JP6726967B2 - 輝度ムラ測定装置 - Google Patents

輝度ムラ測定装置 Download PDF

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Publication number
JP6726967B2
JP6726967B2 JP2016007616A JP2016007616A JP6726967B2 JP 6726967 B2 JP6726967 B2 JP 6726967B2 JP 2016007616 A JP2016007616 A JP 2016007616A JP 2016007616 A JP2016007616 A JP 2016007616A JP 6726967 B2 JP6726967 B2 JP 6726967B2
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Japan
Prior art keywords
measuring device
luminance
brightness
measurement data
measurement
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JP2016007616A
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English (en)
Japanese (ja)
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JP2017129394A (ja
JP2017129394A5 (enExample
Inventor
大槻 英世
英世 大槻
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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Priority to JP2016007616A priority Critical patent/JP6726967B2/ja
Priority to US15/397,796 priority patent/US20170205277A1/en
Publication of JP2017129394A publication Critical patent/JP2017129394A/ja
Publication of JP2017129394A5 publication Critical patent/JP2017129394A5/ja
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0403Mechanical elements; Supports for optical elements; Scanning arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/0266Field-of-view determination; Aiming or pointing of a photometer; Adjusting alignment; Encoding angular position; Size of the measurement area; Position tracking; Photodetection involving different fields of view for a single detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Studio Devices (AREA)
JP2016007616A 2016-01-19 2016-01-19 輝度ムラ測定装置 Active JP6726967B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2016007616A JP6726967B2 (ja) 2016-01-19 2016-01-19 輝度ムラ測定装置
US15/397,796 US20170205277A1 (en) 2016-01-19 2017-01-04 Uneven brightness measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016007616A JP6726967B2 (ja) 2016-01-19 2016-01-19 輝度ムラ測定装置

Publications (3)

Publication Number Publication Date
JP2017129394A JP2017129394A (ja) 2017-07-27
JP2017129394A5 JP2017129394A5 (enExample) 2019-02-21
JP6726967B2 true JP6726967B2 (ja) 2020-07-22

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JP2016007616A Active JP6726967B2 (ja) 2016-01-19 2016-01-19 輝度ムラ測定装置

Country Status (2)

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US (1) US20170205277A1 (enExample)
JP (1) JP6726967B2 (enExample)

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CN112649091B (zh) * 2020-12-28 2022-03-25 武汉精测电子集团股份有限公司 一种用于led拼接显示屏校准的色度测量方法及装置
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JP2017129394A (ja) 2017-07-27

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