JP6767786B2 - 測定支援システム及び測定支援方法 - Google Patents

測定支援システム及び測定支援方法 Download PDF

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Publication number
JP6767786B2
JP6767786B2 JP2016122286A JP2016122286A JP6767786B2 JP 6767786 B2 JP6767786 B2 JP 6767786B2 JP 2016122286 A JP2016122286 A JP 2016122286A JP 2016122286 A JP2016122286 A JP 2016122286A JP 6767786 B2 JP6767786 B2 JP 6767786B2
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Japan
Prior art keywords
measurement
information
measuring instrument
measuring
site
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JP2016122286A
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English (en)
Japanese (ja)
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JP2017228009A5 (enrdf_load_stackoverflow
JP2017228009A (ja
Inventor
声喜 佐藤
声喜 佐藤
浩行 猪瀬
浩行 猪瀬
青木　達也
達也 青木
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Knowledge Manufacturing Co
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Knowledge Manufacturing Co
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Priority to JP2016122286A priority Critical patent/JP6767786B2/ja
Priority to PCT/JP2017/022583 priority patent/WO2017221902A1/ja
Publication of JP2017228009A publication Critical patent/JP2017228009A/ja
Publication of JP2017228009A5 publication Critical patent/JP2017228009A5/ja
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q50/00—Information and communication technology [ICT] specially adapted for implementation of business processes of specific business sectors, e.g. utilities or tourism
    • G06Q50/04—Manufacturing
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30—Computing systems specially adapted for manufacturing

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Business, Economics & Management (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Marketing (AREA)
  • Quality & Reliability (AREA)
  • Health & Medical Sciences (AREA)
  • Economics (AREA)
  • General Engineering & Computer Science (AREA)
  • Human Resources & Organizations (AREA)
  • Automation & Control Theory (AREA)
  • Primary Health Care (AREA)
  • Strategic Management (AREA)
  • Tourism & Hospitality (AREA)
  • General Business, Economics & Management (AREA)
  • Theoretical Computer Science (AREA)
  • General Factory Administration (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
JP2016122286A 2016-06-21 2016-06-21 測定支援システム及び測定支援方法 Active JP6767786B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2016122286A JP6767786B2 (ja) 2016-06-21 2016-06-21 測定支援システム及び測定支援方法
PCT/JP2017/022583 WO2017221902A1 (ja) 2016-06-21 2017-06-19 測定支援システム及び測定支援方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016122286A JP6767786B2 (ja) 2016-06-21 2016-06-21 測定支援システム及び測定支援方法

Publications (3)

Publication Number Publication Date
JP2017228009A JP2017228009A (ja) 2017-12-28
JP2017228009A5 JP2017228009A5 (enrdf_load_stackoverflow) 2019-06-27
JP6767786B2 true JP6767786B2 (ja) 2020-10-14

Family

ID=60784527

Family Applications (1)

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JP2016122286A Active JP6767786B2 (ja) 2016-06-21 2016-06-21 測定支援システム及び測定支援方法

Country Status (2)

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JP (1) JP6767786B2 (enrdf_load_stackoverflow)
WO (1) WO2017221902A1 (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6830167B1 (ja) * 2020-01-29 2021-02-17 レノボ・シンガポール・プライベート・リミテッド 検査支援装置、検査支援システム、及び検査支援方法
JP2024039590A (ja) 2022-09-09 2024-03-22 Dmg森精機株式会社 携帯端末および計測管理プログラム

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2674868B2 (ja) * 1990-06-30 1997-11-12 株式会社ミツトヨ 測定支援装置
JPH07334781A (ja) * 1994-06-06 1995-12-22 Hitachi Ltd 測定指示システム
JP3796454B2 (ja) * 2001-02-20 2006-07-12 キヤノン株式会社 情報処理装置、情報処理方法、及びプログラム
JP2004227483A (ja) * 2003-01-27 2004-08-12 Seiko Epson Corp 計測器管理装置、計測器管理システム及び製造支援システム
JP2008027342A (ja) * 2006-07-25 2008-02-07 Incs Inc 金型部品の測定点自動作成表示装置
JP5100249B2 (ja) * 2006-08-23 2012-12-19 キヤノン株式会社 情報処理方法、情報処理装置およびプログラム
JP5066165B2 (ja) * 2009-12-07 2012-11-07 株式会社日立製作所 検査データ管理装置

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Publication number Publication date
WO2017221902A1 (ja) 2017-12-28
JP2017228009A (ja) 2017-12-28

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