第2電圧検出回路に前記第1の基準電圧が入力され、
前記電圧異常検出回路の動作をテストすることできる
ことを特徴とする請求項1に記載の電圧異常検出回路。 - 内部回路へ内部電源電圧を供給するボルテージレギュレータと、
前記内部電源電圧が入力され、前記内部電源電圧の電圧異常を検出する請求項1または2のいずれかに記載の電圧異常検出回路と、
を備えたことを特徴とする半導体装置。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016243668A JP6795388B2 (ja) | 2016-12-15 | 2016-12-15 | 電圧異常検出回路及び半導体装置 |
TW106132861A TWI707219B (zh) | 2016-12-15 | 2017-09-26 | 電壓異常檢測電路以及半導體裝置 |
US15/784,344 US10564205B2 (en) | 2016-12-15 | 2017-10-16 | Voltage abnormality detection circuit and semiconductor device |
CN201710962809.6A CN108227811B (zh) | 2016-12-15 | 2017-10-17 | 电压异常检测电路和半导体装置 |
KR1020170156546A KR102338808B1 (ko) | 2016-12-15 | 2017-11-22 | 전압 이상 검출 회로 및 반도체 장치 |
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JP2016243668A JP6795388B2 (ja) | 2016-12-15 | 2016-12-15 | 電圧異常検出回路及び半導体装置 |
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JP2018097748A JP2018097748A (ja) | 2018-06-21 |
JP6795388B2 true JP6795388B2 (ja) | 2020-12-02 |
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US (1) | US10564205B2 (ja) |
JP (1) | JP6795388B2 (ja) |
KR (1) | KR102338808B1 (ja) |
CN (1) | CN108227811B (ja) |
TW (1) | TWI707219B (ja) |
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JP2022038486A (ja) * | 2020-08-26 | 2022-03-10 | 富士電機株式会社 | 試験装置、試験方法および製造方法 |
CN115015797B (zh) * | 2022-08-08 | 2022-10-14 | 深圳市恒运昌真空技术有限公司 | 一种射频电源信号采集方法及装置 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10337007A (ja) * | 1997-06-03 | 1998-12-18 | Murata Mfg Co Ltd | Dc−dcコンバータ装置 |
JP2001092544A (ja) | 1999-09-20 | 2001-04-06 | Toshiba Microelectronics Corp | 定電圧回路 |
TW556382B (en) * | 2002-03-15 | 2003-10-01 | Prolific Technology Inc | Power protection |
US20080212246A1 (en) * | 2006-12-31 | 2008-09-04 | Texas Instruments Incorporated | Systems and Methods for Detecting Shorts in Electrical Distribution Systems |
JP4720896B2 (ja) * | 2008-10-08 | 2011-07-13 | 株式会社デンソー | 電源回路の異常診断装置、及び電源回路 |
JP5421133B2 (ja) | 2009-02-10 | 2014-02-19 | セイコーインスツル株式会社 | ボルテージレギュレータ |
US8680884B2 (en) * | 2010-03-25 | 2014-03-25 | Cree, Inc. | Fault detection circuits for switched mode power supplies and related methods of operation |
US8368381B1 (en) * | 2012-02-14 | 2013-02-05 | EM Microelectronic-Marin | Method for measuring the movement of an optical pointing device on a work surface |
CN102944730B (zh) * | 2012-11-05 | 2015-06-10 | 深圳创维-Rgb电子有限公司 | 电压异常状态自动检测装置 |
JP5898104B2 (ja) * | 2013-02-13 | 2016-04-06 | 日立オートモティブシステムズステアリング株式会社 | 電源電圧監視回路、車両のセンサ回路およびパワーステアリング装置 |
JP6211887B2 (ja) * | 2013-10-15 | 2017-10-11 | エスアイアイ・セミコンダクタ株式会社 | ボルテージレギュレータ |
TWI525330B (zh) * | 2013-10-28 | 2016-03-11 | 仁寶電腦工業股份有限公司 | 電池模擬裝置 |
JP6321411B2 (ja) * | 2014-03-13 | 2018-05-09 | エイブリック株式会社 | 電圧検出回路 |
TWI503645B (zh) * | 2014-05-07 | 2015-10-11 | Nuvoton Technology Corp | 電壓調節器、方法與晶片 |
US9729137B2 (en) * | 2014-11-11 | 2017-08-08 | Lapis Semiconductor Co., Ltd. | Semiconductor circuit, voltage detection circuit, and voltage determination circuit |
TWI533554B (zh) * | 2014-11-21 | 2016-05-11 | 力林科技股份有限公司 | 具低電壓保護之電源供應器及其操作方法 |
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- 2016-12-15 JP JP2016243668A patent/JP6795388B2/ja active Active
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- 2017-09-26 TW TW106132861A patent/TWI707219B/zh active
- 2017-10-16 US US15/784,344 patent/US10564205B2/en active Active
- 2017-10-17 CN CN201710962809.6A patent/CN108227811B/zh active Active
- 2017-11-22 KR KR1020170156546A patent/KR102338808B1/ko active IP Right Grant
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Publication number | Publication date |
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JP2018097748A (ja) | 2018-06-21 |
KR102338808B1 (ko) | 2021-12-13 |
CN108227811A (zh) | 2018-06-29 |
TWI707219B (zh) | 2020-10-11 |
US10564205B2 (en) | 2020-02-18 |
TW201823904A (zh) | 2018-07-01 |
KR20180069692A (ko) | 2018-06-25 |
US20180172749A1 (en) | 2018-06-21 |
CN108227811B (zh) | 2021-05-11 |
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